-
公开(公告)号:US07816711B2
公开(公告)日:2010-10-19
申请号:US11824088
申请日:2007-06-29
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L31/062
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
-
公开(公告)号:US20080067565A1
公开(公告)日:2008-03-20
申请号:US11981002
申请日:2007-10-30
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L27/146
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
-
公开(公告)号:US20050116251A1
公开(公告)日:2005-06-02
申请号:US10979707
申请日:2004-11-02
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L27/14 , H01L27/146 , H01L31/10 , H04N5/335 , H04N5/361 , H04N5/369 , H04N5/374 , H01L29/45
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
摘要翻译: 提供了一种固态成像装置,其具有为每个像素实现良好接触的布置。 在固态成像装置中,在光电转换部的激活区域形成阱接触部。 阱接触部分固定在其中以预定电位设置像素的光电转换部分和晶体管的阱。
-
公开(公告)号:US07485903B2
公开(公告)日:2009-02-03
申请号:US10979707
申请日:2004-11-02
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L27/148
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
摘要翻译: 提供了一种固态成像装置,其具有为每个像素实现良好接触的布置。 在固态成像装置中,在光电转换部的激活区域形成阱接触部。 阱接触部分固定在其中以预定电位设置像素的光电转换部分和晶体管的阱。
-
公开(公告)号:US20070177041A1
公开(公告)日:2007-08-02
申请号:US11728140
申请日:2007-03-23
申请人: Ryoji Suzuki , Takahisa Ueno , Keiji Mabuchi
发明人: Ryoji Suzuki , Takahisa Ueno , Keiji Mabuchi
IPC分类号: H04N5/335
CPC分类号: H04N5/3575 , H01L27/14612 , H04N5/357 , H04N5/374
摘要: Each unit pixel includes a photodiode, a reading selection transistor, a reading transistor, an amplifying transistor, a reset transistor, and a horizontal selection transistor, and thus a MOS image sensor of a dot-sequential reading 5-Tr type is formed. The reading selection transistor and the reading transistor are formed with a two-layer gate structure, and gate potential of the reading selection transistor and the reading transistor is set to a negative potential. Thereby, a lower layer of a gate region of the reading transistor and the reading selection transistor is controlled to a negative potential. Thus, depletion in the lower layer region is suppressed to reduce leakage current.
摘要翻译: 每个单位像素包括光电二极管,读选择晶体管,读晶体管,放大晶体管,复位晶体管和水平选择晶体管,因此形成点序读取5-Tr型的MOS图像传感器。 读取选择晶体管和读取晶体管形成为双层栅极结构,读取选择晶体管和读取晶体管的栅极电位被设置为负电位。 由此,读取晶体管的栅极区域的下层和读取选择晶体管被控制为负电位。 因此,抑制下层区域的耗尽以减少漏电流。
-
公开(公告)号:US07209171B2
公开(公告)日:2007-04-24
申请号:US10286313
申请日:2002-11-01
申请人: Ryoji Suzuki , Takahisa Ueno , Keiji Mabuchi
发明人: Ryoji Suzuki , Takahisa Ueno , Keiji Mabuchi
IPC分类号: H04N3/14 , H04N9/64 , H01L27/148 , H01L31/062
CPC分类号: H04N5/3575 , H01L27/14612 , H04N5/357 , H04N5/374
摘要: Each unit pixel includes a photodiode, a reading selection transistor, a reading transistor, an amplifying transistor, a reset transistor, and a horizontal selection transistor, and thus a MOS image sensor of a dot-sequential reading 5-Tr type is formed. The reading selection transistor and the reading transistor are formed with a two-layer gate structure, and gate potential of the reading selection transistor and the reading transistor is set to a negative potential. Thereby, a lower layer of a gate region of the reading transistor and the reading selection transistor is controlled to a negative potential. Thus, depletion in the lower layer region is suppressed to reduce leakage current.
-
公开(公告)号:US06423993B1
公开(公告)日:2002-07-23
申请号:US09499449
申请日:2000-02-07
申请人: Ryoji Suzuki , Takahisa Ueno , Hirofumi Sumi , Keiji Mabuchi
发明人: Ryoji Suzuki , Takahisa Ueno , Hirofumi Sumi , Keiji Mabuchi
IPC分类号: H01L31062
CPC分类号: H01L27/1463 , H01L27/14603 , H01L27/14609 , H01L27/14643 , H01L27/14689
摘要: A solid-state image-sensing device has pn-junction sensor parts isolated corresponding to pixels by a device isolation layer. The solid-state image-sensing device includes a first-conductivity-type second semiconductor well region formed between a first-conductivity-type first semiconductor well region and the device isolation layer. When the device is operating, a depletion layer of each sensor part spreads to the first semiconductor well region, which is beneath each of the sensor parts.
摘要翻译: 固态图像感测装置具有通过器件隔离层对应于像素的pn结传感器部分。 固体摄像装置包括形成在第一导电型第一半导体阱区域和器件隔离层之间的第一导电型第二半导体阱区域。 当设备运行时,每个传感器部分的耗尽层扩散到位于每个传感器部件下方的第一半导体阱区域。
-
公开(公告)号:US20080210947A1
公开(公告)日:2008-09-04
申请号:US11824088
申请日:2007-06-29
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Testuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L27/14
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
摘要翻译: 提供了一种固态成像装置,其具有为每个像素实现良好接触的布置。 在固态成像装置中,在光电转换部的激活区域形成阱接触部。 阱接触部分固定在其中以预定电位设置像素的光电转换部分和晶体管的阱。
-
公开(公告)号:US06417023B2
公开(公告)日:2002-07-09
申请号:US09799995
申请日:2001-03-06
申请人: Ryoji Suzuki , Takahisa Ueno , Hirofumi Sumi , Keiji Mabuchi
发明人: Ryoji Suzuki , Takahisa Ueno , Hirofumi Sumi , Keiji Mabuchi
IPC分类号: H01L2100
CPC分类号: H01L27/1463 , H01L27/14603 , H01L27/14609 , H01L27/14643 , H01L27/14689
摘要: A solid-state image-sensing device has pn-junction sensor parts isolated corresponding to pixels by a device isolation layer. The solid-state image-sensing device includes a first-conductivity-type second semiconductor well region formed between a first-conductivity-type first semiconductor well region and the device isolation layer. When the device is operating, a depletion layer of each sensor part spreads to the first semiconductor well region, which is beneath each of the sensor parts.
摘要翻译: 固态图像感测装置具有通过器件隔离层对应于像素的pn结传感器部分。 固体摄像装置包括形成在第一导电型第一半导体阱区域和器件隔离层之间的第一导电型第二半导体阱区域。 当设备运行时,每个传感器部分的耗尽层扩散到位于每个传感器部件下方的第一半导体阱区域。
-
公开(公告)号:USRE45891E1
公开(公告)日:2016-02-16
申请号:US13631397
申请日:2012-09-28
申请人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Tetsuya Iizuka , Takahisa Ueno , Tsutomu Haruta
发明人: Takashi Abe , Ryoji Suzuki , Keiji Mabuchi , Tetsuya Iizuka , Takahisa Ueno , Tsutomu Haruta
IPC分类号: H01L31/062 , H01L27/146
CPC分类号: H01L27/14603 , H01L27/14609 , H01L27/14643
摘要: A solid-state imaging device having an arrangement in which well contact is achieved for each pixel is provided. In the solid-state imaging device, a well contact part is formed in an activation region of a photoelectric conversion portion. The well contact part fixes a well in which the photoelectric conversion portion and transistors of the pixel are provided at a predetermined potential.
摘要翻译: 提供了一种固态成像装置,其具有为每个像素实现良好接触的布置。 在固态成像装置中,在光电转换部的激活区域形成阱接触部。 阱接触部分固定在其中以预定电位设置像素的光电转换部分和晶体管的阱。
-
-
-
-
-
-
-
-
-