PACKAGE SUBSTRATE WITH PARTIALLY RECESSED CAPACITOR

    公开(公告)号:US20220223509A1

    公开(公告)日:2022-07-14

    申请号:US17707872

    申请日:2022-03-29

    Abstract: A semiconductor package includes a multilayer substrate including a dielectric layer, a first conductive layer forming a first set of electrical contacts, a second conductive layer forming package electrical contacts and two capacitor electrical contacts, conductive vias extending through the dielectric layer between the first conductive layer with the second conductive layer, and a solder mask layer over the second conductive layer. The semiconductor package further includes a semiconductor die on the first side of the multilayer substrate electrically connected a capacitor on the second side of the multilayer substrate. A recessed portion of the capacitor is within a capacitor opening of the solder mask layer between the two capacitor electrical contacts and a board-side surface of the solder mask layer.

    Integrated circuit package and method of manufacture
    6.
    发明授权
    Integrated circuit package and method of manufacture 有权
    集成电路封装及制造方法

    公开(公告)号:US09281269B2

    公开(公告)日:2016-03-08

    申请号:US13682576

    申请日:2012-11-20

    Abstract: An integrated circuit (IC) package, device, including a substrate having a top surface with an IC die mounting area and a peripheral area surrounding the mounting area, a plurality of parallel conductor layers, a plurality of insulating layers and a plurality of plated through holes (PTHs) extending through the conductor layers and insulating layers. Various substrate structures in which certain of the PTHs and/or conductor layers and/or insulating layers have different CTE's than the others is disclosed. The various structures may reduce circuit failures due to substrate warpage and/or solder joint damage associated with a CTE mismatch between the substrate and the IC die.

    Abstract translation: 一种集成电路(IC)封装,包括具有具有IC管芯安装区域的顶表面和围绕安装区域的周边区域的衬底的器件,多个平行导体层,多个绝缘层和多个电镀通孔 延伸穿过导体层和绝缘层的孔(PTH)。 公开了其中某些PTH和/或导体层和/或绝缘层具有与其它层不同的CTE的各种衬底结构。 由于与基板和IC芯片之间的CTE失配相关联的基板翘曲和/或焊点损伤,各种结构可能减少电路故障。

    Package substrate with CTE matching barrier ring around microvias

    公开(公告)号:US11270955B2

    公开(公告)日:2022-03-08

    申请号:US16205436

    申请日:2018-11-30

    Abstract: A multi-layer package substrate includes a first build-up layer including a first dielectric layer and at least a second build-up layer including a second dielectric layer on the first build-up layer. The second build-up layer includes a top metal layer with a surface configured for attaching at least one integrated circuit (IC) die. The first build-up layer includes a bottom metal layer and a first microvia extending through the first dielectric layer, and the second build-up layer includes at least a second microvia extending through the second dielectric layer that is coupled to the first microvia. A barrier ring that has a coefficient of thermal expansion (CTE) matching material relative to a CTE of a metal of the second microvia positioned along only a portion of a height of at least the second microvia including at least around a top portion of the second microvia.

    SEMICONDUCTOR DEVICE PACKAGE WITH IMPROVED DIE PAD AND SOLDER MASK DESIGN

    公开(公告)号:US20200251436A1

    公开(公告)日:2020-08-06

    申请号:US16778250

    申请日:2020-01-31

    Abstract: A described example includes a package substrate having an array of die pads arranged in rows and columns on a die mount surface, and having an opposing board side surface; a solder mask layer overlying the die mount surface; a first plurality of solder mask defined openings in the solder mask layer at die pad locations, the solder mask defined openings exposing portions of a surface of corresponding die pads, the surface facing away from the package substrate; and at least one non-solder mask defined opening in the solder mask layer at a die pad location, exposing the entire surface of the die pad and sidewalls of the die pad at the non-solder mask defined opening.

Patent Agency Ranking