摘要:
A device for detecting a plant includes a two-dimensional camera for detecting a two-dimensional image of a plant leaf having a high two-dimensional resolution, and a three-dimensional camera for detecting a three-dimensional image of the plant leaf having a high three-dimensional resolution. The two-dimensional camera is a conventional high-resolution color camera, for example, and the three-dimensional camera is a TOF camera, for example. A processor for merging the two-dimensional image and the three-dimensional image creates a three-dimensional result representation having a higher resolution than the three-dimensional image of the 3D camera, which may include, among other things, the border of a leaf. The three-dimensional result representation serves to characterize a plant leaf, such as to calculate the surface area of the leaf, the alignment of the leaf, or serves to identify the leaf.
摘要:
A camera for optically capturing a screen, wherein the screen has an area and wherein a predetermined overall resolution is provided for the optical capture, comprises a camera support with an array of camera mounts, an array of optical individual cameras as well as an image processing device for processing digital individual images of the array of optical individual cameras to generate the optical capture of the screen with the predetermined overall resolution. The image processing device is effective to reduce a correction of the individual images with regard to alignment inaccuracies and/or parameter variations, wherein for correction purposes a correction resolution is used, which is higher than the overall resolution, and wherein for every individual camera an individual correction rule is used for the correction. After the correction has been performed, the corrected overall image is brought to the predetermined overall resolution by combining adjacent pixels. Thereby, with inexpensive individual cameras, an image of a large-format screen is obtained efficiently, inexpensively and with little artifacts.
摘要:
The resolution of an optical measurement system for measuring a surface of an object, wherein a measurement light strip is captured on a surface of an object by means of a matrix sensor with a resolution limited by quantization in a quantization direction, can be improved by calculating an effective mapping location in the quantization direction on the basis of the associated real mapping location and a further real mapping location adjacent to the associated real mapping location in a direction perpendicular to the quantization direction.
摘要:
The material strength of extensive objects can be determined efficiently by using two distance measures, wherein a first distance measurer determines the distance to a first main surface of the object and a second distance measurer determines the distance to a second main surface object opposing the first main surface. If potential measurement errors due to the extensive geometry are avoided by determining a reference distance between the first distance measurer and the second distance measurer by a reference object, the thickness of the object between the first main surface and the second main surface can be determined with high accuracy and velocity.
摘要:
A distance measure between a beginning and an end of a material strip wound onto a body in a tangential direction can be determined by creating a height profile of a surface of the material strip, which covers the beginning and the end of the wound material strip in the tangential direction. If a position value of the beginning of the material strip is determined in the created height profile, the distance measure can be determined using this position value and the height profile covering the end of the material strip.
摘要:
The resolution of an optical measurement system for measuring a surface of an object, wherein a measurement light strip is captured on a surface of an object by means of a matrix sensor with a resolution limited by quantization in a quantization direction, can be improved by calculating an effective mapping location in the quantization direction on the basis of the associated real mapping location and a further real mapping location adjacent to the associated real mapping location in a direction perpendicular to the quantization direction.
摘要:
The material strength of extensive objects can be determined efficiently by using two distance measures, wherein a first distance measurer determines the distance to a first main surface of the object and a second distance measurer determines the distance to a second main surface object opposing the first main surface. If potential measurement errors due to the extensive geometry are avoided by determining a reference distance between the first distance measurer and the second distance measurer by a reference object, the thickness of the object between the first main surface and the second main surface can be determined with high accuracy and velocity.
摘要:
In order to detect an image generated by an image source, a mirror arrangement is arranged between the image source and a detector. The mirror arrangement includes two spaced-apart deflection mirrors, which are parallel to each other or form an acute angle of less than 90° between them. In particular when the image source is a scintillator layer, shielding of X-rays from the detector with simultaneous compact dimensioning of the apparatus is achieved in this manner.
摘要:
The manufacture of an object consisting of multiple material layers successively built up one upon the other can be monitored in an advantageous manner in that after the application of a material layer, a height profile of a circumference of the object is established, such that after the application of each material layer, a comparison with a reference information can be used for evaluating whether the preceding production step delivered a result which enables to draw the conclusion of a faultless application of the material layer.
摘要:
One finding of the present invention is that, by use of radiation with a polyfrequent effective spectrum for the examination of the object, beam hardening or shift of the spectrum's center of gravity does indeed lead to the fact that the effectively operative absorption coefficient or attenuation coefficient and/or the effective operative reflection coefficient of the object material, and thus particularly also the ratio of two coefficients to different radiation spectrums, no longer is solely specific for the material, but also depends on the thickness, but that this may be accepted, and nevertheless exact classification of the object material can still be done by using, in addition to the ratio of the absorption and/or reflection coefficients, one of the intensity values resulting during irradiations, in order to perform an association with one of a plurality of predetermined materials on the basis of reference data.