公开(公告)号：US20210240156A1

公开(公告)日：2021-08-05

申请号：US17248677

申请日：2021-02-02

Applicant: Samsung Electronics Co., Ltd.

Inventor： Aditya JHAWAR ,  Aditi JAISWAL ,  Jaitirth Anthony JACOB ,  Nikhil SAHNI ,  Hakryoul KIM ,  Jongwoo KIM ,  Sungyong BANG ,  Sunghun JUNG ,  Suraj JHA ,  Vaisakh Punnekkattu CHIRAYIL SUDHEESH BABU ,  Renju Chirakarotu NAIR

IPC: G05B19/406 ,  G06N3/08

Abstract: Methods and systems for ascertaining factors contributing to the temperature of a device. A method includes monitoring a plurality of parameters that are contributing to a temperature of the device. The method also includes estimating a degree of contribution of internal factors to the temperature of the device based on the monitored plurality of parameters and a battery temperature of a battery of the device. The method further includes estimating a degree of contribution of external factors to the temperature of the device, based on the monitored plurality of parameters and a battery temperature of a battery of the device. A neural network can be used for estimating the temperature of the ambience of the device and the impacts of internal and external factors on temperature of the device.