Invention Grant
- Patent Title: Interferometric spectral imaging of a two-dimensional array of samples using surface plasmon resonance
- Patent Title (中): 使用表面等离子体共振的二维样本阵列的干涉光谱成像
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Application No.: US12914622Application Date: 2010-10-28
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Publication No.: US08792102B2Publication Date: 2014-07-29
- Inventor: Abhijit Vishwas Patil , Sandip Maity , Veera Venkata Lakshmi Rajesh Langoju , Anusha Rammohan , Sameer Dinkar Vartak , Umakant Damodar Rapol
- Applicant: Abhijit Vishwas Patil , Sandip Maity , Veera Venkata Lakshmi Rajesh Langoju , Anusha Rammohan , Sameer Dinkar Vartak , Umakant Damodar Rapol
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Jenifer E. Haeckl
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01N21/47 ; G01N21/25 ; G01N21/45 ; B01L3/00 ; G01N21/03 ; G01N21/05 ; G01N21/55
Abstract:
A detection system for a two-dimensional (2D) array is provided. The detection system comprises an electromagnetic radiation source, a phase difference generator, a detection surface having a plurality of sample fields that can receive samples, and an imaging spectrometer configured to discriminate between two or more spatially separated points.
Public/Granted literature
- US20120105852A1 SYSTEMS AND METHODS FOR DETECTION AND IMAGING OF TWO-DIMENSIONAL SAMPLE ARRAYS Public/Granted day:2012-05-03
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