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13 条记录 (耗时 0.017 秒)

    Semiconductor Device
    1.
    发明申请
    Semiconductor Device 审中-公开

    公开(公告)号：US20180323797A1

    公开(公告)日：2018-11-08

    申请号：US16031872

    申请日：2018-07-10

    申请人： Renesas Electronics Corporation

    发明人： Kazuaki KUROOKA ,  Yoshihiro FUNATO

    IPC分类号： H03M1/48 ,  H03M1/08 ,  H03M1/64

    CPC分类号： H03M1/485 ,  H03M1/0872 ,  H03M1/645

    摘要： In a semiconductor device, a sine wave signal is input to a first input part and a cosine wave signal is input to a second input part. A multiplexer alternately selects one of the sine wave signal and the cosine wave signal. An analog to digital converter converts the output signal of the multiplexer into a digital value. A switching circuit is coupled between at least one of the first and second input parts and the multiplexer. The switching circuit is configured to be able to invert the input sine wave signal or the input cosine wave signal, in order to reduce the angle detection error due to the non-linearity error of the A/D converter.

    SEMICONDUCTOR DEVICE
    4.
    发明申请
    SEMICONDUCTOR DEVICE 审中-公开

    公开(公告)号：US20180054212A1

    公开(公告)日：2018-02-22

    申请号：US15797150

    申请日：2017-10-30

    申请人： Renesas Electronics Corporation

    发明人： Yoshihiro FUNATO ,  Yasuo MORIMOTO

    IPC分类号： H03M1/46 ,  H03M1/06

    CPC分类号： H03M1/466 ,  H03M1/06 ,  H03M1/0695 ,  H03M1/468

    摘要： A semiconductor device according to the present invention has a capacitance DAC (Digital-to-Analog Converter) circuit and a comparator.The capacitance DAC circuit includes: first capacitors to which input signals are given and each of which has a capacitance value corresponding to a weight of a bit to be converted; and second capacitors to which common voltages are given and whose sum of capacitance values is equivalent to that of the first capacitors. Further, the second capacitors include: a redundant bit capacitor having a capacitance value corresponding to a weight of a redundant bit; and adjustment capacitors each having a capacitance value obtained by subtracting the capacitance value of the redundant bit capacitor from the sum of the capacitance values of the second capacitors.

    ANALOG TO DIGITAL CONVERSION CIRCUIT
    5.
    发明申请
    ANALOG TO DIGITAL CONVERSION CIRCUIT 有权

    公开(公告)号：US20170194979A1

    公开(公告)日：2017-07-06

    申请号：US15371101

    申请日：2016-12-06

    申请人： Renesas Electronics Corporation

    发明人： Yoshihiro FUNATO ,  Yasuo MORIMOTO ,  Kazuaki KUROOKA

    IPC分类号： H03M1/06 ,  H03M1/12 ,  H03M1/10

    CPC分类号： H03M1/0617 ,  H03M1/1023 ,  H03M1/1038 ,  H03M1/1057 ,  H03M1/12 ,  H03M1/145

    摘要： During a period of calibration of the ADC, the effect of unexpected external noise can be excluded.Provided is an analog to digital convertor including: an ADC that converts an analog value into a digital value; and an averaging circuit that calculates a correction value by a calibration operation. The converted value is corrected and output using the correction value being held in a normal operation. The analog to digital convertor is configured as follows. In the calibration operation, an elemental correction value on the basis of a converted value by the ADC corresponding to a predetermined analog value is supplied to the averaging circuit. The averaging circuit calculates the average value of the remaining elemental correction values obtained by removing the maximum value and the minimum value from the elemental correction values supplied a plurality of times, and calculates the correction value on the basis of the average value.

    SEMICONDUCTOR DEVICE
    6.
    发明公开
    SEMICONDUCTOR DEVICE 审中-公开

    公开(公告)号：US20230343700A1

    公开(公告)日：2023-10-26

    申请号：US18163566

    申请日：2023-02-02

    申请人： RENESAS ELECTRONICS CORPORATION

    发明人： Nobuhito SHIRAISHI ,  Yasuo MORIMOTO ,  Yoshihiro FUNATO

    IPC分类号： H01L23/522 ,  H01L23/532 ,  H01L25/065

    CPC分类号： H01L23/5228 ,  H01L23/5329 ,  H01L25/0655 ,  H01L2924/14253 ,  H01L2924/142

    摘要： A semiconductor device includes a plurality of resistive films arranged on an interlayer dielectric film. Each of the plurality of resistive films extends in a first direction in plan view. The plurality of resistive films are arranged spaced apart in a second direction orthogonal to the first direction in plan view. The plurality of resistive films are divided into a first group, a second group, and a third group. The first group is located between the second group and the third group in the second direction. A second width variation amount of each of the plurality of second resistive films belonging to the second group and a third width variation amount of each of the plurality of third resistive films belonging to the third group are larger than a first width variation amount of each of the plurality of first resistive films belonging to the first group.

    ANALOG TO DIGITAL CONVERSION CIRCUIT
    7.
    发明申请
    ANALOG TO DIGITAL CONVERSION CIRCUIT 审中-公开

    公开(公告)号：US20170272088A1

    公开(公告)日：2017-09-21

    申请号：US15615719

    申请日：2017-06-06

    申请人： Renesas Electronics Corporation

    发明人： Yoshihiro FUNATO ,  Yasuo MORIMOTO ,  Kazuaki KUROOKA

    IPC分类号： H03M1/06 ,  H03M1/10 ,  H03M1/12

    CPC分类号： H03M1/0617 ,  H03M1/1023 ,  H03M1/1038 ,  H03M1/1057 ,  H03M1/12 ,  H03M1/145

    摘要： An analog-to-digital (AD) convertor includes: a capacitance digital-to-analog (DA) convertor circuit; a comparator circuit coupled to the capacitance DA convertor circuit; and a calibration circuit that calculates a correction value for the AD convertor, wherein the capacitance DA convertor circuit includes a first capacitor, a second capacitor, n number of capacitors (n being integer equal to or larger than 3), each of the capacitors from first to n-th to be activated based on input digital data, wherein each of the first and second capacitors is designed for having a first capacitance value, wherein the n-th capacitor is designed for having twice the capacitance value of the (n−1)-th capacitor, wherein the calibration circuit calculates the correction value based on first and second results of the AD convertor, and wherein the first result is generated using the n-th capacitor and the second result is generated using the capacitors from first to (n−1)-th.

    SEMICONDUCTOR DEVICE
    10.
    发明申请
    SEMICONDUCTOR DEVICE 有权

    公开(公告)号：US20170257112A1

    公开(公告)日：2017-09-07

    申请号：US15390606

    申请日：2016-12-26

    申请人： Renesas Electronics Corporation

    发明人： Yoshihiro FUNATO ,  Yasuo MORIMOTO

    IPC分类号： H03M1/46 ,  H03M1/06

    CPC分类号： H03M1/466 ,  H03M1/06 ,  H03M1/0695 ,  H03M1/468

    摘要： A semiconductor device according to the present invention has a capacitance DAC (Digital-to-Analog Converter) circuit and a comparator.The capacitance DAC circuit includes: first capacitors to which input signals are given and each of which has a capacitance value corresponding to a weight of a bit to be converted; and second capacitors to which common voltages are given and whose sum of capacitance values is equivalent to that of the first capacitors. Further, the second capacitors include: a redundant bit capacitor having a capacitance value corresponding to a weight of a redundant bit; and adjustment capacitors each having a capacitance value obtained by subtracting the capacitance value of the redundant bit capacitor from the sum of the capacitance values of the second capacitors.