Clock and data recovery circuit, memory storage device and signal generating method

    公开(公告)号:US11139816B2

    公开(公告)日:2021-10-05

    申请号:US16822025

    申请日:2020-03-18

    Abstract: A clock and data recovery circuit is disclosed. The clock and data recovery circuit includes a phase detection circuit, a first voting circuit, a low-pass filtering circuit and a phase interpolation circuit. The phase detection circuit is configured to receive a first signal and a clock signal and generate a phase signal. The first voting circuit is configured to charge at least one capacitance component according to the phase signal and generate a first voting signal according to a charging result. The low-pass filtering circuit is configured to generate a phase control signal according to the first voting signal. The phase interpolation circuit is configured to generate the clock signal according to the phase control signal.

    CLOCK AND DATA RECOVERY CIRCUIT, MEMORY STORAGE DEVICE AND SIGNAL GENERATING METHOD

    公开(公告)号:US20210273642A1

    公开(公告)日:2021-09-02

    申请号:US16822025

    申请日:2020-03-18

    Abstract: A clock and data recovery circuit is disclosed. The clock and data recovery circuit includes a phase detection circuit, a first voting circuit, a low-pass filtering circuit and a phase interpolation circuit. The phase detection circuit is configured to receive a first signal and a clock signal and generate a phase signal. The first voting circuit is configured to charge at least one capacitance component according to the phase signal and generate a first voting signal according to a charging result. The low-pass filtering circuit is configured to generate a phase control signal according to the first voting signal. The phase interpolation circuit is configured to generate the clock signal according to the phase control signal.

    PHASE-LOCKED LOOP CIRCUIT CALIBRATION METHOD, MEMORY STORAGE DEVICE AND CONNECTION INTERFACE CIRCUIT

    公开(公告)号:US20190288700A1

    公开(公告)日:2019-09-19

    申请号:US15973539

    申请日:2018-05-08

    Abstract: A phase-locked loop circuit calibration method for a memory storage device including a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: receiving a first signal from a host system; generating a jitter signal by the memory storage device; generating a second signal according to the first signal and the jitter signal; performing a phase-lock operation on the second signal to generate a third signal by a phase-locked loop circuit; and detecting the third signal to calibrate an electronic parameter of the phase-locked loop circuit.

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