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    CALIBRATION SYSTEM FOR DETECTOR
    3.
    发明申请
    CALIBRATION SYSTEM FOR DETECTOR 有权
    检测仪校准系统

    公开(公告)号：US20130043390A1

    公开(公告)日：2013-02-21

    申请号：US13212875

    申请日：2011-08-18

    Applicant: Howard M. DE RUYTER

    Inventor： Howard M. DE RUYTER

    IPC: G01J5/00

    CPC classification number: G01J5/522 ,  G01J1/0295 ,  G01J1/0411 ,  G01J1/0444 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0235 ,  G01J3/28 ,  G01J5/0809 ,  G01J5/084

    Abstract: A calibration system for a detector includes a base member, a plurality of radiation sources fixedly attached to the base member, and a positioning mechanism attached to the base member. Each radiation source is maintained at a different temperature and is configured to emit electromagnetic radiation. The positioning mechanism includes a movable member having a single degree of freedom with respect to the base member, and a plurality of optical elements arranged on the movable member. Each optical element corresponds to one of the radiation sources and each optical element is configured to at least be movable between a calibration position and a non-calibration position. When the optical element is in the calibration position, the optical element is configured to receive the electromagnetic radiation from its corresponding radiation source and to reflect the electromagnetic radiation to a detector.

    Abstract translation: 一种用于检测器的校准系统，包括基座部件，固定在基部部件上的多个辐射源，以及安装在基座部件上的定位机构。 每个辐射源被保持在不同的温度并被配置成发射电磁辐射。 定位机构包括相对于基底部件具有单一自由度的可动部件和布置在可动部件上的多个光学元件。 每个光学元件对应于一个辐射源，并且每个光学元件被配置为至少可以在校准位置和非校准位置之间移动。 当光学元件处于校准位置时，光学元件被配置为从其相应的辐射源接收电磁辐射并将电磁辐射反射到检测器。

    Apparatus and method for measuring optical component
    5.
    发明授权
    Apparatus and method for measuring optical component 有权

    公开(公告)号：US09429469B2

    公开(公告)日：2016-08-30

    申请号：US14407050

    申请日：2013-06-07

    Applicant: Labrox Oy

    Inventor： Pauli Salmelainen ,  Antero Yli-Koski

    IPC: G01J1/04 ,  G01J1/42 ,  G01N21/64

    CPC classification number: G01J1/4228 ,  G01J1/0444 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6471 ,  G01N2201/02

    Abstract: An apparatus for measuring an optical component (160, 170, 190) of the apparatus, the apparatus comprising a radiation source (130) configured to form a measuring beam in a measuring channel (140), wherein the measured optical component configured to be in a first position outside the measuring channel and in a second position in the measuring channel; a first detector (110) configured to receive beams in the measuring channel; a second detector (150) configured to receive beams in the measuring channel; at least one processor; and at least one memory including computer program code. The at least one memory and the computer program code are configured to, with the at least one processor, cause the apparatus at least to select at least one of the first detector and the second detector to receive beams in the measuring channel, the measuring channel (140) being integrated to a photometer or a fluorescence channel of the apparatus; receive a first beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the first position; receive a second beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the second position; and determine the characteristics of the optical component based on the first beam and the second beam.

    Apparatus and method for measuring optical component
    6.
    发明申请
    Apparatus and method for measuring optical component 有权
    光学元件测量装置及方法

    公开(公告)号：US20150177060A1

    公开(公告)日：2015-06-25

    申请号：US14407050

    申请日：2013-06-07

    Applicant: Labrox Oy

    Inventor： Pauli Salmelainen ,  Antero Yli-Koski

    IPC: G01J1/42 ,  G01J1/04 ,  G01N21/64

    CPC classification number: G01J1/4228 ,  G01J1/0444 ,  G01N21/645 ,  G01N21/6452 ,  G01N2021/6471 ,  G01N2201/02

    Abstract: An apparatus for measuring an optical component (160, 170, 190) of the apparatus, the apparatus comprising a radiation source (130) configured to form a measuring beam in a measuring channel (140), wherein the measured optical component configured to be in a first position outside the measuring channel and in a second position in the measuring channel; a first detector (110) configured to receive beams in the measuring channel; a second detector (150) configured to receive beams in the measuring channel; at least one processor; and at least one memory including computer program code. The at least one memory and the computer program code are configured to, with the at least one processor, cause the apparatus at least to select at least one of the first detector and the second detector to receive beams in the measuring channel, the measuring channel (140) being integrated to a photometer or a fluorescence channel of the apparatus; receive a first beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the first position; receive a second beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the second position; and determine the characteristics of the optical component based on the first beam and the second beam.

    Abstract translation: 一种用于测量装置的光学部件（160,170,190）的装置，该装置包括被配置成在测量通道（140）中形成测量光束的辐射源（130），其中被测量的光学部件配置成 测量通道外的第一位置和测量通道中的第二位置; 被配置为在所述测量通道中接收波束的第一检测器（110） 被配置为在所述测量通道中接收波束的第二检测器（150） 至少一个处理器; 以及包括计算机程序代码的至少一个存储器。 所述至少一个存储器和所述计算机程序代码被配置为与所述至少一个处理器一起使所述设备至少选择所述第一检测器和所述第二检测器中的至少一个以接收所述测量通道中的波束，所述测量通道 （140）被集成到所述装置的光度计或荧光通道中; 在测量通道中接收使用所选择的检测器的第一光束，其中所测量的光学部件处于第一位置; 在测量通道中接收使用所选择的检测器的第二光束，其中所测量的光学部件处于第二位置; 并基于第一光束和第二光束确定光学部件的特性。

    Electronic Devices with Light Sensors
    7.
    发明申请
    Electronic Devices with Light Sensors 有权
    带光传感器的电子设备

    公开(公告)号：US20140166867A1

    公开(公告)日：2014-06-19

    申请号：US13718850

    申请日：2012-12-18

    Applicant: APPLE INC.

    Inventor： Boon W. Shiu ,  David Lin Lee ,  Michael DiVincent

    IPC: G01J1/02

    CPC classification number: G01J1/0271 ,  G01J1/0425 ,  G01J1/0444 ,  G01J1/4204 ,  G01J1/4228 ,  H04M1/22

    Abstract: Electronic devices may be provided with light sensors. Light sensors may be proximity sensors or ambient light sensors. Proximity sensors may include a light-emitting component and a light-sensitive component. The electronic device may include an enclosure formed from housing structures and some or all of a display for the device. The enclosure may include openings such as openings formed from clusters of smaller openings. Each light sensor may receive light through one of the clusters of openings. The light sensor may receive the light directly through the openings or may receive light that passes through the openings and is guided to the light sensor by light guiding structures. The light guiding structures may include fiber optic structures or light-reflecting structures. Fiber optic structures may fill or partially fill the openings. Light reflecting structures may be machined cavities in an internal support structure.

    Abstract translation: 电子设备可以设置有光传感器。 光传感器可以是接近传感器或环境光传感器。 接近传感器可以包括发光部件和感光部件。 电子设备可以包括由壳体结构形成的外壳和用于该装置的显示器的部分或全部。 外壳可以包括开口，例如由较小开口的簇形成的开口。 每个光传感器可以通过一组开口接收光。 光传感器可以直接通过开口接收光，或者可以接收穿过开口的光，并通过光导结构被引导到光传感器。 光引导结构可以包括光纤结构或光反射结构。 光纤结构可以填充或部分填充开口。 光反射结构可以在内部支撑结构中被加工成腔。

    APPARATUS WITH MULTIPLE LIGHT DETECTORS AND METHODS OF USE AND MANUFACTURE
    8.
    发明申请
    APPARATUS WITH MULTIPLE LIGHT DETECTORS AND METHODS OF USE AND MANUFACTURE 有权
    具有多个光探测器的设备及其使用和制造方法

    公开(公告)号：US20070272844A1

    公开(公告)日：2007-11-29

    申请号：US11420399

    申请日：2006-05-25

    Applicant: Francis A. Dominic ,  Thomas H. Bulpitt ,  Gerald M. Heigel

    Inventor： Francis A. Dominic ,  Thomas H. Bulpitt ,  Gerald M. Heigel

    IPC: H01J5/02 ,  H01J40/14

    CPC classification number: G01J1/04 ,  G01J1/0425 ,  G01J1/0444 ,  G01J1/4228 ,  G01J3/08

    Abstract: An apparatus for measuring light properties includes a housing defining a light input port; as well as a first light detector; a second light detector; and a coupling element. The first light detector is a single channel light detector or a multiple channel light detector. The second light detector is a multiple channel light detector. The coupling element is configured and arranged to selectively couple light incident from the light input port to one of the first light detector and the second light detector. As an alternative, a beam splitting element can be used instead of the coupling element. The beam splitting element receives light from the light input port and then splits the light and delivers a portion of the light to the first light detector and a portion of the light to the second light detector.

    Abstract translation: 一种用于测量光性质的装置包括限定光输入端口的壳体; 以及第一光检测器; 第二光检测器; 和耦合元件。 第一个光检测器是单通道光检测器或多通道光检测器。 第二光检测器是多通道光检测器。 耦合元件被配置和布置成将从光输入端入射的光选择性地耦合到第一光检测器和第二光检测器之一。 作为替代，可以使用分束元件代替耦合元件。 分束元件接收来自光输入端口的光，然后分解光并将一部分光传送到第一光检测器和一部分光到第二光检测器。

    Calibration system for detector
    9.
    发明授权
    Calibration system for detector 有权
    检测器校准系统

    公开(公告)号：US08716651B2

    公开(公告)日：2014-05-06

    申请号：US13212875

    申请日：2011-08-18

    Applicant: Howard M. De Ruyter

    Inventor： Howard M. De Ruyter

    IPC: G01D18/00

    CPC classification number: G01J5/522 ,  G01J1/0295 ,  G01J1/0411 ,  G01J1/0444 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0235 ,  G01J3/28 ,  G01J5/0809 ,  G01J5/084

    Abstract: A calibration system for a detector includes a base member, a plurality of radiation sources fixedly attached to the base member, and a positioning mechanism attached to the base member. Each radiation source is maintained at a different temperature and is configured to emit electromagnetic radiation. The positioning mechanism includes a movable member having a single degree of freedom with respect to the base member, and a plurality of optical elements arranged on the movable member. Each optical element corresponds to one of the radiation sources and each optical element is configured to at least be movable between a calibration position and a non-calibration position. When the optical element is in the calibration position, the optical element is configured to receive the electromagnetic radiation from its corresponding radiation source and to reflect the electromagnetic radiation to a detector.

    Abstract translation: 一种用于检测器的校准系统，包括基座部件，固定在基部部件上的多个辐射源，以及安装在基座部件上的定位机构。 每个辐射源被保持在不同的温度并被配置成发射电磁辐射。 定位机构包括相对于基底部件具有单一自由度的可动部件和布置在可动部件上的多个光学元件。 每个光学元件对应于一个辐射源，并且每个光学元件被配置为至少可以在校准位置和非校准位置之间移动。 当光学元件处于校准位置时，光学元件被配置为从其相应的辐射源接收电磁辐射并将电磁辐射反射到检测器。

    SYSTEM AND METHOD FOR DETERMINING SIZE AND LOCATION OF MINIMUM BEAM SPOT
    10.
    发明申请
    SYSTEM AND METHOD FOR DETERMINING SIZE AND LOCATION OF MINIMUM BEAM SPOT 有权
    用于确定最小光束尺寸和位置的系统和方法

    公开(公告)号：US20140098363A1

    公开(公告)日：2014-04-10

    申请号：US13646246

    申请日：2012-10-05

    Applicant: KLA-Tencor Corporation

    Inventor： Daniel Hey

    IPC: G01J1/42

    CPC classification number: G01J1/4257 ,  G01J1/0437 ,  G01J1/0444

    Abstract: The disclosure is directed to a system and method for determining at least one characteristic of an illumination beam emanating from an illumination source. A substrate having a plurality of apertures may be actuated through an illumination beam so that apertures at different spatial offsets are scanned through the illumination beam at one or more levels of focus. Portions of illumination directed through scanned apertures may be received by at least one detector. At least one characteristic of the illumination beam may be extracted from data points associated with intensity levels associated with detected portions of illumination. Furthermore, multiple determinations of a beam characteristic made over a period of time may be utilized to calibrate the illumination source.

    Abstract translation: 本公开涉及一种用于确定从照明源发出的照明光束的至少一个特性的系统和方法。 具有多个孔的基底可以通过照明光束被致动，使得在不同的空间偏移下的孔以一个或多个焦点水平被扫过照射束。 通过扫描的孔径引导的照明部分可以由至少一个检测器接收。 可以从与检测到的照明部分相关联的强度水平相关联的数据点提取照明光束的至少一个特性。 此外，可以利用在一段时间内进行的光束特性的多次确定来校准照明源。

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