摘要:
Machine vision inspection devices and machine vision methods for inspecting objects, such as objects with shiny surfaces. Device embodiments include an illumination housing with a central aperture and a specialized aperture cover. Use of the claimed device embodiments to inspect objects eliminates the void (dark spot) common to known machine vision inspection methods.
摘要:
Described herein are various technologies pertaining to an automated light field illumination container inspection. The container inspection system includes a plurality of cameras that capture images of a container when the container is illuminated by way of light field illumination. Bands in images that include reflections in the exterior surface of the sidewall are identified, and a determination is made as to whether the container is defective based upon the identified bands.
摘要:
Machine vision inspection systems and methods for inspecting objects, such as objects with shiny surfaces, as well as illuminators with aperture covers for use therewith. Use of such an aperture cover eliminates the void (dark spot) in the illumination field that inherently results from the presence of an aperture through which an associated camera views an object to be inspected.
摘要:
In a substrate processing apparatus according to the invention, a light source and an imager are arranged at a position distant from an object to be imaged such as a substrate, whereas a head unit is arranged at an imaging position. Diffused light is generated by diffusing and reflecting illumination light from the light source and illuminated a peripheral edge part of the object to be imaged. Further, reflected light from the peripheral edge part illuminated with the diffused light is guided to the imager, whereby the peripheral edge part is imaged by the imager.
摘要:
This invention relates to an article inspection system having one or more endless article conveyors configured to convey articles along one or more conveying paths. One or more light sources and one or more light diffusers are provided, wherein each light diffuser is positioned substantially at or below the level of the articles when conveyed along the conveying paths so as to illuminate, using light from the one or more light sources, at least side portions of the articles with substantially diffuse light when the articles are conveyed along the conveying path(s). At least one camera is positioned to image articles which are conveyed along the conveying paths.
摘要:
An inspection apparatus is capable of inspecting a light-emitting diode (LED). The inspection apparatus includes a reflecting cover, a base plate, a light-collecting unit and at least one inspection light source. An enclosed space is defined by the base plate and the reflecting cover having an opening. The LED is disposed on the base plate and located in the enclosed space. The light-collecting unit is disposed above the LED and in the enclosed space. A vertical distance from the light-collecting unit to the LED is H, a width of the opening of the reflecting cover is W, and H/W=0.05 to 10. The inspection light source is in the enclosed space. An inspection light emitted from the inspection light source is reflected by the reflecting cover and then emitted into the LED.A dominant wavelength of the inspection light source is smaller than that of the LED.
摘要:
Machine vision inspection devices and machine vision methods for inspecting objects, such as objects with shiny surfaces. Device embodiments include an illumination housing with a central aperture and a specialized aperture cover. Use of the claimed device embodiments to inspect objects eliminates the void (dark spot) common to known machine vision inspection methods.
摘要:
Machine vision inspection systems and methods for inspecting objects, such as objects with shiny surfaces, as well as illuminators with aperture covers for use therewith. Use of such an aperture cover eliminates the void (dark spot) in the illumination field that inherently results from the presence of an aperture through which an associated camera views an object to be inspected.
摘要:
An illumination apparatus which illuminates a surface of an object having a three-dimensional shape includes a light source, a guide configured to guide light from the light source to a surface of the object, and a diffuser which has a diffusion-reflection surface that faces a light exit surface of the guide via the object, wherein the diffuser is arranged at such a position that the light which is emitted from the guide and is not directly incident on the object is incident on the diffusion-reflection surface while a part of the light reflected and diffused by the diffusion-reflection surface is incident on a surface of the object.
摘要:
An illumination apparatus which illuminates a surface of an object having a three-dimensional shape includes a light source, a guide configured to guide light from the light source to a surface of the object, and a diffuser which has a diffusion-reflection surface that faces a light exit surface of the guide via the object, wherein the diffuser is arranged at such a position that the light which is emitted from the guide and is not directly incident on the object is incident on the diffusion-reflection surface while a part of the light reflected and diffused by the diffusion-reflection surface is incident on a surface of the object.