知搜-全球专利检索

  1. 登录
  2. 注册

搜索结果

8 条记录 (耗时 0.009 秒)

    METHOD FOR RADIOGRAPHIC INSPECTION OF COMPONENTS
    1.
    发明申请
    METHOD FOR RADIOGRAPHIC INSPECTION OF COMPONENTS 审中-公开
    组件的放射检查方法

    公开(公告)号：US20120033787A1

    公开(公告)日：2012-02-09

    申请号：US13204244

    申请日：2011-08-05

    申请人： Karl SCHREIBER ,  Josef GEITNER

    发明人： Karl SCHREIBER ,  Josef GEITNER

    IPC分类号： G01N23/18

    CPC分类号： G01N23/04 ,  G01N2223/1016 ,  G01N2223/409 ,  G01N2223/415 ,  G01N2223/646

    摘要： During the radiographic inspection of components by X-rays for better detection of defects, preferably automated, an uneven surface topography (2) of the component (1) is covered with a smoothening layer (8) made of a material whose volume-specific radiation absorption corresponds to that of the component material, so that a decrease of radiation absorption or an increase in radiation intensity due to the uneven surface topography is reduced to accentuate a radiation effect caused by internal material defects.

    摘要翻译： 在用于更好地检测缺陷（优选自动化）的X射线成像检查期间，组件（1）的不平坦的表面形貌（2）被由其体积特异性辐射的材料制成的平滑层（8）覆盖， 吸收对应于组分材料的吸收，从而降低由于表面形貌不均匀引起的辐射吸收或辐射强度的增加，从而强化由内部材料缺陷引起的辐射效应。

    Non-destructive testing by stimulated electron emission capture
    3.
    发明授权
    Non-destructive testing by stimulated electron emission capture 失效
    通过受激电子发射捕获的非破坏性测试

    公开(公告)号：US4634868A

    公开(公告)日：1987-01-06

    申请号：US682642

    申请日：1984-12-17

    申请人： Thomas J. DeLacy

    发明人： Thomas J. DeLacy

    IPC分类号： G01N23/22 ,  G01N23/04

    CPC分类号： G01N23/22 ,  G01N2223/03 ,  G01N2223/102 ,  G01N2223/204 ,  G01N2223/303 ,  G01N2223/415 ,  G01N2223/633

    摘要： Non-invasive and non-destructive apparatus and method for imaging, recording, and comparing the mass density distributions and thicknesses of test specimens (19F, 19B). A source of medium-to-high-energy photons (3) directs a photon beam (4) at an electron source (17) comprised of high atomic number material, which emits in response thereto electrons (9F, 9B), some of which are not absorbed and not widely scattered by the test specimens (19F, 19B), but are transmitted therethrough and captured on one or more photographic films (15F, 15B) in contact with said specimens (19F, 19B). Net recorded film (15F, 15B) densities are in inverse relation to the mass density distribution of the corresponding test specimen (19F, 19B). A filter (5) is interposed between the photon source (3) and the capture film (15B) when back emission imaging (B) is employed. The filter (5) is optional when forward emission imaging (F) is used. The filter (5) absorbs photons (4) that have an energy sufficiently low to create an unwanted X-ray response on the capture film (15F, 15B) within the period required for the desired electron (9F, 9B) imaging.

    摘要翻译： 用于成像，记录和比较试样（19F，19B）的质量密度分布和厚度的非侵入性和非破坏性装置和方法。 中高能量光子的源（3）在由高原子序数材料组成的电子源（17）处引导光子束（4），其响应于电子（9F，9B）发射，其中一些 不被测试样品（19F，19B）吸收并且不被广泛分散，而是被透过并被捕获在与所述样品（19F，19B）接触的一个或多个照相胶片（15F，15B）上。 净记录膜（15F，15B）的密度与相应的试样（19F，19B）的质量密度分布成反比。 当使用反向发射成像（B）时，滤光器（5）插入在光子源（3）和捕获膜（15B）之间。 当使用前向发射成像（F）时，过滤器（5）是可选的。 过滤器（5）吸收具有足够低的能量的光子（4），以在期望的电子（9F，9B）成像所需的时间段内在捕获膜（15F，15B）上产生不期望的X射线响应。

    Device for the display of local disorientations in single crystals
    4.
    发明授权
    Device for the display of local disorientations in single crystals 失效
    在单晶中显示当地分辨率的装置

    公开(公告)号：US3855469A

    公开(公告)日：1974-12-17

    申请号：US39243973

    申请日：1973-08-29

    申请人： COMMISSARIAT ENERGIE ATOMIQUE

    发明人： PLUCHERY M ,  ROUGHON C

    IPC分类号： G01N23/20 ,  G01N23/205 ,  G01N23/22

    CPC分类号： G01N23/205 ,  G01N23/20008 ,  G01N2223/056 ,  G01N2223/1016 ,  G01N2223/309 ,  G01N2223/316 ,  G01N2223/32 ,  G01N2223/3306 ,  G01N2223/3308 ,  G01N2223/415 ,  G01N2223/604

    摘要： The device comprises a monochromatic X-radiation source from which a beam of incident X-rays is directed onto a single crystal, a system for detecting the intensity of the diffracted emergent beam by means of a stationary screen with a selecting slit, a movable screen having a variable-aperture analyzing slit and a moving photographic film, the X-ray source being ''''seen'''' from the single crystal at a substantial solid angle of the same order of magnitude as the disorientations to be recorded on the film. The single crystal is displaced by means of a goniometer mounted on a carriage which is driven in translational motion substantially at right angles to the direction of the incident Xray beam. Single-crystal samples several centimeters in thickness and of widely varying chemical composition can be analyzed by means of the device without any attendant danger of destruction.

    摘要翻译： 该装置包括一个单色X射线源，一束入射的X射线被引导到一个单一的晶体上，一个系统用于通过一个带选择狭缝的固定屏幕来检测衍射出射光束的强度，一个可移动的屏幕 具有可变孔径分析狭缝和移动摄影胶片，所述X射线源以与要记录在胶片上的定向方向相同数量级的实质立体角从单晶体“看到”。