公开(公告)号：US09391641B2

公开(公告)日：2016-07-12

申请号：US14219764

申请日：2014-03-19

申请人： SK Hynix Inc.

发明人： Arunkumar Subramanian ,  Naveen Kumar ,  Zheng Wu ,  Lingqi Zeng ,  Jason Bellorado

IPC分类号： H03M13/00 ,  H03M13/15 ,  H03M13/29

CPC分类号： H03M13/159 ,  H03M13/1515 ,  H03M13/152 ,  H03M13/153 ,  H03M13/1545 ,  H03M13/2963 ,  H03M13/6505

摘要： A set of one or more component syndromes associated with a turbo product code (TPC) codeword is obtained from a component syndrome buffer. Component decoding is performed on the set of one or more component syndromes.

摘要翻译： 从组件综合征缓冲器获得与turbo产品代码（TPC）码字相关联的一个或多个组件综合征的集合。 对一个或多个组件综合征的集合执行组件解码。

公开(公告)号：US09727249B1

公开(公告)日：2017-08-08

申请号：US14543333

申请日：2014-11-17

申请人： SK Hynix Inc.

发明人： Arunkumar Subramanian ,  Zheng Wu ,  Suneel Kumar Indupuru ,  Jason Bellorado

IPC分类号： G06F12/00 ,  G06F3/06

CPC分类号： G06F3/061 ,  G06F3/064 ,  G06F3/0679 ,  G06F12/0246 ,  G06F12/0871 ,  G06F2212/1016 ,  G06F2212/222 ,  G06F2212/312 ,  G06F2212/7201 ,  G06F2212/7202 ,  G06F2212/7205 ,  G11C2211/5641

摘要： An instruction to write data to a write logical address is received where the write logical address is a member of a group of one or more logical addresses. It is determined if data associated with any of the logical addresses in the group of logical addresses has been written to any of a plurality of open groups of locations. If so, the data is written to the open group of locations to which data from the group of logical addresses has already been written to. If not, an open group of locations to write to is selected from the plurality of open groups of locations.

公开(公告)号：US09514845B1

公开(公告)日：2016-12-06

申请号：US14534638

申请日：2014-11-06

申请人： SK Hynix Inc.

发明人： Zheng Wu ,  Jason Bellorado ,  Arunkumar Subramanian

IPC分类号： G06F11/00 ,  G11C29/42 ,  G11C29/44 ,  G06F11/10

CPC分类号： G11C29/42 ,  G06F11/1004 ,  G06F11/1048 ,  G11C29/44

摘要： A group of one or more solid state storage cells is programmed. A predetermined amount of time after the group of solid state storage cells is programmed, the group of solid state storage cells is read to obtain read data. Error correction decoding is performed on the read data and the group of solid state storage cells is assessed for wear related degradation based at least in part on the error correction decoding.

摘要翻译： 一组一个或多个固态存储单元被编程。 在组态固态存储单元被编程之后的预定时间量内，读取固态存储单元组以获得读取数据。 对读取的数据执行纠错解码，并且至少部分地基于纠错解码来评估固态存储单元组的磨损相关的退化。