Advanced window program-verify
    1.
    发明授权

    公开(公告)号:US12046267B2

    公开(公告)日:2024-07-23

    申请号:US17895803

    申请日:2022-08-25

    Inventor: Kazuki Yamauchi

    CPC classification number: G11C16/3459 G11C11/5628 G11C11/5671 G11C16/10

    Abstract: A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish programming to define verify windows ranging between each one of the specific prior ones of the data states and each one of the predetermined ones. The control means adjusts the verify windows in response to the memory cells associated with one of the specific prior ones of the data states not finishing programming before the one of the predetermined ones of the at least one of the verify windows is verified.

    ADVANCED WINDOW PROGRAM-VERIFY
    3.
    发明公开

    公开(公告)号:US20240071526A1

    公开(公告)日:2024-02-29

    申请号:US17895803

    申请日:2022-08-25

    Inventor: Kazuki Yamauchi

    CPC classification number: G11C16/3459 G11C11/5628 G11C11/5671 G11C16/10

    Abstract: A memory apparatus and operating method are provided. The apparatus includes memory cells connected to word lines and disposed in strings and configured to retain a threshold voltage corresponding to data states. A control means is configured to program and verify the memory cells during a program operation. The memory cells associated with predetermined ones of the data states are not verified until the memory cells associated with specific prior ones of the data states finish programming to define verify windows ranging between each one of the specific prior ones of the data states and each one of the predetermined ones. The control means adjusts the verify windows in response to the memory cells associated with one of the specific prior ones of the data states not finishing programming before the one of the predetermined ones of the at least one of the verify windows is verified.

    Area effective erase voltage isolation in NAND memory

    公开(公告)号:US10885984B1

    公开(公告)日:2021-01-05

    申请号:US16668073

    申请日:2019-10-30

    Abstract: A memory device comprising a semiconductor substrate in which a memory cell region and a peripheral circuitry region are defined, wherein the memory cell region has a plurality of non-volatile memory cells arranged in one or more arrays and the peripheral circuitry region has at least one sense amplifier region comprised of at least one low voltage transistor. Further, a deep N-well region is formed in the substrate, wherein the memory cell region and the peripheral circuitry region are placed on the deep N-well region such that, in the event that a high erase voltage (VERA) is applied to the memory cell region during an erase operation, the high erase voltage is applied to all terminals of the at least one low voltage resistor, thereby protecting the low voltage transistor by preventing it from experiencing a large voltage difference between its terminals.

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