公开(公告)号：US20240087327A1

公开(公告)日：2024-03-14

申请号：US18516157

申请日：2023-11-21

申请人： EMBEDTEK, LLC

发明人： Kent Tabor

IPC分类号： G06V20/52 ,  G01J5/00 ,  G01J5/60 ,  G06T7/00 ,  H04N5/33

CPC分类号： G06V20/52 ,  G01J5/0025 ,  G01J5/60 ,  G06T7/00 ,  H04N5/33 ,  G01J2005/0077 ,  G01J5/48

摘要： An object detection and tracking system includes a visual image system, a thermal image system, a location mapping system, and a processing unit in communication with or part of one or more of the visual, thermal, and location mapping systems. The visual image system includes one or more optical sensors positioned relative to an area to capture a visual image. The thermal image system includes one or more infrared sensors positioned relative to the area to capture a thermal image concurrently with capture of the visual image to cooperatively identify an object in the area. The location mapping system is positioned relative to the area to determine a location of the object in the area. The processing unit overlays the visual image, the thermal image, and the determined location of the object in the area to identify the object, locate the object, and track the object within the area.

公开(公告)号：US20230160636A1

公开(公告)日：2023-05-25

申请号：US18147622

申请日：2022-12-28

申请人： Quantum IR Technologies, LLC

发明人： Mark Israelsen

IPC分类号： F27D21/00 ,  G01B11/02 ,  H04N23/23 ,  G01J5/00 ,  G01J5/60 ,  G06T17/00 ,  G06V10/75

CPC分类号： F27D21/00 ,  G01B11/022 ,  H04N23/23 ,  G01J5/0066 ,  G01J5/60 ,  G06T17/00 ,  G06V10/751 ,  G01J2005/0077

摘要： A system for monitoring brick in a rotary kiln includes an infrared sensor and a computing system configured to: obtain a digital model of a brick layer of a rotary kiln having a plurality of bricks, wherein the digital model of the brick layer is based on a measured brick thickness correlated with a measured infrared temperature for each brick; obtain infrared data of the rotary kiln with the at least one infrared imaging sensor; determine the measured infrared temperature for each brick; determine a brick thickness of a first brick in the brick layer of the rotary kiln based on the measured infrared temperature assigned to the first brick with the digital model of the brick layer; and provide the brick thickness of the first brick in a brick thickness report.

公开(公告)号：US20180156665A1

公开(公告)日：2018-06-07

申请号：US15329020

申请日：2015-08-27

申请人： ZEUS CO., LTD.

发明人： Kwang Il JUNG ,  Byeong Su LEE ,  Joo Hyung RYU

IPC分类号： G01J5/00 ,  G01J5/08 ,  G01J5/52 ,  G01J5/60 ,  H01L21/66 ,  H01L21/302 ,  H01L21/67

CPC分类号： G01J5/0007 ,  B08B7/0035 ,  G01J5/0846 ,  G01J5/522 ,  G01J5/60 ,  H01L21/302 ,  H01L21/67051 ,  H01L21/67063 ,  H01L21/6708 ,  H01L21/67098 ,  H01L21/67115 ,  H01L21/6715 ,  H01L21/67248 ,  H01L22/12

摘要： Disclosed are a substrate processing apparatus and a substrate processing method. The substrate processing apparatus includes an emissivity setting unit to which emissivity at a liquid chemical which is brought into contact with a substrate or emissivity at an interface at which the substrate and the liquid chemical are in contact with each other is input, a radiant energy input unit to which radiant energy radiating from the liquid chemical or the interface is input, and a calculation unit that calculates a calculation temperature of the liquid chemical or the interface based on the emissivity and the radiant energy.

公开(公告)号：US20180066989A1

公开(公告)日：2018-03-08

申请号：US15806612

申请日：2017-11-08

申请人： The Government of the United States of America, as represented by the Secretary of the Navy

发明人： Robert Furstenberg ,  Chris Kendziora ,  R. Andrew McGill ,  Viet K. Nguyen

IPC分类号： G01J3/28 ,  G01J3/02 ,  G01J3/443

CPC分类号： G01J3/2823 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/443 ,  G01J3/45 ,  G01J5/60 ,  G01J2003/2826 ,  G01N21/171 ,  G01N21/3563 ,  G01N21/41 ,  G01N21/45 ,  G01N2021/1714 ,  G01N2021/1725 ,  G01N2021/1731 ,  G01N2021/393 ,  G02B21/0028 ,  G02B21/008

摘要： A non-destructive method for chemical imaging with ˜1 nm to 10 μm spatial resolution (depending on the type of heat source) without sample preparation and in a non-contact manner. In one embodiment, a sample undergoes photo-thermal heating using an IR laser and the resulting increase in thermal emissions is measured with either an IR detector or a laser probe having a visible laser reflected from the sample. In another embodiment, the infrared laser is replaced with a focused electron or ion source while the thermal emission is collected in the same manner as with the infrared heating. The achievable spatial resolution of this embodiment is in the 1-50 nm range.

公开(公告)号：US20180031425A1

公开(公告)日：2018-02-01

申请号：US15609425

申请日：2017-05-31

申请人： FUJITSU LIMITED

发明人： Hironori Nishino ,  Yasuo MATSUMIYA

IPC分类号： G01J5/00

CPC分类号： G01J5/0003 ,  G01J5/60 ,  G01J2005/0081

摘要： A heat source detection device includes a processor configured to calculate, as a single-wavelength temperature, one of a first temperature obtained by converting a first output output from the infrared sensor in accordance with an incident amount of infrared rays in a first infrared wavelength band into a temperature, a second temperature obtained by converting a second output output from the infrared sensor in accordance with an incident amount of infrared rays in a second infrared wavelength band into a temperature and an average value of the first and second temperatures, and calculate a dual-wavelength temperature obtained by converting the ratio between the first and second outputs into a temperature; and to determine a temperature of the heat source based on the dual-wavelength temperature and determine a distance to the heat source from the infrared sensor based on a comparison result between the single-wavelength temperature and dual-wavelength temperature.

公开(公告)号：US09787913B1

公开(公告)日：2017-10-10

申请号：US14727383

申请日：2015-06-01

申请人： Ajay M. Koshti

发明人： Ajay M. Koshti

IPC分类号： H04N5/33 ,  H04N5/32 ,  H04N3/09 ,  G01B11/02 ,  G01J5/00 ,  G01J5/60 ,  G01N25/18 ,  B41M5/26

CPC分类号： H04N5/33 ,  B41M5/26 ,  G01B11/022 ,  G01J5/0003 ,  G01J5/0066 ,  G01J5/60 ,  G01J2005/0077 ,  G01N25/18 ,  G01N25/72 ,  H04N3/09 ,  H04N5/32

摘要： Methods and systems for converting an image contrast evolution of an object to a temperature contrast evolution and vice versa are disclosed, including methods for assessing an emissivity of the object; calculating an afterglow heat flux evolution; calculating a measurement region of interest temperature change; calculating a reference region of interest temperature change; calculating a reflection temperature change; calculating the image contrast evolution or the temperature contrast evolution; and converting the image contrast evolution to the temperature contrast evolution or vice versa, respectively.

公开(公告)号：US20170023411A1

公开(公告)日：2017-01-26

申请号：US15124475

申请日：2015-02-25

申请人： MITSUBISHI MATERIALS CORPORATION ,  UBE INDUSTRIES, LTD. ,  SUMITOMO OSAKA CEMENT CO., LTD. ,  TAIHEIYO CEMENT CORPORATION

发明人： Hirokazu SHIMA ,  Yoshiaki TAKATA

IPC分类号： G01J5/00 ,  F27B7/20 ,  F27B7/42 ,  G01J5/60

CPC分类号： G01J5/0003 ,  F27B7/20 ,  F27B7/42 ,  F27D2019/0012 ,  F27D2019/0015 ,  G01J5/0044 ,  G01J5/061 ,  G01J5/0846 ,  G01J5/60 ,  G01J2005/0048 ,  G01J2005/607

摘要： A first radiance meter that is provided so as to face an object in an atmosphere in which there is dust and measures the radiance of the object and a second radiance meter that is provided so as not to oppose the object and measures the radiance of the dust between the object and the first radiance meter are used to measure the temperature of the object on the basis of the object radiance that has been measured by the first radiance meter and the radiance of the dust between the object and the first radiance meter that has been measured by the second radiance meter.

摘要翻译： 第一辐射度计，其设置成面对有灰尘的气氛中的物体并测量物体的辐射度;以及第二辐射计，其设置为不与物体相对并且测量灰尘的辐射度 物体和第一辐射度计之间的物体用于根据由第一辐射度计测量的物体辐射和物体与第一辐射度计之间的灰尘的辐射度来测量物体的温度 由第二辐射计测量。

公开(公告)号：US09525857B2

公开(公告)日：2016-12-20

申请号：US14839284

申请日：2015-08-28

申请人： FUJI XEROX CO., LTD.

发明人： Chizuru Ohsawa ,  Toshihiro Iwafuchi ,  Noriko Sakai

IPC分类号： H04N17/00 ,  H04N9/73

CPC分类号： H04N9/735 ,  G01J3/506 ,  G01J5/60

摘要： A color processing device includes the following elements. An image data obtaining unit obtains image data which is obtained by imaging a white member illuminated by a light source and a display device on which a white image is displayed. A color component extracting unit extracts color components of red, green, and blue from image data concerning the white member and image data concerning the white image. A relation determining unit determines a relation between a color temperature and/or a brightness level of the light source and a color temperature and/or a brightness level of the white image, on the basis of a magnitude relation of the extracted color components.

摘要翻译： 颜色处理装置包括以下元件。 图像数据获取单元获得通过对由光源照亮的白色构件和显示白色图像的显示装置进行成像而获得的图像数据。 颜色分量提取单元从关于白色成员的图像数据和关于白色图像的图像数据中提取红色，绿色和蓝色的颜色分量。 关系确定单元基于所提取的颜色分量的大小关系来确定光源的色温和/或亮度水平与白色图像的色温和/或亮度水平之间的关系。

公开(公告)号：US09467672B2

公开(公告)日：2016-10-11

申请号：US14790652

申请日：2015-07-02

申请人： CANON KABUSHIKI KAISHA

发明人： Hiroaki Kuchiki

IPC分类号： H04N9/73 ,  H04N5/235 ,  H04N1/60

CPC分类号： H04N9/735 ,  G01J5/60 ,  H04N1/6077 ,  H04N5/2354 ,  H04N9/045

摘要： An image processing device capable of stably performing white balance control. A first WB correction value is calculated according to an infrared light amount obtained from a first image. A second WB correction value different from the first one is calculated according to white pixels obtained from the first image. A third WB correction value is calculated based on the first and second WB correction values. White balance processing is performed on the first image using the third WB correction value, which is stored as a reference WB correction value. When the infrared light amount not smaller than a predetermined amount is obtained from the second image and also the number of obtained white pixels is smaller than a predetermined number, white balance processing is performed on the second image using the stored reference WB correction value.

摘要翻译： 一种能够稳定地执行白平衡控制的图像处理装置。 根据从第一图像获得的红外光量计算第一WB校正值。 根据从第一图像获得的白色像素计算与第一WB校正值不同的第二WB校正值。 基于第一和第二WB校正值计算第三WB校正值。 使用作为参考WB校正值存储的第三WB校正值对第一图像执行白平衡处理。 当从第二图像获得不小于预定量的红外光量并且所获得的白色像素的数量小于预定数量时，使用存储的参考WB校正值对第二图像执行白平衡处理。

公开(公告)号：US09322716B2

公开(公告)日：2016-04-26

申请号：US14576191

申请日：2014-12-18

申请人： Panasonic Intellectual Property Corporation of America

发明人： Koichi Kusukame ,  Tatsuo Itoh ,  Kazuki Funase

IPC分类号： G01J5/20 ,  G01J5/60 ,  G01N21/35 ,  G01N21/3554

CPC分类号： G01J5/60 ,  G01J2005/607 ,  G01N21/35 ,  G01N21/3554

摘要： A component measuring apparatus includes a plurality of light sources having different Wavelengths. The component measuring apparatus also includes an irradiation unit that applies lights emitted from the plural light sources to a measurement object, and a light receiving unit that receives at least one of light having transmitted through the measurement object and light having been scattered from the measurement object. The component measuring apparatus further includes a measuring unit that measures intensity of the light received by the light receiving unit per wavelength.

摘要翻译： 元件测量装置包括具有不同波长的多个光源。 部件测量装置还包括将从多个光源发射的光施加到测量对象的照射单元，以及光接收单元，其接收透射通过测量对象的光和从测量对象散射的光中的至少一个 。 部件测量装置还包括测量单元，其测量由每个波长的光接收单元接收的光的强度。