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公开(公告)号：US20140211209A1
公开(公告)日：2014-07-31
申请号：US14238520
申请日：2012-08-10
申请人： Takuya Ido , Toshikazu Ohnishi , Tetsuya Mori
发明人： Takuya Ido , Toshikazu Ohnishi , Tetsuya Mori
IPC分类号： G01N21/61
CPC分类号： G01N21/61 , G01N21/274 , G01N21/3504 , G01N2021/3513 , G01N2021/536 , G01N2021/8514 , G01N2021/8578
摘要： A gas analysis apparatus includes: a first reflector that reflects measurement light from a light emitting unit disposed outside a gas flue wall and transmitted through a sample gas. A light receiving unit outside the gas flue wall receives measurement light reflected by the first reflector. A second reflector outside the gas flue wall reflects measurement light toward the light receiving unit. A computing unit analyzes sample gas by allowing the measurement light to be reflected by the first reflector and performs correction or calibration of the gas analysis apparatus using known substances within an associated containing unit along the light path between the light emitting unit and the second reflector by allowing measurement light to be reflected by the second reflector. A switching unit outside the gas flue wall selectively removes or inserts the second reflector from the light path during component concentration analysis and correction or calibration, respectively.
摘要翻译： 气体分析装置包括：第一反射器，其反射来自设置在气体烟道壁外部并透过样气的发光单元的测量光。 气体烟道壁外部的受光单元接收由第一反射器反射的测量光。 气体烟道壁外部的第二反射镜将测量光反射到光接收单元。 计算单元通过允许测量光被第一反射器反射来分析样本气体，并且使用沿着发光单元和第二反射器之间的光路的相关联的容纳单元内的已知物质进行气体分析设备的校正或校准， 允许测量光被第二反射器反射。 气体烟道壁外的开关单元分别在组分浓度分析和校正或校准期间分别从光路中去除或插入第二反射器。
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公开(公告)号：US08934101B2
公开(公告)日：2015-01-13
申请号：US14238520
申请日：2012-08-10
申请人： Takuya Ido , Toshikazu Ohnishi , Tetsuya Mori
发明人： Takuya Ido , Toshikazu Ohnishi , Tetsuya Mori
CPC分类号： G01N21/61 , G01N21/274 , G01N21/3504 , G01N2021/3513 , G01N2021/536 , G01N2021/8514 , G01N2021/8578
摘要： A gas analysis apparatus includes: a first reflector that reflects measurement light from a light emitting unit disposed outside a gas flue wall and transmitted through a sample gas. A light receiving unit outside the gas flue wall receives measurement light reflected by the first reflector. A second reflector outside the gas flue wall reflects measurement light toward the light receiving unit. A computing unit analyzes sample gas by allowing the measurement light to be reflected by the first reflector and performs correction or calibration of the gas analysis apparatus using known substances within an associated containing unit along the light path between the light emitting unit and the second reflector by allowing measurement light to be reflected by the second reflector. A switching unit outside the gas flue wall selectively removes or inserts the second reflector from the light path during component concentration analysis and correction or calibration, respectively.
摘要翻译： 气体分析装置包括：第一反射器，其反射来自设置在气体烟道壁外部并透过样气的发光单元的测量光。 气体烟道壁外部的受光单元接收由第一反射器反射的测量光。 气体烟道壁外部的第二反射镜将测量光反射到光接收单元。 计算单元通过允许测量光被第一反射器反射来分析样本气体，并且使用沿着发光单元和第二反射器之间的光路的相关联的容纳单元内的已知物质进行气体分析设备的校正或校准， 允许测量光被第二反射器反射。 气体烟道壁外的开关单元分别在组分浓度分析和校正或校准期间分别从光路中去除或插入第二反射器。
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公开(公告)号：US20140183380A1
公开(公告)日：2014-07-03
申请号：US14119120
申请日：2012-05-17
IPC分类号： G01N33/00
CPC分类号： G01N33/0009 , G01N21/15 , G01N21/3504 , G01N21/8507 , G01N2021/151 , G01N2021/1712
摘要： A measurement unit used in an analyzing apparatus for measuring concentrations of component gases in a sample gas comprises a light emitting unit configured to emit a measurement light to the sample gas, a light receiving unit configured to receive the measurement light on a light receiving plane, a purge air introducing unit configured to introduce a purge air into a vicinity of at least one of the light emitting unit and the light receiving unit, and a condensing lens arranged in an optical path of the measurement light from the light emitting unit to the light receiving unit, the condensing lens being configured to condense the measurement light within the light receiving plane of the light receiving unit, a propagation path of the measurement light being varied by a thermal lens effect caused by a temperature difference between the sample gas and the purge air.
摘要翻译： 在用于测量样气中的成分气体浓度的分析装置中使用的测量单元包括被配置为向样品气体发射测量光的发光单元，被配置为在光接收平面上接收测量光的光接收单元， 吹扫空气引入单元，被配置为将吹扫空气引入到所述发光单元和所述光接收单元中的至少一个附近;以及聚光透镜，所述聚光透镜布置在从所述发光单元到所述光的测量光的光路中 所述聚光透镜被配置为在所述光接收单元的光接收平面内冷凝测量光，所述测量光的传播路径由所述样品气体和所述吹扫之间的温度差引起的热透镜效应变化 空气。
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公开(公告)号：US08649013B2
公开(公告)日：2014-02-11
申请号：US13198174
申请日：2011-08-04
IPC分类号： G01N21/00
CPC分类号： G01N21/15 , G01N1/2202 , G01N1/2208 , G01N1/2247 , G01N1/26 , G01N21/3504 , G01N21/8507 , G01N2021/151
摘要： A probe for gas analysis is provided in a pipe through which sample gas flows. The probe includes a tubular member and one or more sample gas inflow portions. The tubular member is disposed to cross a flow of the sample gas, and includes a measurement field to which the sample gas is introduced. The one or more sample gas inflow portions are provided in the tubular member. The sample gas flows around, and flows into the measurement field through the one or more sample gas inflow portions.
摘要翻译： 用于气体分析的探针在样品气体通过的管道中提供。 探针包括管状构件和一个或多个样品气体流入部分。 管状构件设置成与样品气体的流动交叉，并且包括测量区域，样品气体被引入该测量区域。 一个或多个样品气体流入部分设置在管状部件中。 样品气体流过，并通过一个或多个样品气体流入部分流入测量场。
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公开(公告)号：US08531669B2
公开(公告)日：2013-09-10
申请号：US13198017
申请日：2011-08-04
IPC分类号： G01N21/84
CPC分类号： G01N21/84 , F16K3/0254 , F16K31/1221 , G02B5/005 , G02B27/0006
摘要： An air-driven shutter device is used in an optical analyzer. The optical analyzer includes a measurement field to which a sample is supplied, a light-emitting unit measurement field for emitting measuring light to the sample, a light-receptive unit for receiving the measuring light that has passed through the sample, and a purge air supplying unit for supplying purge air. The air-driven shutter device includes a shutter and a shutter opening and closing mechanism. The shutter is disposed between the light-emitting unit and/or the light-receptive unit and the measurement field. The shutter opening and closing mechanism keeps the shutter open with pressure of the gas supplied from the purge air supplying unit, and closes the shutter when the pressure of the gas supplied from the purge air supplying unit becomes lower than a predetermined level.
摘要翻译： 在光学分析仪中使用气动快门装置。 光学分析仪包括供给样品的测量场，向样品发射测量光的发光单元测量场，用于接收通过样品的测量光的光接收单元和吹扫空气 供给单元供给吹扫空气。 气动快门装置包括挡板和挡板打开和关闭机构。 快门设置在发光单元和/或光接收单元和测量场之间。 快门打开和关闭机构通过从净化空气供应单元供应的气体的压力来保持快门打开，并且当从净化空气供应单元供应的气体的压力变得低于预定水平时，关闭快门。
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公开(公告)号：US20120033219A1
公开(公告)日：2012-02-09
申请号：US13198174
申请日：2011-08-04
CPC分类号： G01N21/15 , G01N1/2202 , G01N1/2208 , G01N1/2247 , G01N1/26 , G01N21/3504 , G01N21/8507 , G01N2021/151
摘要： A probe for gas analysis is provided in a pipe through which sample gas flows. The probe includes a tubular member and one or more sample gas inflow portions. The tubular member is disposed to cross a flow of the sample gas, and includes a measurement field to which the sample gas is introduced. The one or more sample gas inflow portions are provided in the tubular member. The sample gas flows around, and flows into the measurement field through the one or more sample gas inflow portions.
摘要翻译： 用于气体分析的探针在样品气体通过的管道中提供。 探针包括管状构件和一个或多个样品气体流入部分。 管状构件设置成与样品气体的流动交叉，并且包括测量区域，样品气体被引入该测量区域。 一个或多个样品气体流入部分设置在管状部件中。 样品气体流过，并通过一个或多个样品气体流入部分流入测量场。
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公开(公告)号：US20120033218A1
公开(公告)日：2012-02-09
申请号：US13198017
申请日：2011-08-04
CPC分类号： G01N21/84 , F16K3/0254 , F16K31/1221 , G02B5/005 , G02B27/0006
摘要： An air-driven shutter device is used in an optical analyzer. The optical analyzer includes a measurement field to which a sample is supplied, a light-emitting unit measurement field for emitting measuring light to the sample, a light-receptive unit for receiving the measuring light that has passed through the sample, and a purge air supplying unit for supplying purge air. The air-driven shutter device includes a shutter and a shutter opening and closing mechanism. The shutter is disposed between the light-emitting unit and/or the light-receptive unit and the measurement field. The shutter opening and closing mechanism keeps the shutter open with pressure of the gas supplied from the purge air supplying unit, and closes the shutter when the pressure of the gas supplied from the purge air supplying unit becomes lower than a predetermined level.
摘要翻译： 在光学分析仪中使用气动快门装置。 光学分析仪包括供给样品的测量场，向样品发射测量光的发光单元测量场，用于接收通过样品的测量光的光接收单元和吹扫空气 供给单元供给吹扫空气。 气动快门装置包括挡板和挡板打开和关闭机构。 快门设置在发光单元和/或光接收单元和测量场之间。 快门打开和关闭机构通过从净化空气供应单元供应的气体的压力来保持快门打开，并且当从净化空气供应单元供应的气体的压力变得低于预定水平时，关闭快门。
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公开(公告)号：US20080218059A1
公开(公告)日：2008-09-11
申请号：US12037684
申请日：2008-02-26
申请人： Toshikazu Ohnishi , Masato Yamanobe , Ichiro Nomura , Hidetoshi Suzuki , Yoshikazu Banno , Takeo Ono , Masanori Mitome
发明人： Toshikazu Ohnishi , Masato Yamanobe , Ichiro Nomura , Hidetoshi Suzuki , Yoshikazu Banno , Takeo Ono , Masanori Mitome
IPC分类号： H01J1/62
CPC分类号： H01J31/127 , H01J1/316 , H01J9/027 , H01J2201/3165 , H01J2329/0489
摘要： An electron-emitting device comprises a pair of oppositely disposed electrodes and an electroconductive film arranged between the electrodes and including a high resistance region. The high resistance region has a deposit containing carbon as a principal ingredient. The electron-emitting device can be used for an electron source of an image-forming apparatus of the flat panel type.
摘要翻译： 电子发射器件包括一对相对设置的电极和布置在电极之间并包括高电阻区域的导电膜。 高电阻区具有以碳为主要成分的沉积物。 电子发射器件可用于平板型图像形成装置的电子源。
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9.发明授权公开(公告)号：US07348719B2
公开(公告)日：2008-03-25
申请号：US11008925
申请日：2004-12-13
申请人： Toshikazu Ohnishi , Masato Yamanobe , Ichiro Nomura , Hidetoshi Suzuki , Yoshikazu Banno , Takeo Ono , Masanori Mitome
发明人： Toshikazu Ohnishi , Masato Yamanobe , Ichiro Nomura , Hidetoshi Suzuki , Yoshikazu Banno , Takeo Ono , Masanori Mitome
摘要： An electron-emitting device comprises a pair of oppositely disposed electrodes and an electroconductive film arranged between the electrodes and including a high resistance region. The high resistance region has a deposit containing carbon as a principal ingredient. The electron-emitting device can be used for an electron source of an image-forming apparatus of the flat panel type.
摘要翻译： 电子发射器件包括一对相对设置的电极和布置在电极之间并包括高电阻区域的导电膜。 高电阻区具有以碳为主要成分的沉积物。 电子发射器件可用于平板型图像形成装置的电子源。
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公开(公告)号：US20060189243A1
公开(公告)日：2006-08-24
申请号：US11362899
申请日：2006-02-28
申请人： Fumio Kishi , Masato Yamanobe , Takeo Tsukamoto , Toshikazu Ohnishi , Keisuke Yamamoto , Sotomitsu Ikeda , Yasuhiro Hamamoto , Kazuya Miyazaki
发明人： Fumio Kishi , Masato Yamanobe , Takeo Tsukamoto , Toshikazu Ohnishi , Keisuke Yamamoto , Sotomitsu Ikeda , Yasuhiro Hamamoto , Kazuya Miyazaki
CPC分类号： H01J29/481 , H01J1/316 , H01J9/027 , H01J31/127 , H01J2201/3165 , H01J2329/00 , H01J2329/0489
摘要： An electron-emitting device comprises a pair of electrodes and an electroconductive film arranged between the electrodes and including an electron-emitting region carrying a graphite film. The graphite film shows, in a Raman spectroscopic analysis using a laser light source with a wavelength of 514.5 nm and a spot diameter of 1 μm, peaks of scattered light, of which 1) a peak (P2) located in the vicinity of 1,580 cm−1 is greater than a peak (P1) located in the vicinity of 1,335 cm−1 or 2) the half-width of a peak (P1) located in the vicinity of 1,335 cm−1 is not greater than 150 cm−1.
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