OUTPUT DRIVER HAVING HIGH VOLTAGE PROTECTION CIRCUIT

    公开(公告)号:US20240291475A1

    公开(公告)日:2024-08-29

    申请号:US18456529

    申请日:2023-08-28

    申请人: SK hynix Inc.

    发明人: Seung Ho LEE

    IPC分类号: H03K17/081

    CPC分类号: H03K17/08104

    摘要: An output driver includes a pull-up driving circuit coupled between a supply voltage terminal and an output pad, and configured to perform a pull-up operation on the output pad, a pull-down driving circuit coupled between the output pad and a ground terminal, and configured to perform a pull-down operation on the output pad, and a high voltage protection circuit including a resistor string and a transistor that are coupled in series between the output pad and the ground terminal.

    Semiconductor device
    3.
    发明授权

    公开(公告)号:US12074589B2

    公开(公告)日:2024-08-27

    申请号:US17939790

    申请日:2022-09-07

    发明人: Junichi Chisaka

    IPC分类号: H03K17/06 H03K17/081

    CPC分类号: H03K17/063 H03K17/08104

    摘要: According to one embodiment, a semiconductor device includes a first transistor, a first circuit, a second circuit, and a third circuit. The first transistor has one end connected to a power supply voltage terminal, the other end connected to a first node, and a gate connected to a first output terminal. The first circuit is configured to control a voltage of the first node based on a voltage of a ground voltage terminal. The second circuit is configured to control a voltage of the first output terminal based on the voltage of the ground voltage terminal and a voltage of an input terminal. The third circuit is configured to control switching between connection and disconnection between the ground voltage terminal and the first circuit.

    SWITCH DRIVING DEVICE
    4.
    发明公开

    公开(公告)号:US20240283439A1

    公开(公告)日:2024-08-22

    申请号:US18424266

    申请日:2024-01-26

    申请人: ROHM CO., LTD.

    IPC分类号: H03K17/081 H02M1/08 H03K17/06

    摘要: For example, the switching drive device 100 includes a driver 30 configured to drive an N-type semiconductor switch element, a current limiter 50 configured to limit a current fed to a boot capacitor BC1 included in a bootstrap circuit BTC, and a current controller 60 configured to control the operation of the current limiter 50. The current controller 60 is configured to drive the current limiter 50 to limit the current fed to the boot capacitor BC1 when the charge voltage across the boot capacitor BC1 is higher than a threshold value.

    Higher-Voltage-Protected Transmission Gate to Prevent Unbalanced Aging Stress on Differential Receiver Input

    公开(公告)号:US20240243740A1

    公开(公告)日:2024-07-18

    申请号:US18620740

    申请日:2024-03-28

    发明人: Chee Hong Aw

    IPC分类号: H03K17/081 H04B1/12

    CPC分类号: H03K17/08104 H04B1/12

    摘要: Integrated circuit devices, methods, and circuitry for selectively blocking a voltage signal on receiver circuitry to reduce or eliminate unequal aging on the receiver circuitry. A device may include a first input/output (IO) pin to receive a first voltage and a second IO pin to receive a second voltage. The device may include a differential signal receiver that includes a first terminal coupled to the first IO pin and a second terminal coupled to the second IO pin. Transmission gate circuitry may selectively block the first voltage or the second voltage from being applied to the differential signal receiver. The transmission gate circuitry may include transistors having a lower junction voltage limit than the first voltage or the second voltage, or both.

    Signal detection circuit
    9.
    发明授权

    公开(公告)号:US12034438B2

    公开(公告)日:2024-07-09

    申请号:US17747198

    申请日:2022-05-18

    申请人: DENSO CORPORATION

    摘要: A signal detection circuit includes: a voltage dividing circuit having at least a first pair of voltage dividing capacitors connected in series for dividing an input voltage and configured to output a divided voltage, and a detection circuit configured to detect the divided voltage. The first pair of voltage dividing capacitors are included in one semiconductor device. The semiconductor device includes: (i) a semiconductor substrate, (ii) a first conductor layer, (iii) a first dielectric layer, (iv) a second conductor layer, (v) a second dielectric layer, (vi) a third conductor layer, and (vii) a short-circuit portion configured to short-circuit the first conductor layer and the semiconductor substrate.

    High Side Current Detection Circuit, Overcurrent Protection Circuit, Calibration Method and Electronic Devices

    公开(公告)号:US20240213976A1

    公开(公告)日:2024-06-27

    申请号:US18372608

    申请日:2023-09-25

    发明人: Dongming Liu

    IPC分类号: H03K17/081 H03K17/687

    摘要: A calibration method includes obtaining an offset error of the overcurrent protection circuit by changing a current limiting state of the overcurrent protection circuit, adjusting an offset compensation circuit to calibrate the offset error of the overcurrent protection circuit and adjusting a gain calibration circuit based on the current limiting state of the overcurrent protection circuit to calibrate a gain error of the overcurrent protection circuit, wherein the overcurrent protection circuit comprises a first transistor, a second transistor, a third transistor, a first operational amplifier, a gain calibration circuit, an offset compensation circuit, and a driving circuit, and wherein the driving circuit is configured to receive a signal generated by the gain calibration circuit and generate a gate drive signal applied the first transistor and the third transistor.