Abstract:
A semiconductor device comprising a high impurity concentration region, the impurity consisting of arsenic and at least one impurity other than arsenic. The number of atoms of the arsenic is smaller than that of the other impurity.
Abstract:
A SEMICONDUCTOR DEVICE COMPRISING A HIGH IMPURITY CONCENTRATION REGION, THE IMPURITY CONSISTING OF ARSENIC AND AT LEAST ONE IMPURITY OTHER THAN ARSENIC. THE NUMBER OF ATOMS OF THE ARSENIC IS SMALLER THAN THAT OF THE OTHER IMPURITY.
Abstract:
A silicon semiconductor device double doped with phosphorus and arsenic or boron and arsenic, the arsenic being present in an amount 3 to 40 percent of the other dopant and preventing lattice collapse with heavy doping concentrations.