公开(公告)号：US10608615B2

公开(公告)日：2020-03-31

申请号：US15417339

申请日：2017-01-27

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jong Woo Kim ,  Ju Hyun Kang ,  Min Su Kim ,  Ka Ram Lee

IPC: H03K3/012 ,  H03K3/3562

Abstract: A semiconductor device may include a master latch that stores an input data signal, using a local power supply voltage and a clock signal, and outputs the input data signal to a first output signal; a slave latch that stores the first output signal, using a global power supply voltage, the clock signal and a retention signal, and outputs a second output signal; a first logic gate that receives input of one signal and another signal of the retention signal, the clock signal and the reset signal, and outputs a first control signal generated by performing a first logical operation; and a second logic gate that receives input of the rest of the retention signal, the clock signal and the reset signal, and the first control signal, and performs a second logical operation to at least one of the master latch and the slave latch.

公开(公告)号：US09735070B2

公开(公告)日：2017-08-15

申请号：US15096600

申请日：2016-04-12

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dae Seo Park ,  Oh Seok Kwon ,  Ka Ram Lee ,  Jong Tae Kim

IPC: H01L21/66 ,  H04N3/14 ,  H04N5/225 ,  H01L33/48

CPC classification number: H01L22/26 ,  H01L25/0753 ,  H01L33/486 ,  H01L2933/0033 ,  H04N3/1587 ,  H04N5/2253 ,  H04N5/2256

Abstract: Manufacturing a light source module may include mounting light emitting devices on substrates on an upper surface of a carrier, mounting optical devices to cover the light emitting devices, and inspecting the light emitting devices and the optical devices based on selectively capturing images thereof. Images may be captured based on controlling a light source module scanner assembly on the carrier. The substrates may extend in a first direction and may be spaced apart in a second direction. Controlling the light source module scanner assembly may include moving the light source module scanner assembly along a selected direction to position the light source module scanner assembly on at least one of the light emitting devices and the optical devices. The direction may be selected based on the quantity of substrates and the quantity of light emitting devices and optical devices on each of the substrates.

公开(公告)号：US09546926B2

公开(公告)日：2017-01-17

申请号：US14581147

申请日：2014-12-23

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Won Soo Ji ,  Oh Seok Kwon ,  Dae Seo Park ,  Ka Ram Lee

IPC: G01J1/00 ,  G01M11/02 ,  G01J1/42

CPC classification number: G01M11/0278 ,  G01J1/42 ,  G01J2001/4252 ,  G01M11/0257

Abstract: A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.

Abstract translation: 用于检查光源模块的缺陷的方法包括：准备安装有发光装置和覆盖发光装置的透镜的基板。 向发光器件施加电流以使发光器件导通。 透镜在开启发光器件时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称，并将计算出的中心对称性与参考值进行比较，以确定是否发生不对称发光分布。 另外提供用于检查光源模块的各种其它方法和装置。