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    DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSPECTING INSULATED ELECTRICAL MACHINE COMPONENTS
    2.
    发明申请
    DISTRIBUTED SENSOR NETWORK FOR NONDESTRUCTIVELY MONITORING AND INSPECTING INSULATED ELECTRICAL MACHINE COMPONENTS 审中-公开

    公开(公告)号：US20170370857A1

    公开(公告)日：2017-12-28

    申请号：US15190347

    申请日：2016-06-23

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Ehsan DEHGHAN NIRI ,  Jeffrey Michael BREZNAK ,  Gene MURPHY

    IPC分类号： G01N23/00 ,  G01B15/00 ,  G01R31/12

    CPC分类号： G01N23/00 ,  G01B15/00 ,  G01N23/04 ,  G01N2223/40 ,  G01N2223/611 ,  G01N2223/632 ,  G01N2223/646 ,  G01R31/1218 ,  G01R31/1272

    摘要： An insulated electrical component of an insulated electrical machine includes a conducting element, a first radiographically-visible conductor sensor node coupled to the conducting element, at least one second radiographically-visible conductor sensor node coupled to the conducting element a first distance in a predetermined direction from the first radiographically-visible conductor sensor node, and an insulating material bonded to the conducting element. In some embodiments, the insulated electrical component further includes a first radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element and at least one second radiographically-visible insulator sensor node coupled to the insulating material and not coupled to the conducting element a second distance from the first radiographically-visible insulator sensor node. The radiographically-visible sensor nodes are distinguishable from the conducting element and the insulating material in a radiographic image. Methods of manufacturing and non-destructive testing of insulated electrical components are also disclosed.

    DETERIORATION ANALYZING METHOD
    4.
    发明申请
    DETERIORATION ANALYZING METHOD 有权
    检测分析方法

    公开(公告)号：US20140349407A1

    公开(公告)日：2014-11-27

    申请号：US14345419

    申请日：2012-11-02

    申请人： SUMITOMO RUBBER INDUSTRIES, LTD.

    发明人： Fusae Kaneko ,  Hiroyuki Kishimoto

    IPC分类号： G01N33/44 ,  G01N23/06

    CPC分类号： G01N33/445 ,  G01N23/085 ,  G01N23/185 ,  G01N23/2206 ,  G01N23/2273 ,  G01N2223/041 ,  G01N2223/071 ,  G01N2223/085 ,  G01N2223/203 ,  G01N2223/623 ,  G01N2223/627 ,  G01N2223/632 ,  G06F19/70

    摘要： The present invention provides a method of deterioration analysis that enables detailed analysis of the deterioration, especially of the surface, of a polymer material containing at least two diene polymers. The present invention relates to a method of deterioration analysis including: irradiating a polymer material containing at least two diene polymers with high intensity x-rays; and measuring x-ray absorption while varying the energy of the x-rays, to analyze the deterioration of each diene polymer.

    摘要翻译： 本发明提供一种劣化分析方法，其能够详细分析含有至少两种二烯聚合物的聚合物材料的劣化，特别是表面的劣化。 本发明涉及一种劣化分析方法，包括：用高强度X射线照射含有至少两种二烯聚合物的聚合物材料; 并且在改变X射线能量的同时测量x射线吸收，以分析每种二烯聚合物的劣化。

    SYSTEMS AND METHODS FOR MATERIALS ANALYSIS
    9.
    发明申请
    SYSTEMS AND METHODS FOR MATERIALS ANALYSIS 审中-公开
    材料分析系统与方法

    公开(公告)号：US20160209340A1

    公开(公告)日：2016-07-21

    申请号：US14600511

    申请日：2015-01-20

    申请人： United Technologies Corporation

    发明人： Iuliana Cernatescu ,  Vasisht Venkatesh ,  David Ulrich Furrer

    IPC分类号： G01N23/207 ,  G01N23/20

    CPC分类号： G01N23/207 ,  G01N23/20016 ,  G01N2223/605 ,  G01N2223/606 ,  G01N2223/632

    摘要： A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

    摘要翻译： 一种用于样品的X射线形貌分析的系统，包括组合的测角器，具有基座的测角器，与所述基座可旋转地相关联的管臂，与所述基座可旋转地相关联的检测器臂以及与所述基座可操作地相关联的样品台 。 该系统还包括与管臂可操作地耦合并且能够发射非准直的X射线的X射线源。 准直器与x射线源可操作地相关联，并将非准直的X射线束转换成具有准矩形形状的准直的X射线束，其在所有方向上的发散小于三度。 可操作地耦合到检测器臂的检测器。

    X-Ray diffraction apparatus
    10.
    发明授权
    X-Ray diffraction apparatus 失效
    X射线衍射装置

    公开(公告)号：US4426718A

    公开(公告)日：1984-01-17

    申请号：US296787

    申请日：1981-08-27

    申请人： Makoto Hayashi ,  Shinji Sakata ,  Tasuku Shimizu

    发明人： Makoto Hayashi ,  Shinji Sakata ,  Tasuku Shimizu

    IPC分类号： G01L1/00 ,  G01N23/207 ,  G01N23/20

    CPC分类号： G01N23/207 ,  G01N2223/632

    摘要： The X-ray diffraction apparatus of the invention includes means capable of detecting the position and intensity distribution of the diffracted X-ray with respect to a thin bundle X-ray and means for moving the former means to a position at which the former means is capable of detecting the diffracted X-ray, and makes it possible to reliably and easily carry out rough detection of the position of the diffracted X-ray and fine detection of the intensity distribution of the diffracted X-ray without increasing the size of the diffracted X-ray detecting means.

    摘要翻译： 本发明的X射线衍射装置包括能够检测衍射X射线相对于薄束X射线的位置和强度分布的装置，以及用于将前一装置移动到前一装置的位置的装置 能够检测衍射X射线，并且能够可靠且容易地进行衍射X射线位置的粗略检测，并且能够精细地检测衍射X射线的强度分布，而不增加衍射的X射线的尺寸 X射线检测装置。