公开(公告)号：US10311615B2

公开(公告)日：2019-06-04

申请号：US15622723

申请日：2017-06-14

Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION

Inventor： Jae-woo Ko ,  Byoung-ho Lee ,  Byung-hyo Lee ,  Ki-seung Bang ,  Chang-won Jang

IPC: G06T19/00 ,  G06T5/00 ,  G02B27/01 ,  G02B27/28 ,  H04N13/337 ,  H04N13/341 ,  G06T11/60 ,  G06T5/20

Abstract: A device and method for providing an augmented reality (AR) image are provided. The device includes a display configured to alternately display a first image including an object at an object position and a second image including a mask for blocking transmission of light incident on the display at the object position; a processor configured to determine a time period and control the display to alternately display the first image and the second image during the time period; and a polarization switch configured alternately polarize the light incident on the display at a switching period determined based on the time period.

公开(公告)号：US09651918B2

公开(公告)日：2017-05-16

申请号：US14031193

申请日：2013-09-19

Applicant: SAMSUNG ELECTRONICS CO., LTD. ,  SEOUL NATIONAL UNIVERSITY R&DB FOUNDATION

Inventor： Kyoung-seok Pyun ,  Byoung-ho Lee ,  Sun-il Kim ,  Chil-sung Choi ,  Soon-gi Park ,  Jung-kwuen An ,  Kee-hoon Hong ,  Ji-woon Yeom ,  Jong-hyun Kim

IPC: G03H1/26 ,  G03H1/04

CPC classification number: G03H1/0476 ,  G03H2001/048

Abstract: Provided is a holographic recording method in which an interference fringe between a reference beam and a signal beam, modulated according to information regarding a plurality of hologram pixels, is recorded on a holographic recording medium, the holographic recording method including multiplexing-recording the interference fringe of the plurality of hologram pixels such that at least a part of the interference fringe recorded of neighboring hologram pixels of the plurality of hologram pixels is overlapped.

公开(公告)号：US20140307052A1

公开(公告)日：2014-10-16

申请号：US14248684

申请日：2014-04-09

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jeong-ho Ahn ,  Jong-cheon Sun ,  Dong-ryul Lee ,  Byoung-ho Lee ,  Dong-chul Ihm ,  Soo-bok Chin

IPC: G01N21/95 ,  G02B21/36 ,  G06T7/00 ,  G01N23/22 ,  G01N23/02

CPC classification number: G01N21/9505 ,  G01N23/2251 ,  G02B21/367 ,  G06T7/001 ,  G06T2207/10016 ,  G06T2207/10056 ,  G06T2207/10061 ,  G06T2207/30148

Abstract: Apparatuses and methods for extracting defect depth information and methods of improving semiconductor device manufacturing processes using defect depth information are provided. The apparatuses may include an inspection assembly configured to obtain a plurality of optical images of a portion of an inspection object including a defect along a depth direction and a processor circuit configured to generate defect data using the plurality of optical images and provide defect depth information by comparing the defect data with comparison data in a library database.

Abstract translation: 提供了使用缺陷深度信息提取缺陷深度信息的装置和方法以及改进半导体器件制造工艺的方法。 所述装置可以包括检查组件，其被配置为获得包括沿着深度方向的缺陷的检查对象的一部分的多个光学图像，以及处理器电路，被配置为使用所述多个光学图像生成缺陷数据，并且通过 将缺陷数据与库数据库中的比较数据进行比较。