公开(公告)号：US20170135617A1

公开(公告)日：2017-05-18

申请号：US15325811

申请日：2015-07-13

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Jukka Alasirniö ,  Tobias Senn ,  Mario Cesana ,  Hartmut Rudmann ,  Markus Rossi ,  Peter Roentgen ,  Daniel Pérez Calero ,  Bassam Hallal ,  Jens Geiger

IPC: A61B5/1455 ,  A61B5/024 ,  G01J1/42 ,  G01S17/48 ,  G01S7/497

CPC classification number: A61B5/14551 ,  A61B5/02416 ,  A61B5/02433 ,  A61B5/14552 ,  G01J1/4204 ,  G01S7/497 ,  G01S17/48 ,  G01S2007/4975

Abstract: The present disclosure describes modules operable to perform optical sensing. The module can be operable to distinguish between signals indicative of reflections from an object or interest and signals indicative of a spurious reflection such as from a smudge (i.e., a blurred or smeared mark) on the host device's cover glass. Signals assigned to reflections from the object of interest can be used to for various purposes, depending on the application (e.g., determining an object's proximity, a person's heart rate or a person's blood oxygen level).

公开(公告)号：US20170287963A1

公开(公告)日：2017-10-05

申请号：US15622813

申请日：2017-06-14

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Hartmut Rudmann ,  Mario Cesana ,  Jens Geiger ,  Peter Roentgen ,  Vincenzo Condorelli

IPC: H01L27/146

CPC classification number: H01L27/14625 ,  H01L27/14618 ,  H01L27/14621 ,  H01L27/14685

Abstract: Optoelectronic modules include a silicon substrate in which or on which there is an optoelectronic device. An optics assembly is disposed over the optoelectronic device, and a spacer separates the silicon substrate from the optics assembly. Methods of fabricating such modules also are described.

公开(公告)号：US09711552B2

公开(公告)日：2017-07-18

申请号：US14823174

申请日：2015-08-11

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Hartmut Rudmann ,  Mario Cesana ,  Jens Geiger ,  Peter Roentgen ,  Vincenzo Condorelli

IPC: H01L33/00 ,  H01L27/146

CPC classification number: H01L27/14625 ,  H01L27/14618 ,  H01L27/14621 ,  H01L27/14685

Abstract: Optoelectronic modules include a silicon substrate in which or on which there is an optoelectronic device. An optics assembly is disposed over the optoelectronic device, and a spacer separates the silicon substrate from the optics assembly. Methods of fabricating such modules also are described.

公开(公告)号：US20160011075A1

公开(公告)日：2016-01-14

申请号：US14767832

申请日：2014-02-18

Applicant: HEPTAGON MICRO OPTICS PTE. LTD.

Inventor： Matthias Maluck ,  Peter Roentgen

IPC: G01M11/02

CPC classification number: G01M11/0235 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/28 ,  G01M11/0207 ,  G02B7/02 ,  G02B7/04 ,  G02B7/28 ,  G02B21/0064

Abstract: Identifying a location of a focal point of an optical system includes, in some implementations, using a sensor system to detect light that passed through the optical system, and determining a location of a focal point of the optical system based on a location of a focal point of the sensor system that substantially matches the location of the focal point of the optical system.

Abstract translation: 在一些实施方案中，识别光学系统的焦点的位置包括使用传感器系统来检测通过光学系统的光，以及基于焦点的位置来确定光学系统的焦点的位置 传感器系统的点与光学系统的焦点的位置基本匹配。

公开(公告)号：US20140027623A1

公开(公告)日：2014-01-30

申请号：US14021065

申请日：2013-09-09

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Peter Roentgen ,  Markus Rossi

IPC: G01J1/04

CPC classification number: G01J1/0488 ,  G01J1/0407 ,  G01J1/0437 ,  G01J1/06 ,  G01J1/4204 ,  G01J1/4228 ,  G01J3/0229 ,  G01J3/36 ,  G01J2001/4247

Abstract: Disclosed is an arrangement for detecting first light (L1) and second light (L2), with the first light (L1) and second light (L2) having no wavelength in common. The arrangement includes a first effective detector area (D1) and a second effective detector area (D2). The first effective detector area (D1) is exposed to the first light (L1) and/or second light (L2) different from the first light (L1) and/or second light (L2) to which the second effective detector area (D2) is exposed when the arrangement is exposed to spatially uniformly distributed first light (L1) and second light (L2). The difference between the first light (L1) and/or second light (L2) to which said first detector area (D1) and second detector area (D2) are exposed to can be a difference in intensity and/or difference in an angle of incidence relative to the arrangement.

Abstract translation: 公开了一种用于检测第一光（L1）和第二光（L2）的装置，其中第一光（L1）和第二光（L2）不具有共同的波长。 该装置包括第一有效检测器区域（D1）和第二有效检测器区域（D2）。 第一有效检测器区域（D1）暴露于与第二有效检测器区域（D2）的第一光（L1）和/或第二光（L2）不同的第一光（L1）和/或第二光（L2） ）暴露于空间均匀分布的第一光（L1）和第二光（L2）时。 所述第一检测器区域（D1）和第二检测器区域（D2）暴露于的第一光（L1）和/或第二光（L2）之间的差可以是强度和/ 发生率相对于安排。

公开(公告)号：US11112304B2

公开(公告)日：2021-09-07

申请号：US16610238

申请日：2018-05-03

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Kotaro Ishizaki ,  Javier Miguel-Sánchez ,  Peter Roentgen

IPC: G01J3/42 ,  G01J3/02 ,  G01N21/27

Abstract: Calibrating a spectrometer module includes performing measurements using the spectrometer module to generate wavelength-versus-operating parameter calibration data for the spectrometer module, performing measurements using the spectrometer module to generate optical crosstalk and dark noise calibration data for the spectrometer module, and performing measurements using the spectrometer module to generate full system response calibration data, against a known reflectivity standard, for the spectrometer module. The method further includes storing in memory, coupled to the spectrometer module, a calibration record that incorporates the wavelength-versus-operating parameter calibration data, the optical crosstalk and dark noise calibration data, and the full system response calibration data, and applying the calibration record to measurements by the spectrometer module.

公开(公告)号：US20200056939A1

公开(公告)日：2020-02-20

申请号：US16610238

申请日：2018-05-03

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Kotaro Ishizaki ,  Javier Miguel-Sánchez ,  Peter Roentgen

IPC: G01J3/02 ,  G01N21/27 ,  G01J3/42

Abstract: Calibrating a spectrometer module includes performing measurements using the spectrometer module to generate wavelength-versus-operating parameter calibration data for the spectrometer module, performing measurements using the spectrometer module to generate optical crosstalk and dark noise calibration data for the spectrometer module, and performing measurements using the spectrometer module to generate full system response calibration data, against a known reflectivity standard, for the spectrometer module. The method further includes storing in memory, coupled to the spectrometer module, a calibration record that incorporates the wavelength-versus-operating parameter calibration data, the optical crosstalk and dark noise calibration data, and the full system response calibration data, and applying the calibration record to measurements by the spectrometer module.

公开(公告)号：US20180124327A1

公开(公告)日：2018-05-03

申请号：US15121459

申请日：2015-02-23

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Jukka Alasirnio ,  Tobias Senn ,  Ohad Meitav ,  Moshe Doron ,  Alireza Yasan ,  Mario Cesana ,  Florin Cutu ,  Hartmut Rudmann ,  Markus Rossi ,  Peter Roentgen ,  Daniel Perez Calero ,  Bassam Hallal ,  Jens Geiger

IPC: H04N5/247 ,  H04N5/225 ,  H04N5/33 ,  G02B13/00

Abstract: Image sensor modules include primary high-resolution imagers and secondary imagers. For example, an image sensor module may include a semiconductor chip including photosensitive regions defining, respectively, a primary camera and a secondary camera. The image sensor module may include an optical assembly that does not substantially obstruct the field-of-view of the secondary camera. Some modules include multiple secondary cameras that have a field-of-view at least as large as the field-of-view of the primary camera. Various features are described to facilitate acquisition of signals that can be used to calculate depth information.

公开(公告)号：US20170299433A1

公开(公告)日：2017-10-19

申请号：US15512977

申请日：2015-09-23

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Peter Riel ,  Peter Roentgen

IPC: G01J3/10 ,  H01S5/10 ,  H01S5/04 ,  H01S5/00 ,  G01J3/26 ,  H01S5/343 ,  G01J3/06

CPC classification number: G01J3/10 ,  G01J3/06 ,  G01J3/108 ,  G01J3/26 ,  H01S3/094096 ,  H01S5/0071 ,  H01S5/0287 ,  H01S5/041 ,  H01S5/1096 ,  H01S5/183 ,  H01S5/32375 ,  H01S5/34306 ,  H01S5/34313 ,  H01S5/34326 ,  H01S5/3438 ,  H01S5/4043 ,  H01S5/4087

Abstract: The present disclosure describes broadband optical emission sources that include a stack of semiconductor layers, wherein each of the semiconductor layers is operable to emit light of a different respective wavelength; a light source operable to provide optical pumping for stimulated photon emission from the stack; wherein the semiconductor layers are disposed sequentially in the stack such that a first one of the semiconductor layers is closest to the light source and a last one of the semiconductor layers is furthest from the light source, and wherein each particular one of the semiconductor layers is at least partially transparent to the light generated by the other semiconductor layers that are closer to the light source than the particular semiconductor layer. The disclosure also describes various spectrometers that include a broadband optical emission device, and optionally include a tuneable wavelength filter operable to allow a selected wavelength or narrow range of wavelengths to pass through.

公开(公告)号：US20170248472A1

公开(公告)日：2017-08-31

申请号：US15510085

申请日：2015-09-08

Applicant: Heptagon Micro Optics Pte. Ltd.

Inventor： Peter Roentgen ,  Jens Geiger ,  Markus Rossi

IPC: G01J9/00 ,  H01L27/144 ,  H01L31/0232 ,  G01J3/28

CPC classification number: G01J9/00 ,  G01J1/0488 ,  G01J1/4257 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/1213 ,  H01L27/1443 ,  H01L27/1446 ,  H01L27/14621 ,  H01L27/14647 ,  H01L31/02327

Abstract: The present disclosure describes optical radiation sensors and detection techniques that facilitate assigning a specific wavelength to a measured photocurrent. The techniques can be used to determine the spectral emission characteristics of a radiation source. In one aspect, a method of determining spectral emission characteristics of incident radiation includes sensing at least some of the incident radiation using a light detector having first and second photosensitive regions whose optical responsivity characteristics differ from one another. The method further includes identifying a wavelength of the incident radiation based on a ratio of a photocurrent from the first region and a photocurrent from the second region.