公开(公告)号：US20160202040A1

公开(公告)日：2016-07-14

申请号：US14913385

申请日：2014-08-22

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Falk SCHLAUDRAFF ,  Qing TANG

IPC: G01B11/14 ,  G01N33/483 ,  G06T7/00

CPC classification number: G01B11/14 ,  G01N33/4833 ,  G01N2001/282 ,  G01N2001/2886 ,  G02B21/32 ,  G06T7/0012 ,  G06T2207/10056 ,  G06T2207/30204

Abstract: A method for calibrating a laser deflection device in a reflected light device of a microscope of a laser inictodissection system having a digital image capturing unit comprising an image evaluation module includes generating a laser beam; guiding the laser beam through a microscope objective; directing the laser beam to a position defined by actuation sinals; placing a calibration object in the object plane of the microscope objective; actuating the laser deflection device using first actuation signais and first calibration values, making at least one calibration mark on the calibration object; capturing an image ofthe calibration object by the digital image capturing unit; determining actual position values for the at least one calibration mark; and determining second calibration values based on a relationship between the default position values and the actual position values.

Abstract translation: 一种用于校准具有包括图像评估模块的数字图像捕获单元的激光解剖系统的显微镜的反射光装置中的激光偏转装置的方法包括产生激光束; 引导激光束通过显微镜物镜; 将激光束引导到由致动正弦限定的位置; 将校准物体放置在显微镜物镜的物平面内; 使用第一致动信号和第一校准值致动激光偏转装置，在校准物体上形成至少一个校准标记; 通过数字图像捕获单元捕获校准对象的图像; 确定所述至少一个校准标记的实际位置值; 以及基于所述默认位置值和所述实际位置值之间的关系来确定第二校准值。