公开(公告)号：US10320405B2

公开(公告)日：2019-06-11

申请号：US15909378

申请日：2018-03-01

Applicant: Texas Instruments Incorporated

Inventor： Srinivas Kumar Reddy Naru ,  Visvesvaraya Pentakota Appala ,  Shagun Dusad ,  Neeraj Shrivastava ,  Viswanathan Nagarajan ,  Ani Xavier ,  Rishi Soundararajan ,  Sai Aditya Nurani ,  Roswald Francis

IPC: H03M1/00 ,  H03M1/06 ,  H03M1/12 ,  H03M1/10 ,  H03M1/16 ,  H03M1/36

Abstract: In described examples, an analog to digital converter (ADC) includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.

公开(公告)号：US11569827B1

公开(公告)日：2023-01-31

申请号：US17390362

申请日：2021-07-30

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Sthanunathan Ramakrishnan ,  Nithin Gopinath ,  Sai Aditya Nurani ,  Joseph Palackal Mathew ,  Nagalinga Swamy Basayya Aremallapur

IPC: H03M1/06 ,  H03M1/12 ,  H03M1/08 ,  H03M1/10

Abstract: Aspects of the description provide for an analog-to-digital converter (ADC) operable to convert an analog input signal to an output signal at an output of the ADC. In some examples, the ADC includes multiple sub-ADCs coupled in parallel, each of the multiple sub-ADCs coupled to the output of the ADC and operable to receive the analog input signal. The ADC is configured to operate the sub-ADCs in a consecutive operation loop including a transition phase in which the ADC operates each of the sub-ADCs sequentially for a first number of sequences, an estimation phase in which the ADC operates each of the sub-ADCs sequentially for a second number of sequences following the first number of sequences, and a randomization phase in which the ADC operates subsets of the sub-ADCs for a third number of sequences following the second number of sequences.

公开(公告)号：US20170302287A1

公开(公告)日：2017-10-19

申请号：US15485552

申请日：2017-04-12

Applicant: Texas Instruments Incorporated

Inventor： Srinivas Kumar Reddy Naru ,  Visvesvaraya Pentakota Appala ,  Shagun Dusad ,  Neeraj Shrivastava ,  Viswanathan Nagarajan ,  Ani Xavier ,  Rishi Soundararajan ,  Sai Aditya Nurani ,  Roswald Francis

IPC: H03M1/06 ,  H03M1/12

CPC classification number: H03M1/06 ,  H03M1/1038 ,  H03M1/109 ,  H03M1/1205 ,  H03M1/164 ,  H03M1/361

Abstract: The disclosure provides an analog to digital converter (ADC). The ADC includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.

公开(公告)号：US12191877B2

公开(公告)日：2025-01-07

申请号：US17898844

申请日：2022-08-30

Applicant: Texas Instruments Incorporated

Inventor： Sai Aditya Nurani ,  Rishi Soundararajan ,  Nithin Gopinath ,  Visvesvaraya Pentakota ,  Shagun Dusad

IPC: H03M1/12 ,  H03M1/44 ,  H03M1/50 ,  H03M1/78

Abstract: An analog-to-digital converter circuit incorporating includes a multi-bit input buffer having a differential input and configured to generate, at a plurality of differential outputs, a plurality of residues of a differential input sample relative to a corresponding plurality of zero-crossing references. Chopping stages chop the residues, for example with a pseudo-random binary sequence. The circuit further includes zero-crossing comparators, each with differential inputs coupled to receive one of the chopped residues. The zero-crossing comparators are in an ordered sequence of zone thresholds within the input range of the circuit. Folding logic circuitry has inputs coupled to outputs of the comparators, and outputs a delay domain signal indicating a magnitude of the one of the residues relative to a nearest zone threshold. Digital stage circuitry generates a digital output word representing the received input sample responsive to the comparator outputs and the delay domain signal.

公开(公告)号：US20250004049A1

公开(公告)日：2025-01-02

申请号：US18217292

申请日：2023-06-30

Applicant: Texas Instruments Incorporated

Inventor： Nithin Gopinath ,  Sai Aditya Nurani ,  Viswanathan Nagarajan ,  Himanshu Varshney ,  Mishab I ,  Mujammil Patel

IPC: G01R31/317

Abstract: An example apparatus includes programmable circuitry configured to: determine a first output voltage from a first analog to digital converter (ADC) responsive to the first ADC and a second ADC both receiving a first input voltage; determine a first output voltage from a second ADC responsive to the first ADC and a second ADC both receiving the first input voltage; determine a second output voltage from the first ADC responsive to the first ADC receiving a second input voltage and the second ADC receiving the first input voltage; and determine an error value for the first ADC based on: (a) a difference between the first output voltage from the first ADC and the first output voltage from the second ADC, and (b) a difference between the first output voltage from the first ADC and the second output voltage from the first ADC.

公开(公告)号：US20240072820A1

公开(公告)日：2024-02-29

申请号：US17898844

申请日：2022-08-30

Applicant: Texas Instruments Incorporated

Inventor： Sai Aditya Nurani ,  Rishi Soundararajan ,  Nithin Gopinath ,  Visvesvaraya Pentakota ,  Shagun Dusad

IPC: H03M1/12 ,  H03M1/44 ,  H03M1/50 ,  H03M1/78

CPC classification number: H03M1/1245 ,  H03M1/44 ,  H03M1/50 ,  H03M1/785

Abstract: An analog-to-digital converter circuit incorporating includes a multi-bit input buffer having a differential input and configured to generate, at a plurality of differential outputs, a plurality of residues of a differential input sample relative to a corresponding plurality of zero-crossing references. Chopping stages chop the residues, for example with a pseudo-random binary sequence. The circuit further includes zero-crossing comparators, each with differential inputs coupled to receive one of the chopped residues. The zero-crossing comparators are in an ordered sequence of zone thresholds within the input range of the circuit. Folding logic circuitry has inputs coupled to outputs of the comparators, and outputs a delay domain signal indicating a magnitude of the one of the residues relative to a nearest zone threshold. Digital stage circuitry generates a digital output word representing the received input sample responsive to the comparator outputs and the delay domain signal.

公开(公告)号：US20210091778A1

公开(公告)日：2021-03-25

申请号：US16575874

申请日：2019-09-19

Applicant: Texas Instruments Incorporated

Inventor： Neeraj Shrivastava ,  Sai Aditya Nurani

IPC: H03M1/12 ,  G06F1/26

Abstract: In described examples, a switched capacitor circuit includes an amplifier that generates a first output signal in response to a first sampled input signal. A second sampling circuit is coupled to the amplifier and generates an output signal in response to the first output signal. A first current boost circuit is coupled to the amplifier and the second sampling circuit and provides current to the second sampling circuit when the first output signal is below a first threshold. A second current boost circuit is coupled to the amplifier and the second sampling circuit and receives current from the second sampling circuit when the first output signal is above a second threshold.

公开(公告)号：US20180191362A1

公开(公告)日：2018-07-05

申请号：US15909378

申请日：2018-03-01

Applicant: Texas Instruments Incorporated

Inventor： Srinivas Kumar Reddy Naru ,  Visvesvaraya Pentakota Appala ,  Shagun Dusad ,  Neeraj Shrivastava ,  Viswanathan Nagarajan ,  Ani Xavier ,  Rishi Soundararajan ,  Sai Aditya Nurani ,  Roswald Francis

IPC: H03M1/06 ,  H03M1/12 ,  H03M1/10 ,  H03M1/16 ,  H03M1/36

CPC classification number: H03M1/06 ,  H03M1/1038 ,  H03M1/109 ,  H03M1/1205 ,  H03M1/164 ,  H03M1/361

Abstract: The disclosure provides an analog to digital converter (ADC). The ADC includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.

公开(公告)号：US09941893B2

公开(公告)日：2018-04-10

申请号：US15485552

申请日：2017-04-12

Applicant: Texas Instruments Incorporated

Inventor： Srinivas Kumar Reddy Naru ,  Visvesvaraya Pentakota Appala ,  Shagun Dusad ,  Neeraj Shrivastava ,  Viswanathan Nagarajan ,  Ani Xavier ,  Rishi Soundararajan ,  Sai Aditya Nurani ,  Roswald Francis

IPC: H03M1/00 ,  H03M1/06 ,  H03M1/12

CPC classification number: H03M1/06 ,  H03M1/1038 ,  H03M1/109 ,  H03M1/1205 ,  H03M1/164 ,  H03M1/361

Abstract: An ADC includes a flash ADC. The flash ADC generates a flash output in response to an input signal, and an error correction block generates a known pattern. A selector block is coupled to the flash ADC and the error correction block, and generates a plurality of selected signals in response to the flash output and the known pattern. A digital to analog converter (DAC) is coupled to the selector block, and generates a coarse analog signal in response to the plurality of selected signals. A residue amplifier is coupled to the DAC, and generates a residual analog signal in response to the coarse analog signal, the input signal and an analog PRBS (pseudo random binary sequence) signal. A residual ADC generates a residual code in response to the residual analog signal.