公开(公告)号：US20150021480A1

公开(公告)日：2015-01-22

申请号：US14327704

申请日：2014-07-10

Applicant: Massachusetts Institute of Technology

Inventor： Michael P. Chrisp

IPC: G01J3/28 ,  G01J3/18 ,  G01J3/02

CPC classification number: G01J3/2823 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0256 ,  G01J3/1804 ,  G01J2003/1204 ,  G01J2003/1273

Abstract: An imaging spectrometer, covering the visible through infrared wavelengths, which disperses the light by a plane diffraction grating behind a wedged optical element. This design uses an achromatic doublet lens with a reflective coating on its convex back surface to produce the spectra on a flat detector. Spatial keystone distortion and spectral smile are controlled to less than one tenth of a pixel over the full wavelength range, facilitating the use of simple retrieval algorithms.

Abstract translation: 一种成像光谱仪，覆盖可见的红外波长，其通过平面衍射光栅将光分散在楔形光学元件后面。 该设计使用了一个消色差双透镜，在其背面的背面具有反射涂层，以便在平坦的检测器上产生光谱。 在整个波长范围内，空间梯形失真和光谱微笑被控制为小于像素的十分之一，便于使用简单的检索算法。

公开(公告)号：US20140368916A1

公开(公告)日：2014-12-18

申请号：US14302180

申请日：2014-06-11

Applicant: Sumitomo Electric Industries, Ltd.

Inventor： Manabu SHIOZAKI ,  Hidehisa TAZAWA

IPC: G02B27/42

CPC classification number: G02B27/4244 ,  G01J3/0286 ,  G01J3/14 ,  G01J3/1804 ,  G02B27/1006 ,  G02B27/4283

Abstract: A dispersive device has a beam expanding optical system which includes first and second prisms each having a pair of faces inclined relative to each other, and expands light containing a plurality of wavelength components by passing the light through each of the faces of the first and second prisms; and a dispersive element which emits the light expanded by the beam expanding optical system, at different diffraction angles by the respective wavelength components. A direction of variation of an output angle of the light emitted from the beam expanding optical system due to temperature change is configured to be a direction to suppress variation of the diffraction angles of the respective wavelength components emitted from the dispersive element due to the temperature change.

Abstract translation: 分散装置具有扩束光学系统，该光束扩展光学系统包括第一和第二棱镜，每个棱镜具有相对于彼此倾斜的一对面，并且通过使光穿过第一和第二透镜的每个面而使包含多个波长分量的光展开 棱镜 以及分散元件，其通过各个波长分量以不同的衍射角发射由扩束光学系统扩展的光。 由于温度变化而从扩束光学系统发射的光的输出角度的变化方向被配置为抑制由于温度变化而从色散元件发射的各个波长分量的衍射角的变化的方向 。

公开(公告)号：US08861060B2

公开(公告)日：2014-10-14

申请号：US13231094

申请日：2011-09-13

Applicant: Tino Puegner ,  Jens Knobbe ,  Heinrich Grueger

Inventor： Tino Puegner ,  Jens Knobbe ,  Heinrich Grueger

IPC: G02B26/08 ,  G02B26/10 ,  G02B26/12 ,  G01J3/02 ,  G01J3/18 ,  G01J3/04

CPC classification number: G01J3/0256 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/04 ,  G01J3/1804 ,  Y10T29/49826

Abstract: For achieving balance between manufacturing effort and spectrometer accuracy, a spectral decomposition device is not completely integrated into a substrate stack, but, for example, after manufacturing the substrate stack in the manufacturing process, the opportunity of compensating inaccuracies in substrate stack manufacturing is given by mounting a component with a suitable optical functional element to a window, like, e.g., an entry, exit or intermediate window of the substrate stack, to at least partially cover the respective window, wherein the optical functional element is, for example, an entry aperture, an exit aperture or also part of an optics or an optical element having a spectrally decomposing effect. The substrate stack may be manufactured on wafer level and the manufacturing tolerances in this manufacturing may be loosened, as the subsequent substrate stack-individual mounting or even window-individual mounting of the components may compensate the fluctuations which resulted in substrate stack manufacturing.

Abstract translation: 为了实现制造工作和光谱仪精度之间的平衡，光谱分解装置未完全集成到衬底叠层中，但是例如在制造过程中制造衬底叠层之后，补偿衬底堆叠制造中的不准确性的机会由 将具有合适的光学功能元件的部件安装到诸如基板堆叠的入口，出口或中间窗口的窗口，以至少部分地覆盖相应的窗口，其中光学功能元件例如是入口 孔径，出射孔径或者具有光谱分解效果的光学元件或光学元件的一部分。 可以在晶片级制造衬底叠层，并且可以松开该制造中的制造公差，因为随后的衬底叠层单独安装或甚至窗户单独安装组件可补偿导致衬底堆叠制造的波动。

公开(公告)号：US08792102B2

公开(公告)日：2014-07-29

申请号：US12914622

申请日：2010-10-28

Applicant: Abhijit Vishwas Patil ,  Sandip Maity ,  Veera Venkata Lakshmi Rajesh Langoju ,  Anusha Rammohan ,  Sameer Dinkar Vartak ,  Umakant Damodar Rapol

Inventor： Abhijit Vishwas Patil ,  Sandip Maity ,  Veera Venkata Lakshmi Rajesh Langoju ,  Anusha Rammohan ,  Sameer Dinkar Vartak ,  Umakant Damodar Rapol

IPC: G01J3/45 ,  G01N21/47 ,  G01N21/25 ,  G01N21/45 ,  B01L3/00 ,  G01N21/03 ,  G01N21/05 ,  G01N21/55

CPC classification number: G01N21/253 ,  B01L3/5027 ,  B01L3/5085 ,  B01L2300/0636 ,  B01L2300/0829 ,  B01L2300/089 ,  G01J3/021 ,  G01J3/1804 ,  G01J3/4531 ,  G01J2003/4534 ,  G01N21/05 ,  G01N21/45 ,  G01N21/55 ,  G01N21/553 ,  G01N21/554 ,  G01N2021/0346

Abstract: A detection system for a two-dimensional (2D) array is provided. The detection system comprises an electromagnetic radiation source, a phase difference generator, a detection surface having a plurality of sample fields that can receive samples, and an imaging spectrometer configured to discriminate between two or more spatially separated points.

Abstract translation: 提供了一种二维（2D）阵列的检测系统。 检测系统包括电磁辐射源，相位差发生器，具有可接收样本的多个采样场的检测表面，以及被配置为区分两个或更多个空间分离点的成像光谱仪。

公开(公告)号：US08670109B2

公开(公告)日：2014-03-11

申请号：US13303648

申请日：2011-11-23

Applicant: Yin Wang ,  Gerard P. Wysocki ,  Feng Xie ,  Chung-En Zah

Inventor： Yin Wang ,  Gerard P. Wysocki ,  Feng Xie ,  Chung-En Zah

IPC: G01N21/00

CPC classification number: H01S5/0042 ,  B82Y20/00 ,  G01J1/0403 ,  G01J1/0407 ,  G01J1/0414 ,  G01J3/021 ,  G01J3/1804 ,  G01J2001/4247 ,  G01R31/2635 ,  H01S5/141 ,  H01S5/3401

Abstract: A system and process for automatically characterizing a plurality of external cavity semiconductor laser chips on a semiconductor laser bar separated from a semiconductor wafer. The system includes a diffraction grating and a steering mirror mounted on a rotary stage for rotating the diffraction grating through a range of diffraction angles. A laser bar positioning stage for automatically aligning each laser chip in a laser bar with the diffraction grating. Reflecting a laser beam emitted from a laser chip in a laser bar with diffraction grating and steering mirror to the laser analyzer. Automatically rotating the diffraction grating through a range of diffraction angles relative to the laser beam and automatically characterizing the laser optical properties such as spectra, power, or spatial modes with the laser analyzer at each diffraction angle.

Abstract translation: 一种用于在与半导体晶片分离的半导体激光棒上自动表征多个外腔半导体激光器芯片的系统和工艺。 该系统包括安装在旋转台上的衍射光栅和转向镜，用于通过衍射角范围旋转衍射光栅。 激光棒定位台，用于将激光棒中的每个激光芯片与衍射光栅自动对准。 将激光棒中的激光芯片的衍射光栅和导向反射镜的激光束反射到激光分析仪。 通过相对于激光束的衍射角自动旋转衍射光栅，并自动表征激光光学性质，如激光分析仪在每个衍射角度下的光谱，功率或空间模式。

公开(公告)号：US08654327B2

公开(公告)日：2014-02-18

申请号：US12602902

申请日：2008-06-06

Applicant: Wolfram Bohle ,  Ulrich Heynen

Inventor： Wolfram Bohle ,  Ulrich Heynen

IPC: G01J3/28

CPC classification number: G01J3/443 ,  G01J3/02 ,  G01J3/021 ,  G01J3/04 ,  G01J3/1804 ,  G01J3/2803

Abstract: The invention relates to a spectrometer for analyzing the optical emission of a sample by means of pulsed excitation of an optical spectral emission, having an excitation source, a gap arrangement, at least one dispersive element and having detectors for the emitted spectrum, in which two beam paths are provided with two dispersive elements, the first dispersive element of which images the spectrum of the emission onto a number of spatially resolving detectors and the second dispersive element of which images the spectrum of the emission onto a number of time-resolving detectors.

Abstract translation: 本发明涉及一种用于通过脉冲激发光谱发射来分析样品的光发射的光谱仪，其具有激发源，间隙布置，至少一个色散元件并且具有用于发射光谱的检测器，其中两个 光束路径设置有两个色散元件，其第一色散元件将发射光谱图像到多个空间分辨检测器，并且其第二色散元件将发射光谱图像到多个时间分辨检测器上。

公开(公告)号：US08559005B2

公开(公告)日：2013-10-15

申请号：US13737157

申请日：2013-01-09

Applicant: Kohei Shimbo ,  Naohiro Kamijo ,  Manabu Seo ,  Yoichi Kubota

Inventor： Kohei Shimbo ,  Naohiro Kamijo ,  Manabu Seo ,  Yoichi Kubota

IPC: G01J3/28

CPC classification number: G01J3/0208 ,  G01J3/0205 ,  G01J3/0229 ,  G01J3/0248 ,  G01J3/1804 ,  G01J3/2803

Abstract: A spectral characteristic measuring device includes an illuminating unit that illuminates a medium; a light dividing unit that divides reflection light from the medium into reflection light beams; a first imaging unit that includes first lenses and second lenses arranged alternately in a staggered pattern and focuses the respective reflection light beams; a diffraction unit that includes a first diffraction region and a second diffraction region and diffracts the focused reflection light beams to form diffraction images; and a light receiving unit that includes plural pixels for receiving the diffraction images. The reflection light beams focused by the first lenses enter the first diffraction region to form first diffraction images, the reflection light beams focused by the second lenses enter the second diffraction region to form second diffraction images, and the first and second diffraction images are arranged alternately on the light receiving unit in a pixel arrangement direction.

Abstract translation: 光谱特性测量装置包括照亮介质的照明单元; 将来自介质的反射光分成反射光束的光分割单元; 第一成像单元，其包括以交错图案交替布置的第一透镜和第二透镜，并且对各个反射光束进行聚焦; 衍射单元，其包括第一衍射区域和第二衍射区域，并衍射聚焦反射光束以形成衍射图像; 以及包括用于接收衍射图像的多个像素的光接收单元。 由第一透镜聚焦的反射光束进入第一衍射区域以形成第一衍射图像，由第二透镜聚焦的反射光束进入第二衍射区域以形成第二衍射图像，并且第一和第二衍射图像交替布置 在像素排列方向上的光接收单元上。

公开(公告)号：US08514321B2

公开(公告)日：2013-08-20

申请号：US12604958

申请日：2009-10-23

Applicant: Kyong-Tae Park ,  Shitao Deng

Inventor： Kyong-Tae Park ,  Shitao Deng

IPC: G03B13/00 ,  H04N5/232

CPC classification number: H04N5/23212 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0278 ,  G01J3/0291 ,  G01J3/1804 ,  G02B7/38 ,  G02B27/0068

Abstract: A wavelength detecting apparatus capable of detecting the main wavelength of the light coming into an image capture apparatus and a focus detecting apparatus using the same are disclosed. The wavelength detecting apparatus may include a spectral unit which separates the incoming light according to the respective wavelengths, and may focus the separated light onto a sensor. The main wavelength can be determined based on the wavelength distribution sensed by the sensor. The determined wavelength can be used to further determine amount of adjustment to be made to the defocus amount to compensate for the chromatic aberration associated with the wavelength of the light illuminating the source.

Abstract translation: 公开了一种能够检测进入图像捕获装置的光的主波长的波长检测装置和使用该波长检测装置的聚焦检测装置。 波长检测装置可以包括根据各个波长分离入射光的光谱单元，并且可以将分离的光聚焦到传感器上。 主波长可以根据传感器感测到的波长分布来确定。 可以使用所确定的波长来进一步确定对散焦量进行的调整量，以补偿与照亮源的光的波长相关联的色像差。

公开(公告)号：US08247240B2

公开(公告)日：2012-08-21

申请号：US12782630

申请日：2010-05-18

Applicant: Homer Paul Pien ,  William C. Karl ,  Derek Puff ,  Peter Li ,  Brian Cunningham

Inventor： Homer Paul Pien ,  William C. Karl ,  Derek Puff ,  Peter Li ,  Brian Cunningham

IPC: G01N33/543

CPC classification number: G01N21/7743 ,  B01L3/5085 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/1804 ,  G01J3/42 ,  G01N21/253 ,  G01N21/31 ,  G01N33/54373 ,  G01N2021/3196 ,  G01N2021/7773 ,  G02B5/1809 ,  Y10S436/805

Abstract: Performing high-resolution determination of the relative shift of the spectral properties of a biosensor. The shift in the resonance peak of the biosensor is indicative of the amount of material bound to the surface of the biosensor. A preferred biosensor is a Guided Mode Resonant Filter Biosensor (GMRFB). In one aspect of the invention, curve fitting is used to determine the relative location of the spectrum of the unexposed biosensor with respect to those spectra that are altered (e.g., shifted) by the presence of materials bound to the surface of the biosensor. In an alternative embodiment, the cross correlation function is used to detect spectral peak offsets between a reference spectrum and a spectrum measured from an exposed biosensor. In yet another alternative, maximal likelihood estimation techniques are used to determine the spectral shift or offs.

Abstract translation: 对生物传感器的光谱特性进行相对偏移的高分辨率测定。 生物传感器的共振峰的偏移指示与生物传感器的表面结合的材料的量。 优选的生物传感器是引导模式谐振滤波器生物传感器（GMRFB）。 在本发明的一个方面，使用曲线拟合来确定未暴露的生物传感器的光谱相对于通过存在与生物传感器的表面结合的材料而被改变（例如，偏移）的那些光谱的相对位置。 在替代实施例中，互相关函数用于检测参考光谱和从暴露的生物传感器测量的光谱之间的光谱峰值偏移。 在另一替代方案中，使用最大似然估计技术来确定频谱偏移或偏移。

公开(公告)号：US08098374B2

公开(公告)日：2012-01-17

申请号：US12444244

申请日：2007-10-02

Applicant: Ralf Wolleschensky ,  Hans-Juergen Dobschal ,  Reinhard Steiner

Inventor： Ralf Wolleschensky ,  Hans-Juergen Dobschal ,  Reinhard Steiner

IPC: G01J3/28

CPC classification number: G01J3/1804 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0291 ,  G01J3/14 ,  G01J3/26 ,  G01J3/2803

Abstract: The invention is directed to a highly sensitive spectrum analysis unit with a diffraction grating, wherein a parallel light bundle having a wavelength range impinges on a diffraction grating which splits the different wavelengths into spectra by diffraction in first directions, and wavelength partial ranges of the spectrally split light bundle can be focused on a detector row by means of camera optics, and evaluation electronics are connected to the detector row and acquire the generated spectrum as information and display it. The invention is characterized in that the light bundle passes a first optical element, and then wavelength partial ranges of a spectrally split light bundle impinge on respective partial regions of a diffraction grating, the diffraction grating having the same grating constant across all partial regions and a changing profile shape, the profile shapes generating different blaze wavelengths that lie in the respective wavelength partial ranges.

Abstract translation: 本发明涉及一种具有衍射光栅的高灵敏度光谱分析单元，其中具有波长范围的平行光束照射在衍射光栅上，衍射光栅通过在第一方向上的衍射将不同波长分裂成光谱，并且光谱的波长部分范围 分光束可以通过相机光学器件聚焦在检测器行上，并且评估电子器件连接到检测器行并且获取所生成的光谱作为信息并显示它。 本发明的特征在于，光束通过第一光学元件，然后将光谱分裂的光束的部分范围波动在衍射光栅的各个部分区域上，衍射光栅在所有部分区域具有相同的光栅常数，并且 改变轮廓形状，产生位于相应波长部分范围内的不同火焰波长的轮廓形状。