LOAD TOLERANT VOLTAGE CONTROLLED OSCILLATOR (VCO), IC AND CMOS IC INCLUDING THE VCO
    11.
    发明申请
    LOAD TOLERANT VOLTAGE CONTROLLED OSCILLATOR (VCO), IC AND CMOS IC INCLUDING THE VCO 失效
    包含VCO的负载电压控制振荡器(VCO),IC和CMOS IC

    公开(公告)号:US20130044838A1

    公开(公告)日:2013-02-21

    申请号:US13211697

    申请日:2011-08-17

    IPC分类号: H04L27/06 H03B5/08 H03B5/12

    摘要: A voltage controlled oscillator (VCO), IC and CMOS IC including the VCO. The VCO includes an LC tank circuit, a pair of cross-coupled devices connected to the tank circuit and driving a pair of buffers. Each of the pair of cross-coupled devices includes a field effect transistor (FET) with an independently controllable body, e.g., the surface layer of a Silicon on Insulator (SOI) chip or the surface well of a multi-well chip. Diodes in the multi-well structure are biased off in each device. The tank circuit is coupled to the buffers solely through the FET drain to body capacitance

    摘要翻译: 压控振荡器(VCO),IC和CMOS IC包括VCO。 VCO包括LC槽电路,连接到储能电路的一对交叉耦合器件,并驱动一对缓冲器。 这对交叉耦合器件中的每一个包括具有可独立控制的体的场效应晶体管(FET),例如绝缘体上硅(SOI)芯片的表面层或多阱芯片的表面阱。 多孔结构中的二极管在每个器件中偏置。 储能电路仅通过FET漏极耦合到缓冲器到体电容

    TEST STRUCTURE FOR DETERMINATION OF TSV DEPTH
    12.
    发明申请
    TEST STRUCTURE FOR DETERMINATION OF TSV DEPTH 有权
    测定TSV深度的测试结构

    公开(公告)号:US20120175612A1

    公开(公告)日:2012-07-12

    申请号:US13423823

    申请日:2012-03-19

    IPC分类号: H01L23/48

    CPC分类号: H01L22/34 H01L21/76898

    摘要: A test structure for a through-silicon-via (TSV) in a semiconductor chip includes a first contact, the first contact being electrically connected to a first TSV; and a second contact, wherein the first contact, second contact, and the first TSV form a first channel, and a depth of the first TSV is determined based on a resistance of the first channel.

    摘要翻译: 半导体芯片中的贯穿硅通孔(TSV)的测试结构包括:第一触点,第一触点电连接到第一TSV; 以及第二触点,其中所述第一触点,所述第二触点和所述第一TSV形成第一通道,并且基于所述第一通道的电阻来确定所述第一TSV的深度。

    SEMICONDUCTOR STRUCTURE INCLUDING A HIGH PERFORMANCE FET AND A HIGH VOLTAGE FET ON AN SOI SUBSTRATE
    13.
    发明申请
    SEMICONDUCTOR STRUCTURE INCLUDING A HIGH PERFORMANCE FET AND A HIGH VOLTAGE FET ON AN SOI SUBSTRATE 有权
    在SOI衬底上包括高性能FET和高电压FET的半导体结构

    公开(公告)号:US20120132992A1

    公开(公告)日:2012-05-31

    申请号:US13367646

    申请日:2012-02-07

    IPC分类号: H01L27/12

    摘要: A first field effect transistor includes a gate dielectric and a gate electrode located over a first portion of a top semiconductor layer in a semiconductor-on-insulator (SOI) substrate. A second field effect transistor includes a portion of a buried insulator layer and a source region and a drain region located underneath the buried insulator layer. In one embodiment, the gate electrode of the second field effect transistor is a remaining portion of the top semiconductor layer. In another embodiment, the gate electrode of the second field effect transistor is formed concurrently with the gate electrode of the first field effect transistor by deposition and patterning of a gate electrode layer. The first field effect transistor may be a high performance device and the second field effect transistor may be a high voltage device. A design structure for the semiconductor structure is also provided.

    摘要翻译: 第一场效应晶体管包括栅极电介质和位于绝缘体上半导体(SOI))衬底中顶部半导体层的第一部分上方的栅电极。 第二场效应晶体管包括掩埋绝缘体层的一部分和位于掩埋绝缘体层下方的源区和漏区。 在一个实施例中,第二场效应晶体管的栅电极是顶部半导体层的剩余部分。 在另一个实施例中,第二场效应晶体管的栅极通过栅极电极层的沉积和图案化与第一场效应晶体管的栅电极同时形成。 第一场效应晶体管可以是高性能器件,第二场效应晶体管可以是高电压器件。 还提供了用于半导体结构的设计结构。

    ON-CHIP MILLIMETER WAVE LANGE COUPLER
    14.
    发明申请
    ON-CHIP MILLIMETER WAVE LANGE COUPLER 有权
    片上微米波浪耦合器

    公开(公告)号:US20120032737A1

    公开(公告)日:2012-02-09

    申请号:US13277265

    申请日:2011-10-20

    IPC分类号: H03D3/00 H03F3/68

    摘要: A Lange coupler having a first plurality of lines on a first level and a second plurality of lines on a second level. At least one line on the first level is cross-coupled to a respective line on the second level via electromagnetic waves traveling through the first and second plurality of lines. The first and second plurality of lines may be made of metal, and the first level may be higher than the second level. A substrate may be provided into which the first and second plurality of lines are etched so as to define an on-chip Lange coupler.

    摘要翻译: Lange耦合器,其具有在第一电平上的第一多个线,而在第二电平上具有第二多个线。 在第一级上的至少一条线通过在第一和第二条线上行进的电磁波交叉耦合到第二电平上的相应线。 第一和第二多个线可以由金属制成,并且第一电平可以高于第二电平。 可以提供衬底,其中蚀刻第一和第二多条线以便限定片上朗格耦合器。

    Circuit structure and design structure for an optionally switchable on-chip slow wave transmission line band-stop filter and a method of manufacture
    15.
    发明授权
    Circuit structure and design structure for an optionally switchable on-chip slow wave transmission line band-stop filter and a method of manufacture 有权
    用于可选择切换的片上慢波传输线带阻滤波器的电路结构和设计结构以及制造方法

    公开(公告)号:US08106728B2

    公开(公告)日:2012-01-31

    申请号:US12424110

    申请日:2009-04-15

    IPC分类号: H01P3/08 H01P1/203

    CPC分类号: H01P1/203 Y10T29/49155

    摘要: The present invention generally relates to a circuit structure, design structure and method of manufacturing a circuit, and more specifically to a circuit structure and design structure for an on-chip slow wave transmission line band-stop filter and a method of manufacture. A structure includes an on-chip transmission line stub comprising a conditionally floating structure structured to provide increased capacitance to the on-chip transmission line stub when the conditionally floating structure is connected to ground.

    摘要翻译: 本发明一般涉及一种电路结构,电路制造的设计结构和方法,更具体地涉及用于片上慢波传输线带阻滤波器的电路结构和设计结构以及制造方法。 一种结构包括片上传输线短截线,其包括有条件浮动结构,其被构造为当有条件浮动结构连接到地时为片上传输线短截线提供增加的电容。

    Coplanar waveguide integrated circuits having arrays of shield conductors connected by bridging conductors
    16.
    发明授权
    Coplanar waveguide integrated circuits having arrays of shield conductors connected by bridging conductors 有权
    具有通过桥接导体连接的屏蔽导体阵列的共面波导集成电路

    公开(公告)号:US07812694B2

    公开(公告)日:2010-10-12

    申请号:US12061950

    申请日:2008-04-03

    IPC分类号: H01P3/08

    CPC分类号: H01P3/003

    摘要: Coplanar waveguide structures and design structures for radiofrequency and microwave integrated circuits. The coplanar waveguide structure includes a signal conductor and ground conductors generally coplanar with the signal conductor. The signal conductor is disposed between upper and lower arrays of substantially parallel shield conductors. Conductive bridges, which are electrically isolated from the signal conductor, are located laterally between the signal conductor and each of the ground conductors. Pairs of the conductive bridges connect one of the shield conductors in the first array with one of the shield conductors in the second array to define closed loops encircling the signal line.

    摘要翻译: 射频和微波集成电路的共面波导结构和设计结构。 共面波导结构包括信号导体和与信号导体大致共面的接地导体。 信号导体设置在基本上平行的屏蔽导体的上和下阵列之间。 与信号导体电隔离的导电桥横向位于信号导体和每个接地导体之间。 一对导电桥将第一阵列中的一个屏蔽导体与第二阵列中的一个屏蔽导体连接,以限定围绕信号线的闭环。

    METHOD OF FORMING A HIGH PERFORMANCE FET AND A HIGH VOLTAGE FET ON A SOI SUBSTRATE
    17.
    发明申请
    METHOD OF FORMING A HIGH PERFORMANCE FET AND A HIGH VOLTAGE FET ON A SOI SUBSTRATE 有权
    在SOI衬底上形成高性能FET和高电压FET的方法

    公开(公告)号:US20100035390A1

    公开(公告)日:2010-02-11

    申请号:US12188366

    申请日:2008-08-08

    IPC分类号: H01L21/84

    摘要: A first portion of a top semiconductor layer of a semiconductor-on-insulator (SOI) substrate is protected, while a second portion of the top semiconductor layer is removed to expose a buried insulator layer. A first field effect transistor including a gate dielectric and a gate electrode located over the first portion of the top semiconductor layer is formed. A portion of the exposed buried insulator layer is employed as a gate dielectric for a second field effect transistor. In one embodiment, the gate electrode of the second field effect transistor is a remaining portion of the top semiconductor layer. In another embodiment, the gate electrode of the second field effect transistor is formed concurrently with the gate electrode of the first field effect transistor by deposition and patterning of a gate electrode layer.

    摘要翻译: 保护绝缘体上半导体(SOI)衬底的顶部半导体层的第一部分,同时去除顶部半导体层的第二部分以暴露掩埋的绝缘体层。 形成包括位于顶部半导体层的第一部分上方的栅极电介质和栅电极的第一场效应晶体管。 暴露的掩埋绝缘体层的一部分用作第二场效应晶体管的栅极电介质。 在一个实施例中,第二场效应晶体管的栅电极是顶部半导体层的剩余部分。 在另一个实施例中,第二场效应晶体管的栅极通过栅极电极层的沉积和图案化与第一场效应晶体管的栅电极同时形成。

    METHOD FOR FORMING AN ON-CHIP HIGH FREQUENCY ELECTRO-STATIC DISCHARGE DEVICE
    19.
    发明申请
    METHOD FOR FORMING AN ON-CHIP HIGH FREQUENCY ELECTRO-STATIC DISCHARGE DEVICE 失效
    用于形成片上高频电静电放电装置的方法

    公开(公告)号:US20090317970A1

    公开(公告)日:2009-12-24

    申请号:US12144089

    申请日:2008-06-23

    IPC分类号: H01L21/4763

    摘要: A method for forming an on-chip high frequency electro-static discharge device on an integrated circuit is described. In one embodiment of the method, a capped first dielectric layer with more than one electrode formed therein is provided. A second dielectric layer is deposited over the capped first dielectric layer. A first hard mask dielectric layer is deposited over the second dielectric layer. A cavity trench is formed through the first hard mask dielectric layer and the second dielectric layer to the first dielectric layer, wherein the cavity trench is formed in the first dielectric layer between two adjacent electrodes. At least one via is formed through the second dielectric layer about the cavity trench. A metal trench is formed around each of the at least one via. A release opening is formed over the cavity trench. A third dielectric layer is deposited over the second dielectric layer, wherein the third dielectric layer hermetically seals the release opening to provide electro-static discharge protection.

    摘要翻译: 描述了在集成电路上形成片上高频静电放电装置的方法。 在该方法的一个实施例中,提供了一种其上形成有多于一个电极的封盖的第一电介质层。 在封盖的第一介电层上沉积第二介电层。 第一硬掩模介电层沉积在第二介电层上。 通过第一硬掩模电介质层和第二电介质层形成腔沟槽到第一介电层,其中在两个相邻电极之间的第一电介质层中形成空腔沟槽。 至少一个通孔围绕腔沟槽形成穿过第二电介质层。 在所述至少一个通孔中的每一个周围形成金属沟槽。 在空腔沟槽上形成释放开口。 在第二电介质层上沉积第三电介质层,其中第三介电层气密地密封释放开口以提供静电放电保护。

    DESIGN STRUCTURE FOR AN ON-CHIP HIGH FREQUENCY ELECTRO-STATIC DISCHARGE DEVICE
    20.
    发明申请
    DESIGN STRUCTURE FOR AN ON-CHIP HIGH FREQUENCY ELECTRO-STATIC DISCHARGE DEVICE 有权
    片上高频电子放电装置的设计结构

    公开(公告)号:US20090316314A1

    公开(公告)日:2009-12-24

    申请号:US12144095

    申请日:2008-06-23

    IPC分类号: H02H9/00 G06F17/50

    摘要: A design structure for an on-chip high frequency electro-static discharge device is described. In one embodiment, the electro-static discharge structure comprises a first dielectric layer with more than one electrode formed therein. A second dielectric layer with more than one electrode formed therein is located above the first dielectric layer. At least one via connects the more than one electrode in the first dielectric layer with the more than one electrode in the second dielectric layer. A gap is formed through the first dielectric layer and the second dielectric layer, wherein the gap extends between two adjacent electrodes in both the first dielectric layer and the second dielectric layer. A third dielectric layer is disposed over the second dielectric layer, wherein the third dielectric layer hermetically seals the gap to provide electro-static discharge protection on the integrated circuit.

    摘要翻译: 描述了片上高频静电放电装置的设计结构。 在一个实施例中,静电放电结构包括其中形成有多于一个电极的第一电介质层。 其中形成有多于一个电极的第二电介质层位于第一介电层的上方。 至少一个通孔将第一介电层中的多于一个的电极与第二介电层中的多于一个的电极连接。 通过第一电介质层和第二电介质层形成间隙,其中间隙在第一电介质层和第二电介质层中的两个相邻电极之间延伸。 第三电介质层设置在第二电介质层上,其中第三介电层气密地密封间隙以在集成电路上提供静电放电保护。