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公开(公告)号:US20190157406A1
公开(公告)日:2019-05-23
申请号:US16014496
申请日:2018-06-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Inchan HWANG , Heonjong SHIN , Sunghun JUNG , Doohyun LEE , Hwichan JUN , Hakyoon AHN
IPC: H01L29/417 , H01L29/423 , H01L29/45 , H01L27/092 , H01L21/285 , H01L29/06 , H01L29/66
Abstract: A semiconductor device is disclosed. The semiconductor device may include a substrate including a first active pattern, the first active pattern vertically protruding from a top surface of the substrate, a first source/drain pattern filling a first recess, which is formed in an upper portion of the first active pattern, a first metal silicide layer on the first source/drain pattern, the first metal silicide layer including a first portion and a second portion, which are located on a first surface of the first source/drain pattern, and a first contact in contact with the second portion of the first metal silicide layer. A thickness of the first portion may be different from a thickness of the second portion.
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公开(公告)号:US20210013206A1
公开(公告)日:2021-01-14
申请号:US17038435
申请日:2020-09-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: HeonJong SHIN , Sunghun JUNG , Minchan GWAK , Yongsik JEONG , Sangwon JEE , Sora YOU , Doohyun LEE
IPC: H01L27/092 , H01L29/78 , H01L29/66 , H01L21/8238 , H01L23/522 , H01L29/417
Abstract: A semiconductor device may include a substrate including an active pattern extending in a first direction, a gate electrode running across the active pattern and extending in a second direction intersecting the first direction, a source/drain pattern on the active pattern and adjacent to a side of the gate electrode, an active contact in a contact hole exposing the source/drain pattern, an insulating pattern filling a remaining space of the contact hole in which the active contact is provided, a first via on the active contact, and a second via on the gate electrode. The active contact may include a first segment that fills a lower portion of the contact hole and a second segment that vertically protrudes from the first segment. The first via is connected to the second segment. The insulating pattern is adjacent in the first direction to the second via.
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公开(公告)号:US20220149043A1
公开(公告)日:2022-05-12
申请号:US17582357
申请日:2022-01-24
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heonjong SHIN , Sunghun JUNG , Minchan GWAK , Yongsik JEONG , Sangwon JEE , Sora YOU , Doohyun LEE
IPC: H01L27/092 , H01L29/78 , H01L29/66 , H01L21/8238 , H01L23/522 , H01L29/417
Abstract: A semiconductor device may include a substrate including an active pattern extending in a first direction, a gate electrode running across the active pattern and extending in a second direction intersecting the first direction, a source/drain pattern on the active pattern and adjacent to a side of the gate electrode, an active contact in a contact hole exposing the source/drain pattern, an insulating pattern filling a remaining space of the contact hole in which the active contact is provided, a first via on the active contact, and a second via on the gate electrode. The active contact may include a first segment that fills a lower portion of the contact hole and a second segment that vertically protrudes from the first segment. The first via is connected to the second segment. The insulating pattern is adjacent in the first direction to the second via.
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公开(公告)号:US20200075595A1
公开(公告)日:2020-03-05
申请号:US16391757
申请日:2019-04-23
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heonjong SHIN , Sunghun JUNG , Minchan GWAK , Yongsik JEONG , Sangwon JEE , Sora YOU , Doohyun LEE
IPC: H01L27/092 , H01L29/78 , H01L29/66 , H01L21/8238 , H01L23/522 , H01L29/417
Abstract: A semiconductor device may include a substrate including an active pattern extending in a first direction, a gate electrode running across the active pattern and extending in a second direction intersecting the first direction, a source/drain pattern on the active pattern and adjacent to a side of the gate electrode, an active contact in a contact hole exposing the source/drain pattern, an insulating pattern filling a remaining space of the contact hole in which the active contact is provided, a first via on the active contact, and a second via on the gate electrode. The active contact may include a first segment that fills a lower portion of the contact hole and a second segment that vertically protrudes from the first segment. The first via is connected to the second segment. The insulating pattern is adjacent in the first direction to the second via.
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公开(公告)号:US20240255358A1
公开(公告)日:2024-08-01
申请号:US18584534
申请日:2024-02-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Sangmin LEE , Sungyong BANG , Sunghun JUNG , Jongwoo KIM , Hakryoul KIM , Mooyoung KIM
IPC: G01K7/42
CPC classification number: G01K7/42
Abstract: According to an embodiment, an electronic device includes: at least one first component and at least one second component arranged in an internal space of the electronic device wherein the first and second components have temperatures that vary differently depending on the operation of the electronic device, a first temperature sensor configured to measure the temperature of the at least one first component, a second temperature sensor configured to measure the temperature of the at least one second component, a memory, and at least one processor operatively connected to the at least one first component, the at least one second component, the first temperature sensor, the second temperature sensor, and the memory, wherein at least one processor is configured to: identify a prediction model related to prediction of the outside temperature stored in the memory, acquire a first temperature of the at least one first component through the first temperature sensor according to a specified period, acquire a second temperature of the at least one second component through the second temperature sensor according to a specified period, and predict the outside temperature corresponding to the acquired first temperature and the acquired second temperature based on the identified prediction model.
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公开(公告)号:US20210193808A1
公开(公告)日:2021-06-24
申请号:US17175850
申请日:2021-02-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Inchan HWANG , Heonjong SHIN , Sunghun JUNG , Doohyun LEE , Hwichan JUN , Hakyoon AHN
IPC: H01L29/417 , H01L29/423 , H01L29/45 , H01L21/285 , H01L29/06 , H01L27/092 , H01L29/08 , H01L21/8238 , H01L29/165 , H01L29/78
Abstract: A semiconductor device is disclosed. The semiconductor device may include a substrate including a first active pattern, the first active pattern vertically protruding from a top surface of the substrate, a first source/drain pattern filling a first recess, which is formed in an upper portion of the first active pattern, a first metal silicide layer on the first source/drain pattern, the first metal silicide layer including a first portion and a second portion, which are located on a first surface of the first source/drain pattern, and a first contact in contact with the second portion of the first metal silicide layer. A thickness of the first portion may be different from a thickness of the second portion.
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公开(公告)号:US20230189470A1
公开(公告)日:2023-06-15
申请号:US18108419
申请日:2023-02-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sungyong BANG , Sangmin LEE , Sunghun JUNG , Jongwoo KIM , Hakryoul KIM , Mooyoung KIM
IPC: H05K7/20 , G05B19/4155
CPC classification number: H05K7/20 , G05B19/4155 , G05B2219/50333
Abstract: An electronic device includes a sensor, a communication circuit, and a processor configured to learn a scenario based on use of the electronic device in a first temperature range, determine, using the communication circuit and/or the sensor, whether a place element of the electronic device is changed, start the scenario based on determining that the place element is changed, estimate an ambient temperature of the electronic device based on the scenario, and enter a second heating control mode at a second temperature different from a first heating control mode at a first temperature, based on the estimated ambient temperature being different from an internal temperature of the electronic device.
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公开(公告)号:US20210240156A1
公开(公告)日:2021-08-05
申请号:US17248677
申请日:2021-02-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Aditya JHAWAR , Aditi JAISWAL , Jaitirth Anthony JACOB , Nikhil SAHNI , Hakryoul KIM , Jongwoo KIM , Sungyong BANG , Sunghun JUNG , Suraj JHA , Vaisakh Punnekkattu CHIRAYIL SUDHEESH BABU , Renju Chirakarotu NAIR
IPC: G05B19/406 , G06N3/08
Abstract: Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.
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