公开(公告)号：US20240319121A1

公开(公告)日：2024-09-26

申请号：US18611741

申请日：2024-03-21

申请人： Rigaku Corporation

发明人： Yoshiyasu ITO

IPC分类号： G01N23/201 ,  G01N23/20025

CPC分类号： G01N23/201 ,  G01N23/20025 ,  G01N2223/041 ,  G01N2223/054

摘要： An analysis apparatus includes processing circuitry configured to store data of a scattering intensity measured by transmission of X-rays in one ω scan, perform coordinate conversion from the coordinate of the scattering vector to the coordinate of the tilt of the scattering body, with respect to a waveform based on the intensity of a specific diffraction point on the two-direction components, specify a peak position of the waveform of the intensity with respect to the coordinate of the tilt applied the coordinate conversion, and calculate a difference between the specified peak position and the peak position obtained on the assumption that the scattering body is not tilted from the direction perpendicular to the surface of the plate-shaped sample.

公开(公告)号：US20180145246A1

公开(公告)日：2018-05-24

申请号：US15812816

申请日：2017-11-14

申请人： SEIKO EPSON CORPORATION

发明人： Masayuki OMOTO ,  Toshiki HARA ,  Ichiro ASAOKA

IPC分类号： H01L41/187 ,  B41J2/14 ,  G01N23/06

CPC分类号： H01L41/1876 ,  B41J2/14233 ,  B41J2002/14241 ,  B41J2002/14419 ,  B41J2202/03 ,  G01N23/085 ,  G01N2223/041 ,  G01N2223/61

摘要： A method for evaluating a piezoelectric film containing a perovskite oxide containing a lead atom, a zirconium atom, and a titanium atom, and the method includes a process of irradiating the piezoelectric film with X-rays to acquire an extended X-ray absorption fine structure (EXAFS) spectrum at the L3 absorption edge of the lead atom, a process of Fourier-transforming the extended X-ray absorption fine structure (EXAFS) spectrum to acquire a radial distribution function, and a process of acquiring the intensity of a first peak having a distance from the lead atom of 1.4±0.2 Å, the intensity of a second peak having a distance from the lead atom of 2.0±0.2 Å, and the intensity of a third peak having a distance from the lead atom of 2.6±0.2 Å from the radial distribution function, and then evaluating the film quality of the piezoelectric film from a value obtained by dividing the intensity of the first peak by the intensity of the second peak and a value obtained by dividing the intensity of the first peak by the intensity of the third peak.

公开(公告)号：US11885755B2

公开(公告)日：2024-01-30

申请号：US18309021

申请日：2023-04-28

申请人： Sigray, Inc.

发明人： Wenbing Yun ,  Ruimin Qiao ,  Sylvia Jia Yun Lewis ,  Srivatsan Seshadri ,  Janos Kirz ,  Benjamin Donald Stripe

IPC分类号： G01N23/207 ,  G01N23/20008 ,  G01N23/085 ,  G01N23/2209

CPC分类号： G01N23/2076 ,  G01N23/085 ,  G01N23/20008 ,  G01N23/2209 ,  G01N2223/041 ,  G01N2223/0568 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/316 ,  G01N2223/32 ,  G01N2223/50 ,  G01N2223/652

摘要： An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

公开(公告)号：US20170336706A1

公开(公告)日：2017-11-23

申请号：US15590631

申请日：2017-05-09

申请人： LI-COR, INC.

发明人： HAN-WEI WANG

IPC分类号： G03B42/02 ,  A61B6/00 ,  G01N23/223 ,  G01N23/04

CPC分类号： G03B42/026 ,  A61B5/0071 ,  A61B6/032 ,  A61B6/035 ,  A61B6/4417 ,  A61B6/466 ,  A61B6/486 ,  A61B6/5205 ,  A61B6/5247 ,  A61B6/545 ,  A61B6/547 ,  G01N23/046 ,  G01N23/223 ,  G01N33/4833 ,  G01N2223/04 ,  G01N2223/041 ,  G01N2223/071 ,  G01N2223/309 ,  G01N2223/3306 ,  G01N2223/612 ,  G01N2223/6126 ,  G03B42/02

摘要： Methods and devices are disclosed for the tomographic imaging of a biological sample from almost all rotational perspectives in three-dimensional space and with multiple imaging modalities. A biological sample is positioned on an imaging stage that is capable of nearly full 360-degree rotation in at least one of two substantially orthogonal axes. Positioned about the stage is an X-ray imaging module enabling the recording of a series of images. A reflected light imaging module can also be positioned about the stage to enable recording of black and white or color white light images. A computer can use the images to construct three-dimensional models of the sample and to render images of the sample conveying information from one or more imaging channels.

公开(公告)号：US20140349407A1

公开(公告)日：2014-11-27

申请号：US14345419

申请日：2012-11-02

申请人： SUMITOMO RUBBER INDUSTRIES, LTD.

发明人： Fusae Kaneko ,  Hiroyuki Kishimoto

IPC分类号： G01N33/44 ,  G01N23/06

CPC分类号： G01N33/445 ,  G01N23/085 ,  G01N23/185 ,  G01N23/2206 ,  G01N23/2273 ,  G01N2223/041 ,  G01N2223/071 ,  G01N2223/085 ,  G01N2223/203 ,  G01N2223/623 ,  G01N2223/627 ,  G01N2223/632 ,  G06F19/70

摘要： The present invention provides a method of deterioration analysis that enables detailed analysis of the deterioration, especially of the surface, of a polymer material containing at least two diene polymers. The present invention relates to a method of deterioration analysis including: irradiating a polymer material containing at least two diene polymers with high intensity x-rays; and measuring x-ray absorption while varying the energy of the x-rays, to analyze the deterioration of each diene polymer.

摘要翻译： 本发明提供一种劣化分析方法，其能够详细分析含有至少两种二烯聚合物的聚合物材料的劣化，特别是表面的劣化。 本发明涉及一种劣化分析方法，包括：用高强度X射线照射含有至少两种二烯聚合物的聚合物材料; 并且在改变X射线能量的同时测量x射线吸收，以分析每种二烯聚合物的劣化。

公开(公告)号：US20240280515A1

公开(公告)日：2024-08-22

申请号：US18439625

申请日：2024-02-12

申请人： Sigray, Inc.

发明人： Wenbing Yun ,  Janos Kirz

IPC分类号： G01N23/20008 ,  G01N23/085 ,  G01N23/20091 ,  G01N23/207

CPC分类号： G01N23/20008 ,  G01N23/085 ,  G01N23/20091 ,  G01N23/2076 ,  G01N23/2209 ,  G21K1/06 ,  G21K1/062 ,  G01N2223/041 ,  G01N2223/0563 ,  G01N2223/0568 ,  G01N2223/076 ,  G01N2223/1016 ,  G01N2223/315

摘要： An apparatus includes a plurality of stacked flat Bragg diffractors having at least a first flat Bragg diffractor and a second flat Bragg diffractor. The first and second flat Bragg diffractors are positioned sequentially along an x-ray propagation axis of an x-ray beam. The x-ray beam includes x-rays and has an angular beam divergence less than 30 mrad in at least one direction.

公开(公告)号：US09851342B2

公开(公告)日：2017-12-26

申请号：US14345419

申请日：2012-11-02

申请人： SUMITOMO RUBBER INDUSTRIES, LTD.

发明人： Fusae Kaneko ,  Hiroyuki Kishimoto

IPC分类号： G01N33/44 ,  G01N23/06 ,  G01N23/22 ,  G01N23/227 ,  G06F19/00

CPC分类号： G01N33/445 ,  G01N23/085 ,  G01N23/185 ,  G01N23/2206 ,  G01N23/2273 ,  G01N2223/041 ,  G01N2223/071 ,  G01N2223/085 ,  G01N2223/203 ,  G01N2223/623 ,  G01N2223/627 ,  G01N2223/632 ,  G06F19/70

摘要： The present invention provides a method of deterioration analysis that enables detailed analysis of the deterioration, especially of the surface, of a polymer material containing at least two diene polymers. The present invention relates to a method of deterioration analysis including: irradiating a polymer material containing at least two diene polymers with high intensity x-rays; and measuring x-ray absorption while varying the energy of the x-rays, to analyze the deterioration of each diene polymer.

公开(公告)号：US4637041A

公开(公告)日：1987-01-13

申请号：US588280

申请日：1984-03-12

申请人： Peter Brinkgreve ,  Diederik C. Koningsberger

发明人： Peter Brinkgreve ,  Diederik C. Koningsberger

IPC分类号： G01N23/223 ,  G01N23/20 ,  G01N23/207 ,  G21K1/06

CPC分类号： G01N23/207 ,  G01N23/20008 ,  G01N2223/041 ,  G01N2223/32

摘要： In an X-ray analysis apparatus, a moving mechanism is provided by a main guide member along which a main slide device can be displaced. Rotatably connected with the main slide device is a detector guide member along which a detection slide device is displaced. The main slide device, as well as the detection slide device, and an axis of rotation relative to an end of the main guide member are connected to a common central axis by respective arms which can be mutually rotated with them. The main slide device and the detection slide device can each be equipped with a drive motor where the motor for the main slide device is preferably driven first, and the motor for the detector slide device is driven by signals derived from displacing the main slide device. The rotatable arms ensure an optimum orientation of a crystal holder incorporated onto the main slide device, and a detection holder incorporated onto the detector slide device with respect to each other and with respect to a point of focus of an X-ray source.

摘要翻译： 在X射线分析装置中，移动机构由能够移动主滑动装置的主导向构件设置。 与主滑动装置可旋转地连接的是检测器引导构件，检测滑动装置沿着检测器引导构件移位。 主滑动装置以及检测滑动装置和相对于主引导构件的端部的旋转轴线通过可以与它们相互旋转的相应臂连接到共同的中心轴线。 主滑动装置和检测滑动装置各自可以配备有驱动马达，其中主滑动装置的马达优选地被首先驱动，并且用于检测器滑动装置的马达由通过移动主滑动装置的信号驱动。 旋转臂确保结合到主滑动装置上的晶体保持器的最佳取向以及相对于X射线源相对于彼此并且相对于X射线源的焦点结合到检测器滑动装置上的检测支架。