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    Method and apparatus to assess the thermal damage caused to a PCD cutter using capacitance spectroscopy
    2.
    发明授权
    Method and apparatus to assess the thermal damage caused to a PCD cutter using capacitance spectroscopy 有权
    评估使用电容光谱法对PCD刀具造成的热损伤的方法和装置

    公开(公告)号：US09423436B2

    公开(公告)日：2016-08-23

    申请号：US14073557

    申请日：2013-11-06

    Applicant: Varel International Ind., L.P.

    Inventor： Federico Bellin ,  Vamsee Chintamaneni

    IPC: G01N27/22 ,  G01R27/26 ,  G01N33/40

    CPC classification number: G01R27/2605 ,  G01N27/22 ,  G01N33/40

    Abstract: A method and apparatus for non-destructively determining the wear resistance of an ultra-hard polycrystalline structure after being coupled to a downhole tool using capacitance measurements. The apparatus includes a capacitance measuring device having a positive and negative terminal, a leached component comprising a polycrystalline structure that has been coupled to a downhole tool, a first wire, and a second wire. The first wire electrically couples the positive terminal to a surface of the leached component and the second wire electrically couples the negative terminal to a surface of the downhole tool. The capacitance is measured for the leached component one or more times and compared to a calibration curve that shows a relationship between capacitance values and wear resistance, thereby allowing determination of an estimated wear resistance for the polycrystalline structure.

    Abstract translation: 在使用电容测量结合到井下工具之后，非破坏性地确定超硬多晶结构的耐磨性的方法和装置。 该装置包括具有正端子和负端子的电容测量装置，包括已连接到井下工具，第一线和第二线的多晶结构的浸出部件。 第一线将正端子电耦合到浸出部件的表面，并且第二线将负极端子电耦合到井下工具的表面。 对于浸出组分测量电容量一次或多次，并与显示电容值和耐磨性之间的关系的校准曲线进行比较，从而可以确定多晶结构的估计耐磨性。

    APPARATUS TO IMPROVE THE PERFORMANCE OF A LEACHED CUTTER
    4.
    发明申请
    APPARATUS TO IMPROVE THE PERFORMANCE OF A LEACHED CUTTER 审中-公开
    提高浸出式切割机性能的设备

    公开(公告)号：US20170043378A1

    公开(公告)日：2017-02-16

    申请号：US14974063

    申请日：2015-12-18

    Applicant: VAREL INTERNATIONAL IND., L.P.

    Inventor： Federico Bellin ,  Vamsee Chintamaneni

    IPC: B08B3/12 ,  B08B3/08 ,  B08B7/02 ,  B23B27/14

    CPC classification number: B08B3/12 ,  B08B3/08 ,  B08B7/028 ,  B23B27/148 ,  B23B27/20 ,  B23B2226/12 ,  B23B2226/315 ,  B23B2270/28 ,  Y10T408/81

    Abstract: A cleaned component having a polycrystalline structure, a method and apparatus for cleaning a leached component to form the cleaned component, and a method for determining the effectiveness of cleaning the leached component. The cleaned component includes a leached layer that has at least a portion of by-product materials removed. The by-product materials were deposited into the leached layer during a leaching process that formed the leached layer. The apparatus and method for cleaning includes a tank, a cleaning fluid placed within the tank, and at least a portion of the leached layer immersed into the cleaning fluid. Optionally, a transducer emits ultrasonic waves into the leached layer. The method for determining the effectiveness of cleaning includes cleaning the leached component to form the cleaned component, measuring one or more capacitance values of the cleaned component, repeating the cleaning and the measuring until achieving a stable lower limit capacitance value.

    Abstract translation: 具有多晶结构的清洁部件，用于清洁浸出部件以形成清洁部件的方法和装置，以及用于确定清洗部件的有效性的方法。 清洁的部件包括具有除去的副产物材料的至少一部分的浸出层。 在形成浸出层的浸出过程中，副产物材料沉积到浸出层中。 用于清洁的装置和方法包括罐，置于罐内的清洗液，以及浸入清洗液中的浸出层的至少一部分。 可选地，换能器将超声波发射到浸出层中。 用于确定清洁效果的方法包括清洗浸出的部件以形成清洁的部件，测量清洁部件的一个或多个电容值，重复清洁和测量直到达到稳定的下限电容值。

    Non-destructive leaching depth measurement using capacitance spectroscopy
    5.
    发明授权
    Non-destructive leaching depth measurement using capacitance spectroscopy 有权
    使用电容光谱法进行非破坏性浸出深度测量

    公开(公告)号：US09377428B2

    公开(公告)日：2016-06-28

    申请号：US14286136

    申请日：2014-05-23

    Applicant: Varel International Ind., L.P.

    Inventor： Federico Bellin ,  Vamsee Chintamaneni

    IPC: G01N27/22 ,  G01N33/40

    CPC classification number: G01N27/22 ,  G01N33/40

    Abstract: A method of characterizing a quality of a polycrystalline diamond compact (PDC) cutter includes obtaining a PDC cutter that includes a leached layer and an unleached layer. The unleached layer is positioned adjacent to the leached layer, and the leached layer has at least a portion of a catalyst material removed from therein. The method further includes measuring capacitance values of the PDC cutter at multiple frequencies of an electrical signal provided to the PDC cutter by a capacitance measuring device to measure the capacitance values of the PDC cutter. The method also includes characterizing a quality of the PDC cutter based on a lowest capacitance value from among the capacitance values. Each capacitance value of the capacitance values is measured at a respective frequency of the multiple frequencies of the electrical signal.

    Abstract translation: 表征多晶金刚石压块（PDC）切割器的质量的方法包括获得包括浸出层和未漂白层的PDC切割器。 未浸提层定位成与浸出层相邻，并且浸出层具有从其中去除的至少一部分催化剂材料。 该方法还包括通过电容测量装置测量提供给PDC切割器的电信号的多个频率来测量PDC切割器的电容值，以测量PDC切割器的电容值。 该方法还包括基于来自电容值的最低电容值来表征PDC切割器的质量。 在电信号的多个频率的相应频率处测量电容值的每个电容值。

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