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公开(公告)号：US11514586B1
公开(公告)日：2022-11-29
申请号：US17817248
申请日：2022-08-03
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs , Joshua Brian Friend , Katherine Elizabeth Marusak , Nelson L Marthe, Jr. , Benjamin Bradshaw Larson
摘要： Methods and systems for calibrating a transmission electron microscope are disclosed. A fiducial mark on the sample holder is used to identify known reference points so that a current collection area and a through-hole on the sample holder can be located. A plurality of beam current and beam area measurements are taken, and calibration tables are extrapolated from the measurements for a full range of microscope parameters. The calibration tables are then used to determine electron dose of a sample during an experiment at a given configuration.
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公开(公告)号：US10986279B1
公开(公告)日：2021-04-20
申请号：US16951297
申请日：2020-11-18
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
摘要： Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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3.发明授权公开(公告)号：US10256563B2
公开(公告)日：2019-04-09
申请号：US15830127
申请日：2017-12-04
申请人： Protochips, Inc.
发明人： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
摘要： An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
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4.发明授权公开(公告)号：US09666409B2
公开(公告)日：2017-05-30
申请号：US15288239
申请日：2016-10-07
申请人： Protochips, Inc.
CPC分类号： H01J37/20 , H01J37/16 , H01J37/18 , H01J37/26 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
摘要： A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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5.发明授权Method for forming an electrical connection to an sample support in an electron microscope holder 有权在电子显微镜支架中与样品支架形成电连接的方法公开(公告)号：US09437393B2
公开(公告)日：2016-09-06
申请号：US14079223
申请日：2013-11-13
申请人： PROTOCHIPS, INC.
发明人： John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Franklin Stampley Walden, II , William Bradford Carpenter
CPC分类号： H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
摘要： An electrical connector for use in electron microscopy sample holders. The electrical connector provides electrical contacts to the sample support devices which are positioned in the sample holders for electrical, temperature and/or electrochemical control.
摘要翻译： 用于电子显微镜样品架的电连接器。 电连接器为位于样品保持器中的样品支撑装置提供电接触，用于电气，温度和/或电化学控制。
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公开(公告)号：US20150129778A1
公开(公告)日：2015-05-14
申请号：US14513969
申请日：2014-10-14
申请人： PROTOCHIPS, INC.
发明人： David P. Nackashi , John Damiano, Jr. , Stephen E. Mick , Thomas G. Schmelzer , Michael Zapata, III
CPC分类号： H01J37/20 , G01N1/28 , H01J2237/2002 , H01J2237/2007 , H01J2237/2008 , H01J2237/202 , H01J2237/26
摘要： A novel specimen holder for specimen support devices for insertion in electron microscopes. The novel specimen holder of the invention provides mechanical support for specimen support devices and as well as electrical contacts to the specimens or specimen support devices.
摘要翻译： 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器为样品支撑装置提供机械支撑，以及对试样或样品支撑装置的电接触。
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7.发明授权公开(公告)号：US11869744B2
公开(公告)日：2024-01-09
申请号：US17570481
申请日：2022-01-07
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , William Bradford Carpenter
CPC分类号： H01J37/20 , G01F1/34 , G05D7/0635 , H01J2237/006 , H01J2237/26
摘要： A fluid metering system for gas independent pressure and flow control through an electron microscope sample holder includes: a pressure control system that supplies gas; an inlet line providing gas from the pressure control system to the sample holder; an outlet line receiving gas from the sample holder; and a variable leak valve that controls gas flow in the outlet line. The gas flows from an upstream tank of the pressure control system through the sample holder and variable leak valve to a downstream tank of the pressure control system due to the pressure difference of the two tanks as the variable leak valve meters flow in the outlet line. Flow rates are established by monitoring pressure changes at source and collection tanks of known volumes with gas independent pressure gauges. A method of directing the gas flow to a residual gas analyzer (RGA) is also presented.
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公开(公告)号：US11477388B2
公开(公告)日：2022-10-18
申请号：US17545651
申请日：2021-12-08
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , David P. Nackashi , Daniel Stephen Gardiner , Mark Uebel , Alan Philip Franks , Benjamin Jacobs
摘要： Control system configured for sample tracking in an electron microscope environment registers a movement associated with a region of interest located within an active area of a sample under observation with an electron microscope. The registered movement includes at least one directional constituent. The region of interest is positioned within a field of view of the electron microscope. The control system directs an adjustment of the electron microscope control component to one or more of dynamically center and dynamically focus the view through the electron microscope of the region of interest. The adjustment comprises one or more of a magnitude element and a direction element.
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9.发明授权公开(公告)号：US10777380B2
公开(公告)日：2020-09-15
申请号：US16653162
申请日：2019-10-15
申请人： Protochips, Inc.
发明人： Franklin Stampley Walden, II , John Damiano, Jr. , Daniel Stephen Gardiner , David P. Nackashi , William Bradford Carpenter
摘要： A heating device having a heating element patterned into a robust MEMs substrate, wherein the heating element is electrically isolated from a fluid reservoir or bulk conductive sample, but close enough in proximity to an imagable window/area having the fluid or sample thereon, such that the sample is heated through conduction. The heating device can be used in a microscope sample holder, e.g., for SEM, TEM, STEM, X-ray synchrotron, scanning probe microscopy, and optical microscopy.
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10.发明授权公开(公告)号：US10192714B2
公开(公告)日：2019-01-29
申请号：US15608823
申请日：2017-05-30
申请人： Protochips, Inc.
摘要： A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.
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