Defect-and-failure-tolerant demultiplexer using series replication and error-control encoding
    12.
    发明授权
    Defect-and-failure-tolerant demultiplexer using series replication and error-control encoding 有权
    使用序列复制和错误控制编码的缺陷和容错解复用器

    公开(公告)号:US07872502B2

    公开(公告)日:2011-01-18

    申请号:US11484961

    申请日:2006-07-12

    IPC分类号: H03K19/094

    摘要: One embodiment of the present invention is a method for constructing defect-and-failure-tolerant demultiplexers. This method is applicable to nanoscale, microscale, or larger-scale demultiplexer circuits. Demultiplexer circuits can be viewed as a set of AND gates, each including a reversibly switchable interconnection between a number of address lines, or address-line-derived signal lines, and an output signal line. Each reversibly switchable interconnection includes one or more reversibly switchable elements. In certain demultiplexer embodiments, NMOS and/or PMOS transistors are employed as reversibly switchable elements. In the method that represents one embodiment of the present invention, two or more serially connected transistors are employed in each reversibly switchable interconnection, so that short defects in up to one less than the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection. In addition, error-control-encoding techniques are used to introduce additional address-line-derived signal lines and additional switchable interconnections so that the demultiplexer may function even when a number of individual, switchable interconnections are open-defective.

    摘要翻译: 本发明的一个实施例是一种用于构建缺陷和容错解复用器的方法。 该方法适用于纳米尺度,微米级或更大规模的解复用器电路。 解复用器电路可以被视为一组与门,每个与门包括多个地址线或地址线导出的信号线之间的可逆切换互连以及输出信号线。 每个可逆切换互连包括一个或多个可逆切换元件。 在某些解复用器实施例中,NMOS和/或PMOS晶体管被用作可逆切换元件。 在表示本发明的一个实施例的方法中,在每个可逆切换互连中使用两个或更多个串联连接的晶体管,使得比串联互连晶体管的数量少一个的短缺陷不会导致可逆地失效 可切换互连。 此外,误差控制编码技术用于引入附加的地址线导出的信号线和附加的可切换互连,使得即使当多个单独的可切换互连是开放缺陷时,解复用器也可以起作用。

    Nanoscale interconnection interface
    13.
    发明申请
    Nanoscale interconnection interface 有权
    纳米级互连接口

    公开(公告)号:US20100293518A1

    公开(公告)日:2010-11-18

    申请号:US12011175

    申请日:2008-01-23

    IPC分类号: G06F17/50

    摘要: One embodiment of the present invention provides a demultiplexer implemented as a nanowire crossbar or a hybrid nanowire/microscale-signal-line crossbar with resistor-like nanowire junctions. The demultiplexer of one embodiment provides demultiplexing of signals input on k microscale address lines to 2k or fewer nanowires, employing supplemental, internal address lines to map 2k nanowire addresses to a larger, internal, n-bit address space, where n>k. A second demultiplexer embodiment of the present invention provides demultiplexing of signals input on n microscale address lines to 2k nanowires, with n>k, using 2k, well-distributed, n-bit external addresses to access the 2k nanowires. Additional embodiments of the present invention include a method for evaluating different mappings of nanowire addresses to internal address-spaces of different sizes, or to evaluate mappings of nanowires to external address-spaces of different sizes, metrics for evaluating address mapping and demultiplexer designs, and demultiplexer design methods.

    摘要翻译: 本发明的一个实施例提供了一种解复用器,其实现为纳米线交叉开关或具有电阻器状纳米线结的混合纳米线/微型信号线交叉开关。 一个实施例的解复用器提供在k个微米地址线上输入的信号到2k个或更少的纳米线的解复用,采用补充的内部地址线将2k个纳米线地址映射到更大的内部n位地址空间,其中n> k。 本发明的第二解复用器实施例使用2k,均匀分布的n位外部地址来访问2k纳米线,在n个微米级地址线上输入的信号到2k纳米线解复用n> k。 本发明的另外的实施例包括用于评估纳米线地址与不同大小的内部地址空间的不同映射的方法,或者评估纳米线与不同大小的外部地址空间的映射,用于评估地址映射和解复用器设计的度量,以及 解复用器设计方法。

    FPGA architecture at conventional and submicron scales
    15.
    发明授权
    FPGA architecture at conventional and submicron scales 有权
    常规和亚微米尺度的FPGA架构

    公开(公告)号:US07609089B2

    公开(公告)日:2009-10-27

    申请号:US12156877

    申请日:2008-06-04

    IPC分类号: H01L25/00 H03K19/177

    摘要: Reconfigurable logic devices and methods of programming the devices are disclosed. The logic device includes a look-up table (LUT) and at least one storage element configured for sampling LUT output signals. The LUT comprises a plurality of input signals, an array of programmable impedance devices operably coupled to the input signals, and the LUT output signals. Each programmable impedance device in the array includes a first electrode operably coupled to one of the input signal, a second electrode disposed to form a junction wherein the second electrode at least partially overlaps the first electrode, and a programmable material disposed between the first electrode and the second electrode. The programmable material operably couples the first electrode and the second electrode such that each programmable impedance device exhibits a non-volatile programmable impedance. The array may be configured as a one-dimensional or two-dimensional array.

    摘要翻译: 公开了可重构逻辑器件和编程器件的方法。 逻辑器件包括查找表(LUT)和配置用于对LUT输出信号进行采样的至少一个存储元件。 LUT包括多个输入信号,可操作地耦合到输入信号的可编程阻抗装置的阵列和LUT输出信号。 阵列中的每个可编程阻抗器件包括可操作地耦合到输入信号中的一个的第一电极,设置成形成其中第二电极至少部分地与第一电极重叠的结的第二电极和设置在第一电极和 第二电极。 可编程材料可操作地耦合第一电极和第二电极,使得每个可编程阻抗装置呈现非易失性可编程阻抗。 该阵列可以被配置为一维或二维阵列。

    Non-visible light control of active screen optical properties
    20.
    发明申请
    Non-visible light control of active screen optical properties 审中-公开
    不可见光控制的主动屏幕光学性能

    公开(公告)号:US20080094583A1

    公开(公告)日:2008-04-24

    申请号:US11584476

    申请日:2006-10-19

    IPC分类号: G03B21/26

    CPC分类号: G03B21/26

    摘要: Techniques for modifying a visible projecting image are described. The technique includes using non-visible light to control optical properties of independent regions of an active screen. The non-visible light is capable of directly interacting with the regions of the active screen to modify an optical property of the regions of the active screen.

    摘要翻译: 描述用于修改可见投影图像的技术。 该技术包括使用不可见光来控制主动屏幕的独立区域的光学特性。 不可见光能够与主动屏幕的区域直接相互作用,以修改活动屏幕区域的光学特性。