公开(公告)号：US20240319010A1

公开(公告)日：2024-09-26

申请号：US18186906

申请日：2023-03-20

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

Inventor： John Iverson ,  Garry Ritter ,  Pete Knudtson ,  Eric Schwartz

IPC: G01J3/453 ,  G01J3/06

CPC classification number: G01J3/4535 ,  G01J3/06 ,  G01J2003/064 ,  G01J2003/4538

Abstract: Interfering internal beams can be used to generate an internal reference interferogram. This interferogram can be used to compensate for changes in FTIR instrument performance in response to variable environmental conditions or other instrument variations. Acquisition of such internal interferograms can be done during, after, or prior to acquisition of actual sample data.