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公开(公告)号:US12148486B2
公开(公告)日:2024-11-19
申请号:US18181546
申请日:2023-03-10
Applicant: PHISON ELECTRONICS CORP.
Inventor: Hsiao-Yi Lin , Shih-Jia Zeng , Chen Yang Tang , Shi-Chieh Hsu , Wei Lin
Abstract: A read voltage adjustment method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: sending a write command sequence instructing to program a plurality of first memory cells in a rewritable non-volatile memory module; sending a first read command sequence instructing to read the programmed first memory cells using a first read voltage level to obtain first count information; obtaining first compensation information corresponding to the first read voltage level, wherein the first compensation information reflects a deviation in evenly programming the first memory cells to a plurality of states; and adjusting the first read voltage level according to the first count information, the first compensation information, and default count information corresponding to the first read voltage level.
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公开(公告)号:US20250078897A1
公开(公告)日:2025-03-06
申请号:US18481998
申请日:2023-10-05
Applicant: PHISON ELECTRONICS CORP.
Inventor: Shih-Jia Zeng , Chen Yang Tang , Hsuan Ming Kuo , Shi-Chieh Hsu , Wei Lin
IPC: G11C11/406 , G11C29/52
Abstract: A memory management method, a memory storage device and a memory control circuit unit are disclosed. The method includes: detecting a status of a rewritable non-volatile memory module; and determining whether to perform a data refresh operation on the rewritable non-volatile memory module according to a first condition and a second condition. The first condition is related to a first physical unit in the rewritable non-volatile memory module. The second condition is related to a plurality of second physical units in the rewritable non-volatile memory module. The data refresh operation is configured to update data in the rewritable non-volatile memory module to reduce a bit error rate of the data.
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公开(公告)号:US20240265983A1
公开(公告)日:2024-08-08
申请号:US18181546
申请日:2023-03-10
Applicant: PHISON ELECTRONICS CORP.
Inventor: Hsiao-Yi Lin , Shih-Jia Zeng , Chen Yang Tang , Shi-Chieh Hsu , Wei Lin
CPC classification number: G11C16/3459 , G11C16/102 , G11C16/26 , G11C16/3404
Abstract: A read voltage adjustment method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: sending a write command sequence instructing to program a plurality of first memory cells in a rewritable non-volatile memory module; sending a first read command sequence instructing to read the programmed first memory cells using a first read voltage level to obtain first count information; obtaining first compensation information corresponding to the first read voltage level, wherein the first compensation information reflects a deviation in evenly programming the first memory cells to a plurality of states; and adjusting the first read voltage level according to the first count information, the first compensation information, and default count information corresponding to the first read voltage level.
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