Abstract:
A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.
Abstract:
An image sensor includes a comparator configured to compare a pixel signal with a ramp signal and generate a comparison signal and a counter configured to be reset by a counter reset value based on an offset of the comparator and to generate a digital pixel signal according to the comparison signal.
Abstract:
An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
Abstract:
An image sensor includes a pixel array, a column signal processor, and a column mismatch compensator. The pixel array outputs a pixel signal from each column line during a pixel measuring time, and outputs a reference signal during a reference measuring time. The column signal processor performs correlated double sampling (CDS) on the reference signal to generate a reference CDS signal, and performs CDS on the pixel signal to generate a pixel CDS signal. The column mismatch compensator compensates the pixel CDS signal based on the reference CDS signal.
Abstract:
An image sensor includes a pixel having first and second photodiodes, a storage capacitor, an overflow transistor, and a read circuit. The pixel is configured to output a first sub-output signal obtained by converting electric charge generated by the first photodiode during an exposure period with first conversion gain, output a second sub-output signal obtained by converting the electric charge generated by the first photodiode during the exposure period with second conversion gain, output a first reset signal corresponding to the first sub-output signal and a second reset signal corresponding to the second sub-output signal, output a third sub-output signal, which is obtained by converting a portion of electric charge generated by the second photodiode during the exposure period with third conversion gain, output a fourth sub-output signal, obtained by converting the electric charge generated by the second photodiode and stored in the storage capacitor during the exposure period, with fourth conversion gain, and output a third reset signal corresponding to the third sub-output signal and a fourth reset signal corresponding to the fourth sub-output signal.
Abstract:
An image sensor includes a pixel array and N analog-to-digital converters (ADCs). The pixel array includes N pixels arranged in each of a plurality of rows, and each of the N pixels include M photoelectric conversion elements. At least one of the N ADCs are shared by at least one of the M photoelectric conversion elements included in each of the N pixels.
Abstract:
An image sensor including: a first photodiode; a first circuit including an overflow transistor and a first transfer transistor connected to the first photodiode, a switch element connected to the first transfer transistor and a capacitor disposed between the first transfer transistor and the switch element, wherein the capacitor is a physical capacitor; a second photodiode; and a second circuit including a second transfer transistor connected to the second photodiode, a reset transistor connected to an output of the first circuit and a driving transistor connected to the second transfer transistor and the output of the first circuit.
Abstract:
A method of operating an image sensing device includes applying control voltages to a pixel array in accordance with a test mode and performing an analog-to-digital conversion of a column line voltage to obtain one or more digital codes. The one or more digital codes are evaluated to detect an operating error associated with the column line and/or corresponding analog to digital converter. In response to an operating error, pixel values may be replaced or averaged with nearby pixel outputs not affected by the operating error.
Abstract:
In one embodiment, an image sensor includes a pixel array including a plurality of pixels, an analog-to-digital converter configured to convert analog pixel signals output from the pixels into digital signals, a first cluster configured to store a first group of digital signals among the digital signals and to output first image data, a second cluster configured to store a second group of digital signals among the digital signals and to output second image data, and at least one cluster switch connected to the first cluster and the second cluster, a first channel, and a second channel. The image sensor is configured to transmit at least one among the first image data and the second image data to at least one among the first channel and the second channel based on an operation mode.