公开(公告)号：US11379639B2

公开(公告)日：2022-07-05

申请号：US16229421

申请日：2018-12-21

申请人： KOH YOUNG TECHNOLOGY INC.

发明人： Duk Young Lee ,  Chan Woo Park ,  Tae Min Choi ,  Joanna Hong

IPC分类号： G06F30/27 ,  G06F30/398 ,  H05K3/00 ,  H05K13/08 ,  G01N21/956 ,  H05K3/12 ,  G06F30/337 ,  G06F30/3308 ,  G06F30/30 ,  G06F119/00 ,  G06F119/18

摘要： An apparatus, a recording medium, and a method for generating a control parameter of a screen printer are disclosed. The apparatus includes a memory that stores a simulation model configured to derive predictive inspection information on a printed state of solder paste based on a plurality of control parameters of the screen printer; a communication circuit configured to receive first inspection information on a plurality of solder pastes printed by the screen printer based on a first control parameter, and a processor electrically connected to the memory and the communication circuit. The processor obtains first predictive inspection information by applying the first control parameter to the simulation model, generates a plurality of candidate control parameters based on the first predictive inspection information, determines a plurality of second control parameters among the candidate control parameters, and transmits the plurality of second control parameters to the screen printer via the communication circuit.

公开(公告)号：US11378943B2

公开(公告)日：2022-07-05

申请号：US16496604

申请日：2018-03-26

申请人： MITSUBISHI HEAVY INDUSTRIES, LTD. ,  Mitsubishi Hitachi Power Systems, Ltd.

发明人： Shintaro Kumano ,  Makoto Kishi ,  Keisuke Yamamoto ,  Katsuhiko Abe

IPC分类号： G05B19/41 ,  G06F30/15 ,  G06F30/17 ,  G06F30/18 ,  G06F30/20 ,  G06F30/32 ,  G06F30/34 ,  G05B19/418 ,  G06F119/00

摘要： In an information processing device according to the present invention, a statistics estimation unit estimates a value of a state quantity by using a statistical model constructed based on values of past state quantities of a target device. A physical estimation unit estimates a value of a state quantity by using a physical model constructed based on design data of the target device. A specification unit specifies a value to be used to manage the target device from the value estimated by the statistics estimation unit and the value estimated by the physical estimation unit based on deterioration of the target device with time.