公开(公告)号：US20240111142A1

公开(公告)日：2024-04-04

申请号：US18472273

申请日：2023-09-22

Applicant: Leica Microsystems CMS GmbH

Inventor： Falk SCHLAUDRAFF ,  Markus SCHECHTER

IPC: G02B21/24 ,  G02B21/02

CPC classification number: G02B21/245 ,  G02B21/025

Abstract: An apparatus for a microscope system is provided. The apparatus comprising one or more processors and one or more storage devices. The one or more processors are configured to receive region information about an accessible spatial region for an objective of the microscope system and to trigger a restriction of a relative movement of the objective based on the region information.

公开(公告)号：US20210217168A1

公开(公告)日：2021-07-15

申请号：US17143281

申请日：2021-01-07

Applicant: Leica Microsystems CMS GmbH

Inventor： Falk SCHLAUDRAFF ,  Christoph GREB

IPC: G06T7/00

Abstract: A method for checking a dissection process in a laser microdissection system includes carrying out the dissection process for cutting out a dissectate from an object in a first region of the object by a laser beam. First image data is acquired of at least the first region of the object after the dissection process. It is examined whether the first image data has sharp structures within a region to be separated by the dissection process in order to determine whether the dissection process was successful.

公开(公告)号：US20160202040A1

公开(公告)日：2016-07-14

申请号：US14913385

申请日：2014-08-22

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Falk SCHLAUDRAFF ,  Qing TANG

IPC: G01B11/14 ,  G01N33/483 ,  G06T7/00

CPC classification number: G01B11/14 ,  G01N33/4833 ,  G01N2001/282 ,  G01N2001/2886 ,  G02B21/32 ,  G06T7/0012 ,  G06T2207/10056 ,  G06T2207/30204

Abstract: A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser inictodissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation sinals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signais and first calibration values, making at least one calibration mark on the calibration object; capturing an image ofthe calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark; and determining second calibration values based on a relationship between the default position values and the actual position values.

Abstract translation: 一种用于校准具有包括图像评估模块的数字图像捕获单元的激光解剖系统的显微镜的反射光装置中的激光偏转装置的方法包括产生激光束; 引导激光束通过显微镜物镜; 将激光束引导到由致动正弦限定的位置; 将校准物体放置在显微镜物镜的物平面内; 使用第一致动信号和第一校准值致动激光偏转装置，在校准物体上形成至少一个校准标记; 通过数字图像捕获单元捕获校准对象的图像; 确定所述至少一个校准标记的实际位置值; 以及基于所述默认位置值和所述实际位置值之间的关系来确定第二校准值。

公开(公告)号：US20140049818A1

公开(公告)日：2014-02-20

申请号：US13969910

申请日：2013-08-19

Applicant: Leica Microsystems CMS GmbH

Inventor： Falk SCHLAUDRAFF

IPC: G02B21/34

CPC classification number: G02B21/34 ,  G01N2001/282 ,  G02B21/36 ,  G03F7/20

Abstract: A specimen slide (100) having a sample region (101) in which a sample (200) that can be investigated microscopically can be arranged, and that comprises reference points (A-Z, 1-24, a-j, α-κ) arranged at least in the sample region (101), is proposed. The reference points (A-Z, 1-24, a-j, α-κ) are embodied in such a way that on the basis of an identification of at least a stipulated number of reference points (A-Z, 1-24, a-j, α-κ) in an arbitrary sub-region (102) of the sample region (101), the position of the arbitrary sub-region (102), and/or at least one position therein, on the specimen slide (100) can be unequivocally determined A method for determining and/or retrieving a position on a corresponding specimen slide, and a corresponding sample investigation system, are likewise subjects of the invention.

Abstract translation: 具有样本区域（101）的标本片（100），其中可以布置可以显微镜检查的样本（200），并且包括至少布置的参考点（AZ，1-24，aj，alpha-kappa） 在样品区域（101）中。 参考点（AZ，1-24，aj，alpha-kappa）以这样一种方式实现：基于至少规定数量的参考点（AZ，1-24，aj，alpha-kappa ）在样本区域（101）的任意子区域（102）中，任意子区域（102）的位置和/或其中的至少一个位置可以被明确地确定 用于确定和/或检索相应样本载玻片上的位置的方法以及相应的样本调查系统也是本发明的主题。