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公开(公告)号:US20230387039A1
公开(公告)日:2023-11-30
申请号:US17881128
申请日:2022-08-04
发明人: Sung-Yueh Wu , Jen-Chun Liao , Mao-Yen Chang , Yu-Chia Lai , Chien Ling Hwang , Ching-Hua Hsieh
IPC分类号: H01L23/00 , H01L23/31 , H01L23/498 , H01L23/367 , H01L23/552 , H01L21/56 , H01L21/48
CPC分类号: H01L23/562 , H01L23/3107 , H01L23/49822 , H01L23/49838 , H01L23/367 , H01L23/552 , H01L21/56 , H01L21/4857
摘要: A semiconductor package includes a first package component comprising: an integrated circuit die; an encapsulant surrounding the integrated circuit die; and a fan-out structure electrically connected to the integrated circuit die, wherein a first opening extends completely through the fan-out structure and at least partially through the encapsulant in a cross-sectional view, and wherein the encapsulant at least completely surrounds the first opening in a top-down view. The semiconductor package further includes a package substrate bonded to the first package component.
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公开(公告)号:US20240234210A1
公开(公告)日:2024-07-11
申请号:US18151643
申请日:2023-01-09
发明人: Jen-Chun Liao , Yen-Hung Chen , Ching-Hua Hsieh , Sung-Yueh Wu , Chih-Wei Lin , Kung-Chen Yeh
IPC分类号: H01L21/822 , H01L21/3065 , H01L21/56 , H01L23/00 , H01L23/31 , H01L25/065
CPC分类号: H01L21/822 , H01L21/3065 , H01L21/56 , H01L23/3121 , H01L24/08 , H01L24/16 , H01L24/32 , H01L24/73 , H01L24/80 , H01L24/96 , H01L24/97 , H01L25/0652 , H01L2224/08059 , H01L2224/08145 , H01L2224/16227 , H01L2224/32225 , H01L2224/73204 , H01L2224/80895 , H01L2224/80896 , H01L2224/95001 , H01L2224/96 , H01L2224/97 , H01L2924/10156 , H01L2924/10157
摘要: An integrated circuit package including integrated circuit dies and a method of forming are provided. The integrated circuit package may include a first integrated circuit die and a second integrated circuit die bonded to the first integrated circuit die. The first integrated circuit die may include a first substrate, a first interconnect structure, and a first bonding layer. The first interconnect structure may be between the first bonding layer and the first substrate. The second integrated circuit die may include a second substrate, a second interconnect structure, and a second bonding layer. The second interconnect structure may be between the second bonding layer and the second substrate. A first surface of the first bonding layer may be in direct contact with a first surface of the second bonding layer. A sidewall the first bonding layer and the first surface of the second bonding layer may form a first acute angle.
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公开(公告)号:US20240113071A1
公开(公告)日:2024-04-04
申请号:US18150240
申请日:2023-01-05
发明人: Chung-Shi Liu , Mao-Yen Chang , Yu-Chia Lai , Kuo-Lung Pan , Hao-Yi Tsai , Ching-Hua Hsieh , Hsiu-Jen Lin , Po-Yuan Teng , Cheng-Chieh Wu , Jen-Chun Liao
CPC分类号: H01L24/95 , H01L21/563 , H01L23/3185 , H01L23/4012 , H01L24/16 , H01L24/19 , H01L24/20 , H01L24/32 , H01L24/73 , H01L24/83 , H01L25/18 , H10B80/00 , H01L2023/4081 , H01L2023/4087 , H01L2224/16227 , H01L2224/19 , H01L2224/211 , H01L2224/215 , H01L2224/32225 , H01L2224/73204 , H01L2224/83007 , H01L2224/83939 , H01L2224/95 , H01L2924/01013 , H01L2924/01022 , H01L2924/01029 , H01L2924/01074 , H01L2924/3512
摘要: An integrated circuit package including electrically floating metal lines and a method of forming are provided. The integrated circuit package may include integrated circuit dies, an encapsulant around the integrated circuit dies, a redistribution structure on the encapsulant, a first electrically floating metal line disposed on the redistribution structure, a first electrical component connected to the redistribution structure, and an underfill between the first electrical component and the redistribution structure. A first opening in the underfill may expose a top surface of the first electrically floating metal line.
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