Invention Grant
- Patent Title: Information acquiring method, information acquiring apparatus, semiconductor device comprising array of plurality of unit components for detecting physical quantity distribution, and semiconductor manufacturing method
- Patent Title (中): 信息获取方法,信息获取装置,包括用于检测物理量分布的多个单位分量阵列的半导体器件和半导体制造方法
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Application No.: US11211821Application Date: 2005-08-25
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Publication No.: US08488030B2Publication Date: 2013-07-16
- Inventor: Atsushi Toda , Hirofumi Sumi
- Applicant: Atsushi Toda , Hirofumi Sumi
- Applicant Address: JP
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP
- Agency: Sheridan Ross P.C.
- Priority: JPP2004-250049 20040830
- Main IPC: H04N3/14
- IPC: H04N3/14 ; H04N5/335 ; H04N9/04

Abstract:
To enable an imaging apparatus to achieve high resolution and sufficient color reproducibility.A diffraction grating 1 is provided on the incident light side of a spectral image sensor 10, the diffraction grating 1 including scatterers such as scatterers 3, slits 5, and scatterers 7 which are disposed in that order. An electromagnetic wave is scattered by the scatterers to produce diffracted waves, and by using the fact that interference patterns between the diffracted waves change with wavelengths, signals are detected for respective wavelengths by photoelectric conversion elements 12B, 12G, and 12R in each photodiode group 12.
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