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    SPECTRUM SCANNING ASSEMBLY AND OPTICAL SEMICONDUCTOR ELEMENT
    197.
    发明申请
    SPECTRUM SCANNING ASSEMBLY AND OPTICAL SEMICONDUCTOR ELEMENT 有权

    公开(公告)号：US20250164313A1

    公开(公告)日：2025-05-22

    申请号：US18842802

    申请日：2022-11-18

    Applicant: INNOLIGHT TECHNOLOGY (SUZHOU) LTD.

    Inventor： Chenlei LI ,  Xuezhe ZHENG

    IPC: G01J3/06 ,  G01J3/02 ,  G01J3/08 ,  G01J3/12 ,  G02B6/293 ,  G02B6/35

    Abstract: The invention relates to a spectrum scanning assembly and an optical semiconductor element. The spectrum scanning assembly includes a band-pass waveguide assembly and multiple micro-ring resonators, and the band-pass waveguide assembly is respectively connected to the multiple micro-ring resonators; in which: the band-pass waveguide assembly is used to divide an optical signal to be tested into multiple band-pass optical signals with different central wavelengths and then respectively input into the multiple micro-ring resonators; each micro-ring resonator is used to perform scanning for resonant wavelengths in the band-pass optical signals to form first spectral information; in which after beam combination is performed on multiple pieces of first spectral information formed by the multiple micro-ring resonators, second spectral information may be formed. The spectrum scanning assembly and the optical semiconductor element of the invention have high spectral scanning precision.

    Optical technique for material characterization
    198.
    发明授权
    Optical technique for material characterization 有权

    公开(公告)号：US12298182B2

    公开(公告)日：2025-05-13

    申请号：US18600698

    申请日：2024-03-09

    Applicant: NOVA LTD.

    Inventor： Gilad Barak ,  Yonatan Oren

    IPC: G01J3/44 ,  G01J3/02 ,  G01J3/06 ,  G01J3/10 ,  G01J3/28

    Abstract: A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, the system comprises a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory. The polarized Raman Spectrometric apparatus generates signal(s) from either small sized spots at multiple locations on a sample or from an elongated line-shaped points on the sample, and the processor analyzes the signal(s) to define the parameters of said polycrystalline material.

    AFFORDABLE HIGH SPECTRAL-RESOLUTION 3D IMAGING LEVERAGING ROBOTIC SCANNING SPECTROSCOPY COMBINED WITH SEMANTIC SLAM
    199.
    发明申请
    AFFORDABLE HIGH SPECTRAL-RESOLUTION 3D IMAGING LEVERAGING ROBOTIC SCANNING SPECTROSCOPY COMBINED WITH SEMANTIC SLAM 有权

    公开(公告)号：US20250093201A1

    公开(公告)日：2025-03-20

    申请号：US18886898

    申请日：2024-09-16

    Applicant: Jnaneshwar DAS ,  Saurav KUMAR

    Inventor： Jnaneshwar DAS ,  Saurav KUMAR

    IPC: G01J3/02 ,  B25J19/02 ,  G01J3/06 ,  G01J3/10 ,  G01J3/28 ,  G01N33/00

    Abstract: A method of adaptively scanning a selected area that includes selecting an imaging mode, performing a scan of the selected area using the imaging mode, detecting an item of interest, automatically selecting a new imaging mode in response to detecting the item of interest, and performing a scan of the item of interest using the new imaging mode. The imaging mode may determine at least one of a scanning pattern, a scanning speed, and a scanning rate. Spectral data and image data may be gathered and used to detect the item of interest. The method may also include providing a scanning spectrometer system that has a gimbal system configured to provide at least two degrees of freedom to the scanning spectrometer system. The gimbal system may have a spectrometer and a camera each mounted on the gimbal system and configured to gather the spectral data and the image data, respectively.

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