公开(公告)号：US20230342603A1

公开(公告)日：2023-10-26

申请号：US18303976

申请日：2023-04-20

Applicant: Samsung Electronics Co., Ltd.

Inventor： Aditya JHAWAR ,  Rajesh Kumar PANDA ,  Nikhil SAHNI ,  Aarif ZAFAR ,  Renju Chirakarotu NAIR ,  Shubham JAIN ,  Umesh Murlidhar PATIL

IPC: G06N3/08

CPC classification number: G06N3/08

Abstract: A method and an electronic device for secure training of an artificial intelligence (AI) model are provided. The method includes determining, by the electronic device, a first set of layers from a base AI model for performing training in a secure mode, and determining, by the electronic device, a second set of layers other than the first set of layers in the base AI model, simultaneously training, by the electronic device, the first set of layers in the secure mode and the second set of layers in a non-secure mode, and generating, by the electronic device, the AI model by combining the trained first set of layers and the trained second set of layers in the secure mode.

公开(公告)号：US20240152283A1

公开(公告)日：2024-05-09

申请号：US18228354

申请日：2023-07-31

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Aarif ZAFAR ,  Renju Chirakarotu NAIR ,  Nikhil SAHNI ,  Sagar Mahesh MALIYE ,  Aditya JHAWAR ,  Rajesh Kumar PANDA

IPC: G06F3/06 ,  G06N5/04

CPC classification number: G06F3/062 ,  G06F3/0655 ,  G06F3/0673 ,  G06N5/04

Abstract: A method for performing an inference includes: detecting a context among at least one context associated with at least one application; triggering a model execution command to a smart agent of an electronic device, based on the detected context; loading a machine learning (ML) model into a secure storage of the electronic device, based on the detected context and the triggered model execution command; generating, using the loaded ML model, an inference, based on data associated with the detected context; and sharing the generated inference with each application of the at least one application that is registered for the detected context.

公开(公告)号：US20230012736A1

公开(公告)日：2023-01-19

申请号：US17859661

申请日：2022-07-07

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sharmila MANI ,  Shubham JAIN ,  Renju Chirakarotu NAIR ,  Nikhil SAHNI ,  Umesh Murlidhar PATIL ,  Balwant Singh SHEKHAWAT ,  Aditya JHAWAR

IPC: G06F21/62

Abstract: A method for securely sharing of data by an electronic device is provided. The method includes receiving, by the electronic device, data associated with the at least one application available at the electronic device and obtaining, by the electronic device, secured data by transforming the data associated with at least one application into an unrecognizable format using at least one conceal factor and at least one noise input. Further, the method includes extracting, by the electronic device, a plurality of features from the secured data, and sharing, by the electronic device, the plurality of features extracted from the secured data to a plurality of servers.

公开(公告)号：US20210240156A1

公开(公告)日：2021-08-05

申请号：US17248677

申请日：2021-02-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Aditya JHAWAR ,  Aditi JAISWAL ,  Jaitirth Anthony JACOB ,  Nikhil SAHNI ,  Hakryoul KIM ,  Jongwoo KIM ,  Sungyong BANG ,  Sunghun JUNG ,  Suraj JHA ,  Vaisakh Punnekkattu CHIRAYIL SUDHEESH BABU ,  Renju Chirakarotu NAIR

IPC: G05B19/406 ,  G06N3/08

Abstract: Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.