Word line driver circuits for memory devices and methods of operating same

    公开(公告)号:US11450376B2

    公开(公告)日:2022-09-20

    申请号:US17038488

    申请日:2020-09-30

    Abstract: A memory device includes a word line driver circuit, which can advantageously reduce gate stress on a transistor using a lower high voltage that varies with a command, and an operating method of the memory device. The memory device includes a plurality of memory blocks, provides a high voltage or the lower high voltage to a variable high voltage line in response to a block select signal, and changes a level of the lower high voltage to a low voltage level, a medium voltage level, or a high voltage level based on the command. The memory device applies the lower high voltage to gates of P-type metal oxide semiconductor (PMOS) transistors connected to a word line driving signal, which drives word lines of non-selected memory blocks among the plurality of memory blocks.

    Word line driver circuits for memory devices and methods of operating same

    公开(公告)号:US12198749B2

    公开(公告)日:2025-01-14

    申请号:US17819289

    申请日:2022-08-11

    Abstract: A memory device includes a word line driver circuit, which can advantageously reduce gate stress on a transistor using a lower high voltage that varies with a command, and an operating method of the memory device. The memory device includes a plurality of memory blocks, provides a high voltage or the lower high voltage to a variable high voltage line in response to a block select signal, and changes a level of the lower high voltage to a low voltage level, a medium voltage level, or a high voltage level based on the command. The memory device applies the lower high voltage to gates of P-type metal oxide semiconductor (PMOS) transistors connected to a word line driving signal, which drives word lines of non-selected memory blocks among the plurality of memory blocks.

    SEMICONDUCTOR DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAME

    公开(公告)号:US20240098990A1

    公开(公告)日:2024-03-21

    申请号:US18127404

    申请日:2023-03-28

    CPC classification number: H10B41/27 H01L23/5283 H10B41/10 H10B41/35

    Abstract: A semiconductor device includes a gate stack structure including insulating patterns and conductive patterns which are alternately stacked, a first separation structure penetrating the gate stack structure, a second separation structure penetrating the gate stack structure and being adjacent to the first separation structure, first and second memory channel structures penetrating the gate stack structure and disposed between the first separation structure and the second separation structure, a first bit line overlapping with the first and second memory channel structures and electrically connected to the first memory channel structure, and a second bit line overlapping with the first and second memory channel structures and the first bit line and electrically connected to the second memory channel structure.

    WORD LINE DRIVER CIRCUITS FOR MEMORY DEVICES AND METHODS OF OPERATING SAME

    公开(公告)号:US20220383932A1

    公开(公告)日:2022-12-01

    申请号:US17819289

    申请日:2022-08-11

    Abstract: A memory device includes a word line driver circuit, which can advantageously reduce gate stress on a transistor using a lower high voltage that varies with a command, and an operating method of the memory device. The memory device includes a plurality of memory blocks, provides a high voltage or the lower high voltage to a variable high voltage line in response to a block select signal, and changes a level of the lower high voltage to a low voltage level, a medium voltage level, or a high voltage level based on the command. The memory device applies the lower high voltage to gates of P-type metal oxide semiconductor (PMOS) transistors connected to a word line driving signal, which drives word lines of non-selected memory blocks among the plurality of memory blocks.

    CHIP-ON-FILM PACKAGE
    9.
    发明申请

    公开(公告)号:US20250038064A1

    公开(公告)日:2025-01-30

    申请号:US18444477

    申请日:2024-02-16

    Abstract: The present disclosure relates to chip-on-film packages. An example chip-on-film package comprises a base film including a first surface and a second surface opposite to the first surface. The base film includes a protection layer adjacent to the first surface, a film substrate adjacent to the second surface, a plurality of lead lines between the film substrate and the protection layer, and a bonding layer between the plurality of lead lines and the protection layer. The chip-on-film package includes a semiconductor chip adjacent to the first surface, and a mold layer that covers a top surface and a lateral surface of the semiconductor chip. The first surface includes a circuit surface on which the semiconductor chip is disposed and a thermal conductive surface that faces the circuit surface when the base film is bent. The thermal conductive surface is in direct contact with a top surface of the mold layer.

    FILM PACKAGE
    10.
    发明申请

    公开(公告)号:US20250022998A1

    公开(公告)日:2025-01-16

    申请号:US18583947

    申请日:2024-02-22

    Abstract: A film package includes a film substrate, vias penetrating through the film substrate, interconnection patterns on the film substrate, and a semiconductor chip electrically connected to at least one of the interconnection patterns and to the vias, wherein the interconnection patterns include input patterns, first output patterns, and second output patterns, the film package includes input pads on a surface of the film substrate, and the input patterns extend from the input pads, the film package includes first output pads positioned toward a first edge of the film substrate on a first surface of the film substrate, and the first output patterns extend from the first output pads, and the film package includes second output pads positioned toward a second edge of the film substrate on a second surface of the film substrate opposite to the first surface, and the second output patterns extend from the second output pads.

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