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公开(公告)号:US12046267B2
公开(公告)日:2024-07-23
申请号:US17895803
申请日:2022-08-25
Applicant: SanDisk Technologies LLC
Inventor: Kazuki Yamauchi
CPC classification number: G11C16/3459 , G11C11/5628 , G11C11/5671 , G11C16/10
Abstract: A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish programming to define verify windows ranging between each one of the specific prior ones of the data states and each one of the predetermined ones. The control means adjusts the verify windows in response to the memory cells associated with one of the specific prior ones of the data states not finishing programming before the one of the predetermined ones of the at least one of the verify windows is verified.
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公开(公告)号:US11081192B2
公开(公告)日:2021-08-03
申请号:US16668949
申请日:2019-10-30
Applicant: SanDisk Technologies LLC
Inventor: Hiroki Yabe , Koichiro Hayashi , Takuya Ariki , Yuki Fujita , Naoki Ookuma , Kazuki Yamauchi , Masahito Takehara , Toru Miwa
Abstract: A non-volatile memory device comprising a memory cell region having a plurality of co-planar memory cell planes arranged in a plane parallel to a semiconductor substrate, with each memory cell plane comprising a plurality of sub-planes disposed adjacent one another along an axis that is parallel to the substrate. Further, each memory cell plane comprises a plurality of sense amplifier regions arranged along the axis in an alternating pattern with the sub-planes such that adjacent to each sub-plane is a sense amplifier region and each sense amplifier region is operable with respect to at least a fraction of the bit lines of the two sub-planes immediately adjacent the sense amplifier region.
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公开(公告)号:US20240071526A1
公开(公告)日:2024-02-29
申请号:US17895803
申请日:2022-08-25
Applicant: SanDisk Technologies LLC
Inventor: Kazuki Yamauchi
CPC classification number: G11C16/3459 , G11C11/5628 , G11C11/5671 , G11C16/10
Abstract: A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish programming to define verify windows ranging between each one of the specific prior ones of the data states and each one of the predetermined ones. The control means adjusts the verify windows in response to the memory cells associated with one of the specific prior ones of the data states not finishing programming before the one of the predetermined ones of the at least one of the verify windows is verified.
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公开(公告)号:US20210134375A1
公开(公告)日:2021-05-06
申请号:US16668949
申请日:2019-10-30
Applicant: SanDisk Technologies LLC
Inventor: Hiroki Yabe , Koichiro Hayashi , Takuya Ariki , Yuki Fujita , Naoki Ookuma , Kazuki Yamauchi , Masahito Takehara , Toru Miwa
Abstract: A non-volatile memory device comprising a memory cell region having a plurality of co-planar memory cell planes arranged in a plane parallel to a semiconductor substrate, with each memory cell plane comprising a plurality of sub-planes disposed adjacent one another along an axis that is parallel to the substrate. Further, each memory cell plane comprises a plurality of sense amplifier regions arranged along the axis in an alternating pattern with the sub-planes such that adjacent to each sub-plane is a sense amplifier region and each sense amplifier region is operable with respect to at least a fraction of the bit lines of the two sub-planes immediately adjacent the sense amplifier region.
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公开(公告)号:US10885984B1
公开(公告)日:2021-01-05
申请号:US16668073
申请日:2019-10-30
Applicant: SanDisk Technologies LLC
Inventor: Hiroki Yabe , Koichiro Hayashi , Takuya Ariki , Yuki Fujita , Naoki Ookuma , Kazuki Yamauchi , Masahito Takehara , Toru Miwa
IPC: G11C16/04 , G11C16/14 , H01L27/11524
Abstract: A memory device comprising a semiconductor substrate in which a memory cell region and a peripheral circuitry region are defined, wherein the memory cell region has a plurality of non-volatile memory cells arranged in one or more arrays and the peripheral circuitry region has at least one sense amplifier region comprised of at least one low voltage transistor. Further, a deep N-well region is formed in the substrate, wherein the memory cell region and the peripheral circuitry region are placed on the deep N-well region such that, in the event that a high erase voltage (VERA) is applied to the memory cell region during an erase operation, the high erase voltage is applied to all terminals of the at least one low voltage resistor, thereby protecting the low voltage transistor by preventing it from experiencing a large voltage difference between its terminals.
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