Method of manufacturing a device with a cavity
    2.
    发明授权
    Method of manufacturing a device with a cavity 有权
    制造具有空腔的装置的方法

    公开(公告)号:US08906729B2

    公开(公告)日:2014-12-09

    申请号:US13673494

    申请日:2012-11-09

    摘要: The invention relates to a micro-device with a cavity, the micro-device comprising a substrate, the method comprising steps of: A) providing the substrate, having a surface and comprising a sacrificial oxide region at the surface; B) covering the sacrificial oxide region with a porous layer being permeable to a vapor HF etchant, and C) selectively etching the sacrificial oxide region through the porous layer using the vapor HF etchant to obtain the cavity. This method may be used in the manufacture of various micro-devices with a cavity, i.e. MEMS devices, and in particular in the encapsulation part thereof, and semiconductor devices, and in particular the BEOL-part thereof.

    摘要翻译: 本发明涉及具有空腔的微器件,微器件包括衬底,该方法包括以下步骤:A)提供具有表面并且在表面包括牺牲氧化物区域的衬底; B)覆盖牺牲氧化物区域,其中多孔层可透过蒸气HF蚀刻剂,以及C)使用蒸气HF蚀刻剂选择性地蚀刻通过多孔层的牺牲氧化物区域以获得空腔。 该方法可以用于制造具有腔体的各种微器件,即MEMS器件,特别是其封装部件,以及半导体器件,特别是其BEOL部件。

    Method of Manufacturing a Device with a Cavity
    5.
    发明申请
    Method of Manufacturing a Device with a Cavity 有权
    制造具有腔体的装置的方法

    公开(公告)号:US20130069178A1

    公开(公告)日:2013-03-21

    申请号:US13673494

    申请日:2012-11-09

    IPC分类号: H01L29/84 H01L21/50 H01L21/02

    摘要: The invention relates to a micro-device with a cavity, the micro-device comprising a substrate, the method comprising steps of: A) providing the substrate, having a surface and comprising a sacrificial oxide region at the surface; B) covering the sacrificial oxide region with a porous layer being permeable to a vapor HF etchant, and C) selectively etching the sacrificial oxide region through the porous layer using the vapor HF etchant to obtain the cavity. This method may be used in the manufacture of various micro-devices with a cavity, i.e. MEMS devices, and in particular in the encapsulation part thereof, and semiconductor devices, and in particular the BEOL-part thereof.

    摘要翻译: 本发明涉及具有空腔的微器件,微器件包括衬底,该方法包括以下步骤:A)提供具有表面并且在表面包括牺牲氧化物区域的衬底; B)覆盖牺牲氧化物区域,其中多孔层可透过蒸气HF蚀刻剂,以及C)使用蒸气HF蚀刻剂选择性地蚀刻通过多孔层的牺牲氧化物区域以获得空腔。 该方法可以用于制造具有腔体的各种微器件,即MEMS器件,特别是其封装部件,以及半导体器件,特别是其BEOL部件。