SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20230067356A1

    公开(公告)日:2023-03-02

    申请号:US17853116

    申请日:2022-06-29

    Abstract: A semiconductor package capable of reducing or preventing cracks from occurring in a conductive bump and a method for manufacturing the same. The semiconductor package includes a semiconductor chip; a first conductive bump; a first re-distribution layer which is provided between the semiconductor chip and the first conductive bump and electrically connects the semiconductor chip and the first conductive bump; and a buffer structure which formed to fill up a space between a side surface of the first conductive bump and one surface of the first re-distribution layer, in which the buffer structure includes a plurality of pores.

    DEVICE FOR CONTROLLING PERFORMANCE OF THE DEVICE BASED ON FLUCTUATIONS IN INTERNAL TEMPERATURE AND METHOD THEREOF
    5.
    发明申请
    DEVICE FOR CONTROLLING PERFORMANCE OF THE DEVICE BASED ON FLUCTUATIONS IN INTERNAL TEMPERATURE AND METHOD THEREOF 审中-公开
    用于控制基于内部温度波动的装置的性能的装置及其方法

    公开(公告)号:US20160062326A1

    公开(公告)日:2016-03-03

    申请号:US14840983

    申请日:2015-08-31

    Abstract: An electronic device, a method of controlling performance of the electronic device, and a chipset thereof is provided. The electronic device includes a sensor module configured to measure an internal temperature of the electronic device, a surface temperature predicting module to predict a surface temperature of the electronic device using the measured internal temperature, and a processor to control at least a portion of performance of the electronic device based on the predicted surface temperature. The method includes measuring an internal temperature of the electronic device; predicting a surface temperature of the electronic device using the measured internal temperature; and controlling at least a portion of performance of the electronic device based on the predicted surface temperature.

    Abstract translation: 提供电子设备,电子设备的性能控制方法及其芯片组。 电子设备包括被配置为测量电子设备的内部温度的传感器模块,表面温度预测模块,用于使用所测量的内部温度来预测电子设备的表面温度;以及处理器,用于控制电子设备的性能的至少一部分 电子装置基于预测的表面温度。 该方法包括测量电子设备的内部温度; 使用测量的内部温度预测电子设备的表面温度; 以及基于预测的表面温度来控制电子设备的至少一部分性能。

Patent Agency Ranking