Abstract:
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.
Abstract:
A sensor system is provided having a precision tracking sensor element and a micro-lamellar spectrometer for determining the wavelength of an electromagnetic source such as a laser designator source. Acquisition sensor elements may be provided and mounted on a rotating base element that rotates about a first axis. The precision tracking sensor elements may be mounted on a hinged or pivoting element or gimbal on the housing and provided with drive means to permit a user to selectively manually or automatically direct it toward a scene target of interest detected by the acquisition sensor elements. At least one of the imaging elements in the precision tracking sensor or acquisition sensors is stacked micro-channel plate focal plane array element.
Abstract:
A spectrometer is provided. In one implementation, for example, a spectrometer comprises an excitation source, a focusing lens, a movable minor, and an actuator assembly. The focusing lens is adapted to focus an incident beam from the excitation source. The actuator assembly is adapted to control the movable mirror to move a focused incident beam across a surface of the sample.
Abstract:
The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e.g., a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.
Abstract:
A system for calibrating a spectrometer includes wide field-of-view (WFOV) optics providing a first light path to a WFOV spectrometer, and narrow field-of-view (NFOV) optics providing a second light path to a NFOV spectrometer. A de-focusing optic is selectively positioned in the first or second light paths. A scan controller selectively controls the WFOV or NFOV optics to scan a celestial body. A processor is configured to calibrate the de-focusing optic, while the WFOV optics scan the celestial body. First, the WFOV optics scan the celestial body without the de-focusing optic positioned in the first light path. Second, the WFOV optics scan the celestial body with the de-focusing optic positioned in the first light path. Next, the processor calibrates the NFOV spectrometer, while the NFOV optics and the de-focusing optic scan the celestial body. After the NFOV spectrometer is calibrated, the NFOV spectrometer may be used to measure the albedo of the earth.
Abstract:
An apparatus and source arrangement for filtering an electromagnetic radiation can be provided which may include at least one spectral separating arrangement configured to physically separate one or more components of the electromagnetic radiation based on a frequency of the electromagnetic radiation. The apparatus and source arrangement may also have at least one continuously rotating optical arrangement, e.g., polygonal scanning mirror and spinning reflector disk scanner, which is configured to receive at least one signal that is associated with the one or more components. Further, the apparatus and source arrangement can include at least one beam selecting arrangement configured to receive the signal.
Abstract:
The present invention provides a small spectroscope that has a short response time. A spectroscope according to one embodiment of the present invention includes: a beam deflector that includes an electro-optic crystal, having an electro-optic effect, and paired electrodes used to apply an electric field inside the electro-optic crystal; spectroscopic means for dispersing light output by the beam deflector; and wavelength selection means for selecting light having an arbitrary wavelength from the light dispersed and output by the spectroscopic means.
Abstract:
In one aspect, an apparatus for use in a wellbore is provided that may include: a tool configured to be conveyed into the wellbore by a conveying member; and an electro-active polymer device (“EAP device”) configured to connect the tool to the conveying member when the EAP device is in a first mode or position and disconnect the tool from the conveying member when the EAP device is in a second mode or position. In another aspect, a method for releasing a tool in a wellbore is provided which includes: releasably connecting an EAP device to a conveying member and the tool; conveying the tool in the wellbore with the conveying member; and electrically activating the EAP device to release the tool from the conveying member in the wellbore.
Abstract:
An optical microscanner achieves wide rotation angles utilizing a curved reflector. The optical microscanner includes a moveable mirror for receiving an incident beam and reflecting the incident beam to produce a reflected beam and a Micro Electro-Mechanical System (MEMS) actuator that causes a linear displacement of the moveable minor. The curved reflector produces an angular rotation of the reflected beam based on the linear displacement of the moveable mirror.
Abstract:
The invention relates to a multispectral imaging device for satellite observation by “push-broom” scanning over an observed area, operating in N wavelength bands, respectively centered on a first wavelength (λ1), . . . , an nth wavelength (λN) comprising: a source emitting a light beam in a set of the N wavelength bands; a wide-field optic; a set of N rows of detectors making it possible to acquire images of said observed area; optical filtering means, characterized in that it also comprises: a first dispersion element (R1,R) making it possible to disperse the light beam toward the filtering means; optical filtering means comprising at least one micro-opto-electro-mechanical system (MOEMS) capable of carrying out N filtering functions for the N spectral bands, wavelength-tunable; control means for said micro-opto-electro-mechanical system making it possible to select the filtering function.