Mitigating Edge Layer Effect In Partially Written Blocks

    公开(公告)号:US20230115979A1

    公开(公告)日:2023-04-13

    申请号:US17499571

    申请日:2021-10-12

    申请人: PetaIO Inc.

    摘要: A storage device includes 3D NAND including layers of multi-level cells. When a shutdown command is received, whether a block is partially written is evaluated. If so, dummy lines are written after the last written wordline of the block. Partially written blocks may be those having a fill percentage less than a threshold. The threshold may be a function of the PEC count of the block. If a maximum retention time is exceeded by data stored in a partially written block, dummy lines may also be written to the block.