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公开(公告)号:CN101445709B
公开(公告)日:2011-09-28
申请号:CN200810178919.4
申请日:2008-11-27
Applicant: 第一毛织株式会社
IPC: C09J11/00 , C09J133/00 , C09J175/00 , C09J163/00 , C09J7/00
CPC classification number: H01L24/27 , C08L2666/14 , C09J7/20 , C09J133/062 , C09J163/00 , C09J2203/326 , C09J2433/00 , C09J2461/00 , C09J2463/00 , H01L21/6836 , H01L24/29 , H01L24/83 , H01L2221/68327 , H01L2224/274 , H01L2224/29 , H01L2224/2919 , H01L2224/2929 , H01L2224/29339 , H01L2224/29347 , H01L2224/29355 , H01L2224/29386 , H01L2224/29387 , H01L2224/29388 , H01L2224/29393 , H01L2224/83191 , H01L2224/8385 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01021 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01045 , H01L2924/01047 , H01L2924/01072 , H01L2924/01073 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/0665 , H01L2924/07802 , H01L2924/09701 , H01L2924/1461 , H01L2924/181 , Y10T428/2848 , H01L2924/0635 , H01L2924/066 , H01L2924/00 , H01L2924/3512 , H01L2924/00014 , H01L2924/05432 , H01L2924/0532 , H01L2924/05032 , H01L2924/05442 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供一种半导体组装芯片粘接用粘合剂组合物,以及采用该组合物制得的粘合膜,所述组合物包括一种双组分溶剂,其包括沸点为0~100℃的低沸点溶剂和另一种沸点为140~200℃的高沸点溶剂。本发明的溶剂残留量小于2%的粘合膜可在提高固化组分含量时同时满足膜的延展性结构和增强的抗张强度,从而在防止膜被切割的同时提高了硬度。由于产生间隙的挥发性组分具有高沸点,则半导体组装中由溶剂挥发而产生的间隙可得到显著降低。其结果是所述粘合膜显示出在粘合膜表面产生的间隙或空隙的体积膨胀降低,从而保证极好的膜可靠性。
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公开(公告)号:CN101445709A
公开(公告)日:2009-06-03
申请号:CN200810178919.4
申请日:2008-11-27
Applicant: 第一毛织株式会社
IPC: C09J11/00 , C09J133/00 , C09J175/00 , C09J163/00 , C09J7/00
CPC classification number: H01L24/27 , C08L2666/14 , C09J7/20 , C09J133/062 , C09J163/00 , C09J2203/326 , C09J2433/00 , C09J2461/00 , C09J2463/00 , H01L21/6836 , H01L24/29 , H01L24/83 , H01L2221/68327 , H01L2224/274 , H01L2224/29 , H01L2224/2919 , H01L2224/2929 , H01L2224/29339 , H01L2224/29347 , H01L2224/29355 , H01L2224/29386 , H01L2224/29387 , H01L2224/29388 , H01L2224/29393 , H01L2224/83191 , H01L2224/8385 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/01012 , H01L2924/01013 , H01L2924/01015 , H01L2924/01019 , H01L2924/0102 , H01L2924/01021 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01045 , H01L2924/01047 , H01L2924/01072 , H01L2924/01073 , H01L2924/01075 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01322 , H01L2924/0665 , H01L2924/07802 , H01L2924/09701 , H01L2924/1461 , H01L2924/181 , Y10T428/2848 , H01L2924/0635 , H01L2924/066 , H01L2924/00 , H01L2924/3512 , H01L2924/00014 , H01L2924/05432 , H01L2924/0532 , H01L2924/05032 , H01L2924/05442 , H01L2924/0503 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299
Abstract: 本发明提供一种半导体组装芯片粘接用粘合剂组合物,以及采用该组合物制得的粘合膜,所述组合物包括一种双组分溶剂,其包括沸点为0~100℃的低沸点溶剂和另一种沸点为140~200℃的高沸点溶剂。本发明的溶剂残留量小于2%的粘合膜可在提高固化组分含量时同时满足膜的延展性结构和增强的抗张强度,从而在防止膜被切割的同时提高了硬度。由于产生间隙的挥发性组分具有高沸点,则半导体组装中由溶剂挥发而产生的间隙可得到显著降低。其结果是所述粘合膜显示出在粘合膜表面产生的间隙或空隙的体积膨胀降低,从而保证极好的膜可靠性。
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