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    Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object
    3.
    发明申请
    Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object 有权
    用于确定物体的发射率，面积和温度的方法和装置

    公开(公告)号：US20100256945A1

    公开(公告)日：2010-10-07

    申请号：US11951698

    申请日：2007-12-06

    Applicant: Ronald N. Murata

    Inventor： Ronald N. Murata

    IPC: G06F15/00 ,  G01J5/00 ,  G06F17/18

    CPC classification number: G01J5/602 ,  G01J5/0003 ,  G01J2005/0048 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01J2005/0081 ,  G01J2005/0092

    Abstract: Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.

    Abstract translation: 提供方法和装置来确定物体的发射率，温度和面积。 方法和装置被设计成使得物体的发射率和面积可以单独地确定为取决于从三个或更多个带状红外测量传感器导出的物体的温度的函数。 因此，方法和装置可以仅需要物体的温度的回归分析，而不对物体的发射率和面积进行任何回归分析。

    Emissivity distribution measuring method and apparatus
    4.
    发明申请
    Emissivity distribution measuring method and apparatus 审中-公开
    发射率分布测量方法和装置

    公开(公告)号：US20040008753A1

    公开(公告)日：2004-01-15

    申请号：US10613072

    申请日：2003-07-07

    Applicant: NORITAKE CO., LIMITED ,  Kuniyuki Kitagawa

    Inventor： Miyuki Hashimoto ,  Kenji Yano ,  Misao Iwata ,  Kuniyuki Kitagawa

    IPC: G01K003/00

    CPC classification number: G01J5/602 ,  G01J5/0003 ,  G01J2005/0074

    Abstract: Method and apparatus for measuring a distribution of emissivity on a surface of an object body, on the basis of a light emitted from the surface of the object body, wherein a temperature of the object body at each picture element of its image is calculated on the basis of a radiant intensity ratio at each pair of corresponding picture elements of a first image and a second image which are obtained with respective two radiations of respective first and second wavelengths selected from the light emitted from the surface of the object body, to measure a distribution of the temperature on the surface of the object body, and an emissivity value at each picture element of the image of the object body is calculated on the basis of the measured distribution of the temperature, and according to a predetermined relationship between the temperature and the emissivity value.

    Abstract translation: 基于从物体的表面发射的光来测量物体表面上的发射率分布的方法和装置，其中在其物体的每个像素处的物体的温度在 在从对象体的表面发射的光中选出的各自的第一和第二波长的相应的两个辐射获得的第一图像和第二图像的每对相应图像元素的辐射强度比的基础，以测量 基于测量的温度分布来计算物体表面上的温度分布和物体的图像的每个像素的发射率值，并且根据温度和 发射率值。

    Non-contact temperature measurement of a film growing on a substrate
    5.
    发明授权
    Non-contact temperature measurement of a film growing on a substrate 失效
    在基板上生长的膜的非接触式温度测量

    公开(公告)号：US5377126A

    公开(公告)日：1994-12-27

    申请号：US759427

    申请日：1991-09-13

    Applicant: Markus I. Flik ,  Alfredo Anderson ,  Byungin Choi

    Inventor： Markus I. Flik ,  Alfredo Anderson ,  Byungin Choi

    IPC: G01J5/00

    CPC classification number: G01J5/0003 ,  G01J5/0007 ,  G01J5/522 ,  G01J2005/0051 ,  G01J2005/0074 ,  Y10S505/829 ,  Y10S505/842

    Abstract: Apparatus and method for non-contact temperature measurement of a film growing on a substrate which accounts for the change in emissivity due to the change in film thickness. The system employs an adaptively calibrated pyrometer wherein the substrate emittance is continuously computed so that the temperature measurement is accurate regardless of the emittance variation. The new system is easily constructed by adding data processing system software and hardware to conventional pyrometers.

    Abstract translation: 用于在基板上生长的膜的非接触式温度测量的装置和方法，其考虑了由于膜厚度的变化引起的发射率的变化。 该系统采用自适应校准的高温计，其中连续地计算衬底发射率，使得温度测量是准确的，而与发射率变化无关。 通过将数据处理系统软件和硬件添加到常规高温计中，可以轻松构建新系统。

    Reflectance probe
    6.
    发明授权
    Reflectance probe 失效
    反射探头

    公开(公告)号：US5282017A

    公开(公告)日：1994-01-25

    申请号：US461285

    申请日：1990-01-05

    Applicant: Ira Kasindorf ,  Alexander Stein

    Inventor： Ira Kasindorf ,  Alexander Stein

    IPC: G01J5/00 ,  G01K11/12 ,  G01N21/47

    CPC classification number: G01J5/08 ,  G01J5/0815 ,  G01J5/0821 ,  G01J5/0878 ,  G01K11/12 ,  G01N21/474 ,  G01J2005/0051 ,  G01J2005/0074

    Abstract: Apparatus for measuring the value of the directional spectral hemispherical reflectance of the surface of a target when not engaging but being spaced from the target employs a hollow elongated member having a longitudinal axis and first and second opposite ends. The area of the first end is relatively large relative to that of the second end. The first end is open. The member has an inner chamber extending between the ends and has an inner surface adapted to reflect light falling within a specified wave band. The member when the apparatus is in use is positioned with the first end adjacent but spaced from a selected portion of the surface of the target. The longitudinal axis is oriented essentially normal to a region on the selected surface which would be engaged by a line coincident with the axis and sufficiently extended outwardly from the first end. A beam of light falling within said band is directed within at least a portion of the chamber along the axis and outward through the first end to impinge upon the selected surface portion. A portion of the beam is reflected after said impingement backward through the first end into the chamber. The reflected light which strikes the inner surface of the chamber is directed backwardly within the chamber toward the second end. An electrical signal derived from at least a portion of the backwardly directed light provides a measurement of said reflectance value.

    Abstract translation: 用于测量目标表面的方向光谱半球反射值在不接合但与目标间隔时的值的装置采用具有纵向轴线的中空细长构件以及第一和第二相对端。 第一端的面积相对于第二端的面积相对较大。 第一端是开放的 该构件具有在端部之间延伸的内室，并且具有适于反射落入指定波段内的光的内表面。 当设备使用时的构件定位成第一端与目标的表面的选定部分相邻但间隔开。 纵向轴线基本上垂直于所选择的表面上的区域，该区域将被与轴线重合并且从第一端向外充分延伸的线路接合。 落在所述带内的光束沿着轴线被引导到腔室的至少一部分内并且穿过第一端向外引导到所选择的表面部分上。 所述梁的一部分在所述冲击之后通过所述第一端向后反射进入所述室。 撞击室的内表面的反射光在腔室内向后指向第二端。 从后向光的至少一部分导出的电信号提供所述反射率值的测量值。

    Laser radiometer
    7.
    发明授权
    Laser radiometer 失效
    激光辐射计

    公开(公告)号：US4417822A

    公开(公告)日：1983-11-29

    申请号：US319244

    申请日：1981-11-09

    Applicant: Alexander Stein ,  Paul Rabinowitz ,  Andrew Kaldor

    Inventor： Alexander Stein ,  Paul Rabinowitz ,  Andrew Kaldor

    IPC: B62B13/10 ,  G01J5/00 ,  G01J9/04 ,  G01J5/52 ,  G01J5/62

    CPC classification number: G01J5/522 ,  B62B13/10 ,  G01J5/0044 ,  G01J5/08 ,  G01J5/0806 ,  G01J5/0834 ,  G01J5/0846 ,  G01J5/0862 ,  G01J5/0871 ,  G01J5/0896 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01J2005/583 ,  G01J9/04

    Abstract: The present invention teaches a unique laser radiometer capable of accurately measuring the radiation temperature of a radiant surface and independently measuring the surface's emissivity. A narrow-band radiometer is combined with a laser reflectometer to measure concurrently radiance and emissivity of a remote, hot surface. Together, radiance and emissivity yield the true surface temperature of the remote target. A narrow receiver bandwidth is attained by one of two methods; (a) heterodyne detection or (b) optical filtering. A direct measurement of emissivity is used to adjust the value obtained for the thermal radiation signal to substantially enhance the accuracy of the temperature measurement for a given subject surface. The technique provides substantially high detection sensitivity over a very narrow spectral bandwidth.

    Abstract translation: 本发明教导了一种独特的激光辐射计，能够精确地测量辐射表面的辐射温度并独立地测量表面的发射率。 窄带辐射计与激光反射计相结合，以测量远程热表面的辐射和发射率。 一起，辐射和发射率产生远程目标的真实表面温度。 通过两种方法之一获得窄的接收机带宽; （a）外差检测或（b）光学滤波。 使用辐射率的直接测量来调整对于热辐射信号获得的值，以显着提高给定对象表面的温度测量的精度。 该技术在非常窄的光谱带宽上提供了显着高的检测灵敏度。

    Infrared Contrasting Color Emissivity Measurement System
    10.
    发明申请
    Infrared Contrasting Color Emissivity Measurement System 审中-公开

    公开(公告)号：US20190003897A1

    公开(公告)日：2019-01-03

    申请号：US16105786

    申请日：2018-08-20

    Applicant: Exergen Corporation

    Inventor： Jason N. Jarboe

    IPC: G01K7/00 ,  G01J5/06 ,  G01J5/00

    CPC classification number: G01K7/003 ,  G01J5/0003 ,  G01J5/061 ,  G01J2005/0051 ,  G01J2005/0074

    Abstract: Devices and corresponding methods can be provided to measure temperature and/or emissivity of a target. Emissivity of the target need not be known or assumed, and any temperature difference between a sensor and the target need not be zeroed or minimized. No particular bandpass filter is required. Devices can include one or two sensors viewing the same target as the target views different respective viewed temperatures. The respective viewed temperatures can be sensor temperatures, and a single sensor can be set to each of the respective viewed temperatures at different times. An analyzer can determine the temperature and/or emissivity of the target based on the respective viewed temperatures and on plural net heat fluxes detected by the sensors and corresponding to the respective viewed temperatures.

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