Ion analysis device
    1.
    发明授权

    公开(公告)号:US12092608B2

    公开(公告)日:2024-09-17

    申请号:US17792170

    申请日:2020-03-12

    摘要: An ion analysis device 1 configured to generate and analyze product ions from precursor ions derived from a sample component includes: a reaction chamber 132 into which the precursor ions are introduced; a radical emitter 134 made of a predetermined kind of metal and disposed in the reaction chamber or a space communicating with the reaction chamber, at least a part of a surface of the radical emitter being oxidized or nitrided; a heating unit 20 configured to heat the radical emitter to a predetermined temperature; and separation detection units 135 and 136 configured to separate and detect, according to at least one of a mass-to-charge ratio and an ion mobility, product ions generated from the precursor ions by a reaction with radicals emitted from the radical emitter heated to the predetermined temperature.

    Size selected clusters and nanoparticles

    公开(公告)号:US12068147B2

    公开(公告)日:2024-08-20

    申请号:US17611292

    申请日:2020-05-15

    IPC分类号: H01J49/14 H01J49/00 H01J49/42

    摘要: Method for producing multiply-charged helium nanodroplets and charged dopant clusters and nanoparticles out of the helium nanodroplets, the method comprising: •producing neutral helium nanodroplets in a cold head (1) via expansion of a pressurized, pre-cooled, supersonic helium beam of high purity through a nozzle (3) into high vacuum with a base pressure under operation preferably below 20 mPa, •ionizing the helium nanodroplets by electron impact (15), wherein the electron impact (15) leads to multiply-charged helium nanodroplets, •doping the charged helium nanodroplets with dopant vapor in the pickup cell (19), wherein the doped nanodroplets form cluster ions with the initial charges acting as seeds, wherein the size of the nanoparticles can vary from a few atoms up to 105 atoms by arranging the size of the neutral helium nanodroplets, the charge of the helium nanodroplets and the density of dopant vapor in the pickup cell (19).

    ATMOSPHERIC PRESSURE IONIZATION COUPLED TO AN ELECTRON IONIZATION MASS SPECTROMETER

    公开(公告)号:US20240153753A1

    公开(公告)日:2024-05-09

    申请号:US18382570

    申请日:2023-10-23

    申请人: Inficon Inc.

    发明人: Nigel Sousou

    IPC分类号: H01J49/14 H01J49/00

    摘要: An atmospheric pressure electron impact ionization mass spectrometer system includes an atmospheric pressure ionization component operated at an atmospheric pressure. An electron impact ionization mass spectrometer includes an electron ionization source. An atmospheric pressure interface operates below about 10 Torr. The atmospheric pressure interface includes a source block to focus a plurality of molecules and ions from the atmospheric pressure ionization component at the atmospheric pressure into the electron ionization source which operates at a pressure below about 10−3 Torr.

    Ion analyzer
    10.
    发明授权

    公开(公告)号:US11735408B2

    公开(公告)日:2023-08-22

    申请号:US17424210

    申请日:2019-01-23

    IPC分类号: H01J49/14 H01J49/04

    CPC分类号: H01J49/14 H01J49/0422

    摘要: An ion analyzer that generates and analyzes product ions by irradiating precursor ions derived from a sample component with radicals, the ion analyzer including: a reaction chamber (2; 833) into which the precursor ions are introduced; a radical generation unit (5) configured to generate radicals from a first material gas; a metastable particle generation unit (5) configured to generate metastable particles from a second material gas; a radical introduction unit (5) configured to mix the radical and the metastable particles and introduce the mixture into the reaction chamber (2; 833); and an ion detection unit (4; 835) configured to detect product ions generated from the precursor ions by a reaction with the radicals.