SEMICONDUCTOR PACKAGE
    1.
    发明申请

    公开(公告)号:US20200312783A1

    公开(公告)日:2020-10-01

    申请号:US16668289

    申请日:2019-10-30

    Abstract: A semiconductor package including a first semiconductor chip having an upper surface, a lower surface that is opposite to the upper surface, and a sidewall between the upper surface and the lower surface; a capping insulation layer covering the upper surface and the sidewall of the first semiconductor chip; and a shielding layer on the capping insulation layer, wherein a lower portion of the capping insulation layer includes a laterally protruding capping protrusion contacting a lower surface of the shielding layer.

    METHOD OF FABRICATING A SEMICONDUCTOR DEVICE
    2.
    发明申请
    METHOD OF FABRICATING A SEMICONDUCTOR DEVICE 有权
    制造半导体器件的方法

    公开(公告)号:US20130280881A1

    公开(公告)日:2013-10-24

    申请号:US13923470

    申请日:2013-06-21

    Abstract: A semiconductor device including a substrate; a bottom electrode on the substrate; a first dielectric layer on the bottom electrode, the first dielectric layer including a first metal oxide including at least one of Hf, Al, Zr, La, Ba, Sr, Ti, and Pb; a second dielectric layer on the first dielectric layer, the second dielectric layer including a second metal oxide including at least one of Hf, Al, Zr, La, Ba, Sr, Ti, and Pb, wherein the first metal oxide and the second metal oxide are different materials; a third dielectric layer on the second dielectric layer, the third dielectric layer including a metal carbon oxynitride; and an upper electrode on the third dielectric layer.

    Abstract translation: 一种包括衬底的半导体器件; 基底上的底电极; 所述第一电介质层包括包含Hf,Al,Zr,La,Ba,Sr,Ti和Pb中的至少一种的第一金属氧化物; 在所述第一电介质层上的第二电介质层,所述第二电介质层包括包含Hf,Al,Zr,La,Ba,Sr,Ti和Pb中的至少一种的第二金属氧化物,其中所述第一金属氧化物和所述第二金属 氧化物是不同的材料; 第二电介质层上的第三电介质层,第三电介质层包括金属碳氮氧化物; 以及第三电介质层上的上电极。

    EARSET AND EARSET OPERATION METHOD
    3.
    发明申请

    公开(公告)号:US20170230747A1

    公开(公告)日:2017-08-10

    申请号:US15328230

    申请日:2014-12-17

    Inventor: Min-Woo SONG

    Abstract: An earset, according to various examples, comprises: an electronic device connection unit having a microphone terminal connected to a microphone of the earset, an audio ground terminal connected to an audio ground of the earset, a right speaker terminal, and a left speaker terminal; and a switch for allowing, according to a voltage of the microphone terminal, a right speaker and a left speaker of the earset to be mutually connected with one of the right speaker terminal and the left speaker terminal, and the other one of the right speaker terminal and the left speaker terminal to be connected with a shield ground of the earset. Other examples are possible.

    ELECTRONIC DEVICE AND METHOD FOR DETERMINING WATERPROOFING OF THE ELECTRONIC DEVICE
    4.
    发明申请
    ELECTRONIC DEVICE AND METHOD FOR DETERMINING WATERPROOFING OF THE ELECTRONIC DEVICE 审中-公开
    用于确定电子设备的防水的电子设备和方法

    公开(公告)号:US20160116443A1

    公开(公告)日:2016-04-28

    申请号:US14922687

    申请日:2015-10-26

    CPC classification number: G01H13/00 G01M3/24

    Abstract: An electronic device is provided. The electronic device includes a speaker configured to output a reference signal in the form of a sound and a processor configured to calculate a lowest resonant frequency from a signal sensed by feeding back the reference signal transmitted to the speaker and to determine whether the electronic device is waterproofed based on the calculated lowest resonant frequency.

    Abstract translation: 提供电子设备。 该电子设备包括:扬声器,被配置为输出声音形式的参考信号;以及处理器,被配置为通过反馈传输到扬声器的参考信号而感测到的信号来计算最低谐振频率,并且确定电子设备是否是 基于计算出的最低谐振频率进行防水。

    SEMICONDUCTOR PACKAGE
    5.
    发明申请

    公开(公告)号:US20220199549A1

    公开(公告)日:2022-06-23

    申请号:US17693545

    申请日:2022-03-14

    Abstract: A semiconductor package including a first semiconductor chip having an upper surface, a lower surface that is opposite to the upper surface, and a sidewall between the upper surface and the lower surface; a capping insulation layer covering the upper surface and the sidewall of the first semiconductor chip; and a shielding layer on the capping insulation layer, wherein a lower portion of the capping insulation layer includes a laterally protruding capping protrusion contacting a lower surface of the shielding layer.

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