公开(公告)号：US08679728B2

公开(公告)日：2014-03-25

申请号：US13684019

申请日：2012-11-21

Applicant: National Applied Research Laboratories

Inventor： Chien-Chao Huang ,  Chun-Chi Chen ,  Shyi-Long Shy ,  Cheng-San Wu ,  Fu-Liang Yang

IPC: G03F7/20 ,  G03C5/00

CPC classification number: G03F7/2022 ,  C23C14/048 ,  C23C16/047 ,  G03F7/20 ,  G03F7/203 ,  G03F7/2059 ,  H01L21/0337 ,  H01L21/31105 ,  H01L21/3213 ,  Y10T428/24612 ,  Y10T428/24802

Abstract: A method for fabricating a patterned layer is disclosed. Firstly, a semiconductor substrate is provided. Then, a precursory gas on the semiconductor substrate is formed. Finally, a patterned layer on the semiconductor substrate is deposited by reacting the precursory gas with at least one electron beam or at least one ion beam. The present invention not only fabricates a patterned layer on the substrate in a single step but also achieves a high lithographic resolution and avoids remains of contaminations by using the properties of the electron beam or the ion beam and the precursory gas.

Abstract translation: 公开了一种用于制造图案层的方法。 首先，提供半导体衬底。 然后，形成半导体衬底上的前体气体。 最后，通过使前体气体与至少一个电子束或至少一个离子束反应来沉积半导体衬底上的图案层。 本发明不仅在单个步骤中在基板上制造图案层，而且还实现了高的光刻分辨率，并且通过使用电子束或离子束和前体气体的性质避免了污染物的残留。

公开(公告)号：US20140002275A1

公开(公告)日：2014-01-02

申请号：US13742849

申请日：2013-01-16

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Zheng-Kuan Lee

IPC: G08C19/00

CPC classification number: G08C19/00 ,  G01B11/18 ,  G01F23/00 ,  G01F23/0007 ,  G01F23/2921 ,  G01L1/242 ,  G01M5/0008 ,  G01M5/0041 ,  G01M5/0091 ,  G02B6/022

Abstract: The present invention provides an integrated system of full optical complete bridge safety monitoring with speech warming for smart phones. The Integrated system of full optical complete bridge safety monitoring includes a stabilizing device, optical sensing device and communication device. The basic structure involves cable and optical fiber connecting two ends and joined by heat shrink tubes. A measuring segment is located between two heat shrink tubes. The stabilizing device provides a pre-determined tensile strength to the measuring segment. The optical fiber sensing device detects a response via a Fiber Bragg grating in the optical fiber's measuring segment. When the measuring segment receives a response, it changes from first phase to second phase and creates a signal change from the reflected signals. Signal processing device converts the signal changes to physical parameters. The communication device sends warning signals to users. Warning signals are sent to users' smart phones, to proactively inform the bridge's safety status with speeches.

Abstract translation: 本发明提供了一种用于智能电话的全光完整桥安全监控与语音加热的集成系统。 全光全桥安全监控综合系统包括稳定装置，光传感装置及通讯装置。 基本结构涉及电缆和光纤连接两端，并通过热缩管连接。 测量段位于两个热缩管之间。 稳定装置向测量段提供预定的拉伸强度。 光纤感测装置通过光纤测量段中的光纤布拉格光栅检测响应。 当测量段接收到响应时，它从第一相变为第二相，并从反射信号中产生信号变化。 信号处理设备将信号变化转换为物理参数。 通信设备向用户发送警告信号。 警告信号发送给用户的智能手机，主动通知演讲中桥的安全状态。

公开(公告)号：US20130256262A1

公开(公告)日：2013-10-03

申请号：US13663230

申请日：2012-10-29

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Chien-Nan Hsiao ,  Po-Kai Chiu ,  Da-Ren Liu ,  James Su ,  Fong-Zhi Chen

IPC: B05D3/10

CPC classification number: G01B11/0683 ,  C23C14/221 ,  C23C14/547 ,  C23C14/5873 ,  C23C14/5893 ,  C23C16/45591 ,  H01L22/12 ,  H01L22/26

Abstract: An in situ manufacturing process monitoring system of extreme smooth thin film and method thereof, comprising a coating device for coating a thin film on at least one substrate during a coating process, an ion figuring device for processing a surface polishing process on the thin film, a control device electrically coupled to the coating device and the ion figuring device respectively for controlling the coating device and the ion figuring device processing the coating process and surface polishing process by adjusting at least one device parameter of the coating device and the ion figuring device, and an in situ monitoring device electrically coupled to the control device for in situ monitoring at least one optical parameter of the thin film.

Abstract translation: 一种极端光滑薄膜的原位制造工艺监控系统及其方法，包括在涂覆过程中在至少一个基底上涂覆薄膜的涂层装置，用于处理薄膜上的表面抛光工艺的离子计数装置， 电耦合到涂覆装置和离子计数装置的控制装置，分别用于通过调节涂覆装置和离子计数装置的至少一个装置参数来控制涂覆装置和离子计数装置处理涂布过程和表面抛光工艺， 以及电耦合到控制装置的原位监测装置，用于原位监测薄膜的至少一个光学参数。

公开(公告)号：US11875477B2

公开(公告)日：2024-01-16

申请号：US17354188

申请日：2021-06-22

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Chih-Wei Wang ,  Chuan-Lin Lai ,  Chia-Chen Kuo ,  I-Chen Wu

IPC: G06T5/00 ,  G06T7/00 ,  G06F18/2135

CPC classification number: G06T5/001 ,  G06F18/2135 ,  G06T7/0002 ,  G06T2207/10024 ,  G06T2207/10028 ,  G06T2207/20021 ,  G06T2207/30168

Abstract: A method for correcting abnormal point cloud is disclosed. Firstly, receiving a Primitive Point Cloud Data set by an operation unit for dividing a point cloud array into a plurality of sub-point cloud sets and obtaining a plurality of corresponding distribution feature data according to an original vector data of the Primitive Point Cloud Data set. Furthermore, recognizing the sub-point cloud sets according to the corresponding distribution feature data for correcting recognized abnormal point cloud. Thus, when the point cloud array is rendered to a corresponding image, the color defect of the point cloud array will be improved or decreased for obtaining lossless of the corresponding image.

公开(公告)号：US20240000983A1

公开(公告)日：2024-01-04

申请号：US18104279

申请日：2023-01-31

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： HSIN-YI TSAI ,  YU-HSUAN LIN ,  CHUN-HAN CHOU ,  KUO-CHENG HUANG ,  CHING-CHING YANG

IPC: A61L2/03 ,  A61L2/24 ,  H02S20/26 ,  H02S40/38

CPC classification number: A61L2/03 ,  A61L2/24 ,  H02S20/26 ,  H02S40/38 ,  A61L2202/14

Abstract: A microbial inhibition device for inhibiting microorganisms on a predetermined object includes: a covering member covering the predetermined object, and having an attachment surface for attaching to the predetermined object, and an exposed surface opposite to the attachment surface, wherein the covering member includes at least a conductive medium layer, and the conductive medium layer constitutes a predetermined area of the exposed surface; a control module configured to issue a control command reflecting a predetermined conduction mode; and a power supply module electrically connected to the conductive medium layer, and configured to receive the control command so as to power the conductive medium layer according to the predetermined conduction mode based on the control command. The conductive medium layer is conducted with current according to the predetermined conduction mode through the power supply module. Accordingly predetermined microorganisms on the predetermined area are inhibited or killed.

公开(公告)号：US20230164458A1

公开(公告)日：2023-05-25

申请号：US17878062

申请日：2022-08-01

Applicant: PIXART iMAGING INC. ,  NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Ren-Chieh LIU ,  Chao-Chi Lee

IPC: H04N25/768 ,  H04N25/702 ,  H04N25/531 ,  H04N25/51

CPC classification number: H04N25/768 ,  H04N25/702 ,  H04N25/531 ,  H04N25/51 ,  H04N25/77

Abstract: The present disclosure provides a time delay integration (TDI) sensor using a rolling shutter. The TDI sensor includes multiple pixel columns. Each pixel column includes multiple pixels arranged in an along-track direction, wherein two adjacent pixels or two adjacent pixel groups in every pixel column have a separation space therebetween. The separation space is equal to a pixel height multiplied by a time ratio of a line time difference of the rolling shutter and a frame period, or equal to a summation of at least one pixel height and a multiplication of the pixel height by the time ratio of the line time difference and the frame period. The TDI sensor further generates pixel data amplified by different gains for a processor to perform the image combination.

公开(公告)号：US11635100B2

公开(公告)日：2023-04-25

申请号：US17167339

申请日：2021-02-04

Applicant: National Applied Research Laboratories

Inventor： Yao-Yu Yang ,  Chia-Ming Chang ,  Fang-Yao Yeh ,  Shih-Chung Kang

IPC: F16B5/00

Abstract: A joint structure installed in the physical structure is provided. The joint structure includes a first latching member and a second latching member. The first latching member includes a first main body, a head portion extending from the first main body and a first convex portion extending from the first main body. The second latching member includes a second main body, a second convex portion extending from the second main body and a third convex portion extending from the second main body. When the first latching member and the second latching member are in an assembling status, the first convex portion slides between the second convex portion and the third convex portion.

公开(公告)号：US11580659B2

公开(公告)日：2023-02-14

申请号：US16907851

申请日：2020-06-22

Applicant: NATIONAL APPLIED RESEARCH LABORATORIES

Inventor： Jyh-Horng Wu ,  Chien-Hao Tseng ,  Meng-Wei Lin ,  Ting-Shuan Yeh ,  Yi-Hao Hsiao ,  Shi-Wei Lo ,  Fang-Pang Lin ,  Hsin-Hung Lin ,  Jo-Yu Chang

IPC: G06T5/00 ,  G06T7/62 ,  G06V10/40 ,  G06V20/56

Abstract: The present invention relates to a method for size estimation by image recognition of a specific target using a given scale. First, a reference objected is recognized in an image and the corresponding scale is established. Then the specific target is searched and the size of the specific target is estimated according to the acquired scale.

公开(公告)号：US11515307B2

公开(公告)日：2022-11-29

申请号：US16893348

申请日：2020-06-04

Applicant: National Applied Research Laboratories ,  EPISTAR Corporation

Inventor： Shih-Pang Chang ,  Guang-Li Luo ,  Szu-Hung Chen ,  Wen-Kuan Yeh ,  Jen-Inn Chyi ,  Meng-Yang Chen ,  Rong-Ren Lee ,  Shih-Chang Lee ,  Ta-Cheng Hsu

IPC: H01L21/8238 ,  H01L27/092 ,  H01L29/78 ,  H01L29/66 ,  H01L29/16 ,  H01L29/20 ,  H01L29/161

Abstract: A method of making a semiconductor device includes: providing a substrate; forming an insulating layer on the substrate; forming a first trench in the insulating layer; forming a first semiconductor layer in the first trench; and removing a portion of the insulating layer to expose the first semiconductor layer.

公开(公告)号：US11513326B2

公开(公告)日：2022-11-29

申请号：US17136935

申请日：2020-12-29

Applicant: National Applied Research Laboratories

Inventor： Sheng-Feng Lin ,  Chia-Ray Chen ,  Tien-Chun Kuo

IPC: G02B17/08

Abstract: A catadioptric optical system in sequence of ray tracing comprises a first mirrors group of Ritchey-Chrétien type hyperbolic mirrors with positive diopter including a concave primary mirror having a central through hole and a convex secondary mirror, a second corrector lens group with negative diopter positioned at the image-side of the first mirrors group including a first meniscus lens element having positive refractive power and a convex object-side surface, a second lens element having negative refractive power and biconcave surfaces, a third meniscus lens element having negative refractive power and a concave object-side surface, and a fourth lens element having positive refractive power and biconvex surfaces. The infinite conjugate beams of incident light within field of view pass through the catadioptric optical system to become a corrected beam having a small CRA angle.