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    SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
    1.
    发明申请
    SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD 审中-公开

    公开(公告)号：US20190074829A1

    公开(公告)日：2019-03-07

    申请号：US16045016

    申请日：2018-07-25

    Applicant: RENESAS ELECTRONICS CORPORATION

    Inventor： Kazuki FUKUOKA ,  Toshifumi UEMURA ,  Yuko KITAJI

    IPC: H03K17/22 ,  G05F3/24

    Abstract: There is a need to provide a semiconductor device, a semiconductor system, and a semiconductor device manufacturing method capable of accurately monitoring a minimum operating voltage for a monitoring-targeted circuit. A monitor portion of a semiconductor system according to one embodiment includes a voltage monitor and a delay monitor. The voltage monitor is driven by power-supply voltage SVCC different from power-supply voltage VDD supplied to an internal circuit as a monitoring-targeted circuit and monitors power-supply voltage VDD. The delay monitor is driven by power-supply voltage VDD and monitors signal propagation time for a critical path in the internal circuit. The delay monitor is configured so that a largest on-resistance of on-resistances for a plurality of transistors configuring the delay monitor is smaller than a largest on-resistance of on-resistances for a plurality of transistors configuring the internal circuit.

    SEMICONDUCTOR DEVICE
    4.
    发明申请
    SEMICONDUCTOR DEVICE 审中-公开
    半导体器件

    公开(公告)号：US20170075404A1

    公开(公告)日：2017-03-16

    申请号：US15224380

    申请日：2016-07-29

    Applicant: Renesas Electronics Corporation

    Inventor： Yuko KITAJI ,  Kazuki FUKUOKA ,  Ryo MORI ,  Toshifumi UEMURA

    IPC: G06F1/32

    CPC classification number: G06F1/305 ,  G06F1/10 ,  G06F1/32 ,  G06F1/3237

    Abstract: There is provided a semiconductor device that can follow a fast voltage change such as a large voltage drop occurring at the time of rapid load fluctuation. The semiconductor device includes a voltage sensor which monitors a power supply voltage at a sampling speed higher than the assumed frequency of power supply voltage fluctuation and outputs a voltage code value, a voltage drop determination circuit which determines, from the voltage code value, that a voltage drop causing a malfunction of a system occurs, and outputs a clock stop signal, and a clock control circuit which controls clock stop, restart, and frequency change.

    Abstract translation: 提供了可以跟随快速电压变化的半导体器件，例如在快速负载波动时发生的大的电压降。 半导体装置包括：电压传感器，其以比假想电源电压波动的频率高的采样速度监视电源电压，并输出电压代码值;电压降判定电路，根据电压代码值确定： 产生导致系统故障的电压降，并输出时钟停止信号，以及控制时钟停止，重启和频率变化的时钟控制电路。

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