公开(公告)号：US12262581B2

公开(公告)日：2025-03-25

申请号：US17564854

申请日：2021-12-29

Applicant: Samsung Display Co., Ltd.

Inventor： Taejin Hwang ,  Hyeongmin Ahn

IPC: H01L51/52 ,  G01N21/95 ,  H01L27/32 ,  H01L51/00 ,  H10K50/84 ,  H10K59/131 ,  H10K77/10 ,  H10K102/00

Abstract: A display device includes a substrate bendable about a bending line, a display element layer above the substrate, a protection film below the substrate, and a separator between the substrate and the protection film and corresponding to the bending line.

公开(公告)号：US20220399519A1

公开(公告)日：2022-12-15

申请号：US17564854

申请日：2021-12-29

Applicant: Samsung Display Co., Ltd.

Inventor： Taejin Hwang ,  Hyeongmin Ahn

IPC: H01L51/52 ,  G01N21/95 ,  H01L51/00 ,  H01L27/32

Abstract: A display device includes a substrate bendable about a bending line, a display element layer above the substrate, a protection film below the substrate, and a separator between the substrate and the protection film and corresponding to the bending line.

公开(公告)号：US12217415B2

公开(公告)日：2025-02-04

申请号：US17859358

申请日：2022-07-07

Applicant: Samsung Display Co., Ltd.

Inventor： Tae-Jin Hwang ,  Hyeongmin Ahn

IPC: G06T7/00 ,  G06T5/50 ,  G06T5/70 ,  G06T5/80 ,  G06F3/041

Abstract: A method of manufacturing a display device includes preparing a cover substrate assembly including a cover substrate, a protective film attached to a lower surface of the cover substrate, and an inspection pattern disposed between the cover substrate and the protective film, obtaining a first image by imaging the inspection pattern through an upper surface of the cover substrate, obtaining noise data by comparing a reference image of the inspection pattern with the first image, obtaining a second image by imaging the cover substrate assembly, obtaining a corrected image of the second image by reflecting the noise data in the second image, and detecting a defect of the cover substrate based on the corrected image of the second image.

公开(公告)号：US20230194437A1

公开(公告)日：2023-06-22

申请号：US18071749

申请日：2022-11-30

Applicant: Samsung Display Co., LTD.

Inventor： Alexander Voronov ,  Jooseob Ahn ,  Hyeonsuk Guak ,  Kihun Kim ,  Jekil Ryu ,  Hyeongmin Ahn

IPC: G01N21/94 ,  G01N21/956 ,  G06T7/521 ,  G06T7/55

CPC classification number: G01N21/94 ,  G01N21/956 ,  G06T7/521 ,  G06T7/55 ,  G01N2021/9513

Abstract: An inspection method includes irradiating a laser to an inspection target, reflecting a first emitted laser from a transmission layer included in the inspection target, reflecting a second emitted laser from a scattering layer included in the inspection target, detecting a reference image from the second emitted laser; and measuring a separation distance obtained from the first emitted laser, based on the reference image.